Nakagomi; Tsuneo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakagomi; Tsuneo.The latest application filed is for "magnetic head inspection system and magnetic head inspection method".

Company Profile

1.11.11

Nakagomi; Tsuneo - Nakai JP
Nakagomi; Tsuneo - Ashigarakami-gun JP
NAKAGOMI; Tsuneo - Kamisato-machi JP
NAKAGOMI; Tsuneo - Kanagawa JP
Nakagomi; Tsuneo - Saitama JP
Nakagomi; Tsuneo - Kanagawa Pref. JP
NAKAGOMI; TSUNEO - SAITAMA Pref. JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Thermally assisted magnetic recording head inspection method and apparatus Grant 8,787,134 - Zhang , et al. July 22, 2	2014-07-22
Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus Grant 8,713,710 - Zhang , et al. April 29, 2	2014-04-29
Magnetic Head Inspection System And Magnetic Head Inspection Method App 20140090117 - TOKUTOMI; Teruaki ; et al.	2014-03-27
Cantilever for magnetic force microscope and method of manufacturing the same Grant 8,621,659 - Zhang , et al. December 31, 2	2013-12-31
Thermally Assisted Magnetic Recording Head Inspection Method And Apparatus App 20130265863 - Zhang; Kaifeng ; et al.	2013-10-10
Thermally assisted magnetic recording head inspection method and apparatus Grant 8,483,035 - Zhang , et al. July 9, 2	2013-07-09
Cantilever of Scanning Probe Microscope and Method for Manufacturing the Same, Method for Inspecting Thermal Assist Type Magnetic Head Device and its Apparatus App 20130097739 - Zhang; Kaifeng ; et al.	2013-04-18
Magnetic device inspection apparatus and magnetic device inspection method Grant 8,359,661 - Tachizaki , et al. January 22, 2	2013-01-22
Magnetic Head Manufacturing Method App 20120324720 - NAKAGOMI; Tsuneo ; et al.	2012-12-27
Thermally Assisted Magnetic Recording Head Inspection Method and Apparatus App 20120307605 - Zhang; Kaifeng ; et al.	2012-12-06
Cantilever For Magnetic Force Microscope And Method Of Manufacturing The Same App 20120291161 - ZHANG; Kaifeng ; et al.	2012-11-15
Device for transporting magnetic head, device for inspecting magnetic head, and method for manufacturing magnetic head Grant 8,299,784 - Tokutomi , et al. October 30, 2	2012-10-30
Magnetic head inspection method and magnetic head inspection device Grant 8,278,917 - Nakagomi , et al. October 2, 2	2012-10-02
Magnetic head inspection method and magnetic head manufacturing method Grant 8,185,968 - Nakagomi , et al. May 22, 2	2012-05-22
SPM Probe and Inspection Device for Light Emission Unit App 20120054924 - ZHANG; Kaifeng ; et al.	2012-03-01
Magnetic Head Inspection Method And Magnetic Head Manufacturing Method App 20110225684 - NAKAGOMI; TSUNEO ; et al.	2011-09-15
Device For Transporting Magnetic Head, Device For Inspecting Magnetic Head, And Method For Manufacturing Magnetic Head App 20100327863 - TOKUTOMI; Teruaki ; et al.	2010-12-30
Magnetic Device Inspection Apparatus And Magnetic Device Inspection Method App 20100205699 - TACHIZAKI; Takehiro ; et al.	2010-08-12
Magnetic Head Inspection Method, Magnetic Head Inspection Device, And Magnetic Head Manufacturing Method App 20100061002 - NAKAGOMI; TSUNEO ; et al.	2010-03-11

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