Nijmeijer; Regina G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nijmeijer; Regina G..The latest application filed is for "use of coefficient of a power curve to evaluate a semiconductor wafer".

Company Profile

0.6.6

Nijmeijer; Regina G. - Campbell CA
Nijmeijer; Regina G. - Mountain View CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Use of coefficient of a power curve to evaluate a semiconductor wafer Grant 7,130,055 - Borden , et al. October 31, 2	2006-10-31
Use of coefficient of a power curve to evaluate a semiconductor wafer App 20050088187 - Borden, Peter G. ; et al.	2005-04-28
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,885,458 - Borden , et al. April 26, 2	2005-04-26
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20040239945 - Borden, Peter G. ; et al.	2004-12-02
Use of a coefficient of a power curve to evaluate a semiconductor wafer Grant 6,812,717 - Borden , et al. November 2, 2	2004-11-02
Apparatus and method for evaluating a wafer of semiconductor material App 20030085730 - Borden, Peter G. ; et al.	2003-05-08
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20030043382 - Borden, Peter G. ; et al.	2003-03-06
Apparatus and method for evaluating a semiconductor wafer Grant 6,489,801 - Borden , et al. December 3, 2	2002-12-03
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020085211 - Borden, Peter G. ; et al.	2002-07-04
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020027660 - Borden, Peter G. ; et al.	2002-03-07
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,323,951 - Borden , et al. November 27, 2	2001-11-27
Apparatus and method for evaluating a wafer of semiconductor material Grant 6,049,220 - Borden , et al. April 11, 2	2000-04-11

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