Nagasaka; Munetoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nagasaka; Munetoshi.The latest application filed is for "probe device".
- Nagasaka; Munetoshi - Yamanashi JP
- Nagasaka; Munetoshi - Nirasaki JP
- Nagasaka; Munetoshi - Nirasaki-shi JP
- Nagasaka; Munetoshi - Nirasaki City JP
- Nagasaka; Munetoshi - Yamanashi-ken JP
| Patent | Date |
|---|---|
| Probe device Grant 9,759,762 - Shinohara , et al. September 12, 2 | 2017-09-12 |
| Probe device having cleaning mechanism for cleaning connection conductor Grant 9,638,719 - Shinohara , et al. May 2, 2 | 2017-05-02 |
| Probe apparatus and wafer mounting table for probe apparatus Grant 9,523,711 - Yano , et al. December 20, 2 | 2016-12-20 |
| Probe Device App 20160061882 - SHINOHARA; Eiichi ; et al. | 2016-03-03 |
| Probe Device App 20160054357 - SHINOHARA; Eiichi ; et al. | 2016-02-25 |
| Probe apparatus Grant 9,261,553 - Shinohara , et al. February 16, 2 | 2016-02-16 |
| Probe Apparatus And Wafer Mounting Table For Probe Apparatus App 20150145547 - Yano; Kazuya ; et al. | 2015-05-28 |
| Probe Apparatus App 20150028907 - Shinohara; Eiichi ; et al. | 2015-01-29 |
| Substrate attracting device and substrate transfer apparatus Grant 8,196,983 - Nagasaka , et al. June 12, 2 | 2012-06-12 |
| Ceramic mounting for wafer apparatus with thermal expansion feature Grant 8,082,977 - Akaike , et al. December 27, 2 | 2011-12-27 |
| Semiconductor wafer inspection apparatus Grant D612,879 - Nagasaka March 30, 2 | 2010-03-30 |
| Wafer attracting plate Grant D609,652 - Nagasaka , et al. February 9, 2 | 2010-02-09 |
| Probe card transfer assist apparatus, and inspection equipment and method using same Grant 7,541,801 - Nagasaka , et al. June 2, 2 | 2009-06-02 |
| Probe card transfer assist apparatus and inspection equipment using same Grant 7,528,620 - Mochizuki , et al. May 5, 2 | 2009-05-05 |
| Wafer holding member Grant D589,912 - Ogasawara , et al. April 7, 2 | 2009-04-07 |
| Wafer holding member Grant D589,474 - Ogasawara , et al. March 31, 2 | 2009-03-31 |
| Substrate Attracting Device And Substrate Transfer Apparatus App 20080267741 - NAGASAKA; Munetoshi ; et al. | 2008-10-30 |
| Mounting Apparatus App 20070221363 - AKAIKE; Yutaka ; et al. | 2007-09-27 |
| Probe Card Transfer Assist Apparatus And Inspection Equipment Using Same App 20070126441 - Mochizuki; Chiaki ; et al. | 2007-06-07 |
| Probe card transfer assist apparatus, and inspection equipment and method using same App 20070063720 - Nagasaka; Munetoshi ; et al. | 2007-03-22 |
| Probe test apparatus Grant 5,604,443 - Kitamura , et al. February 18, 1 | 1997-02-18 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 