Mrugalski; Grzegorz
Patent Applications and Registrations
Patent applications and USPTO patent grants for Mrugalski; Grzegorz.The latest application filed is for "universal compactor architecture for testing circuits".
Company Profile
4.41.43
- Mrugalski; Grzegorz - Swarzedz PL
- Mrugalski; Grzegorz - Swardzez PL
- Mrugalski; Grzegorz - Strzalkowo PL
- Mrugalski; Grzegorz - Wilsonville OR
- Mrugalski; Grzegorz - US
Patent Activity
| Patent | Date |
|---|---|
| Universal Compactor Architecture For Testing Circuits App 20220308110 - Liu; Yingdi ; et al. | 2022-09-29 |
| Suspect resolution for scan chain defect diagnosis Grant 11,423,202 - Mrugalski , et al. August 23, 2 | 2022-08-23 |
| Suspect Resolution For Scan Chain Defect Diagnosis App 20220065932 - Mrugalski; Grzegorz ; et al. | 2022-03-03 |
| Trajectory-Optimized Test Pattern Generation for Built-In Self-Test App 20210156918 - Mrugalski; Grzegorz ; et al. | 2021-05-27 |
| Test scheduling and test access in test compression environment Grant 10,955,460 - Kassab , et al. March 23, 2 | 2021-03-23 |
| Scan chain stitching for test-per-clock Grant 10,379,161 - Rajski , et al. A | 2019-08-13 |
| Low power testing based on dynamic grouping of scan Grant 10,120,029 - Rajski , et al. November 6, 2 | 2018-11-06 |
| Multi-stage test response compactors Grant 10,120,024 - Rajski , et al. November 6, 2 | 2018-11-06 |
| Multi-stage Test Response Compactors App 20180156867 - Rajski; Janusz ; et al. | 2018-06-07 |
| Selective Per-cycle Masking Of Scan Chains For System Level Test App 20180143249 - Rajski; Janusz ; et al. | 2018-05-24 |
| Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives Grant 9,933,485 - Mrugalski , et al. April 3, 2 | 2018-04-03 |
| Selective per-cycle masking of scan chains for system level test Grant 9,874,606 - Rajski , et al. January 23, 2 | 2018-01-23 |
| Multi-stage test response compactors Grant 9,778,316 - Rajski , et al. October 3, 2 | 2017-10-03 |
| Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,714,981 - Rajski , et al. July 25, 2 | 2017-07-25 |
| Selective Per-cycle Masking Of Scan Chains For System Level Test App 20170052227 - Rajski; Janusz ; et al. | 2017-02-23 |
| Multi-stage Test Response Compactors App 20160320450 - Rajski; Janusz ; et al. | 2016-11-03 |
| Test-per-clock Based On Dynamically-partitioned Reconfigurable Scan Chains App 20160252573 - Rajski; Janusz ; et al. | 2016-09-01 |
| Deterministic Built-In Self-Test App 20160245863 - Mrugalski; Grzegorz ; et al. | 2016-08-25 |
| Selective per-cycle masking of scan chains for system level test Grant 9,377,508 - Rajski , et al. June 28, 2 | 2016-06-28 |
| Test generation for test-per-clock Grant 9,347,993 - Rajski , et al. May 24, 2 | 2016-05-24 |
| Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,335,377 - Rajski , et al. May 10, 2 | 2016-05-10 |
| Low Power Testing Based On Dynamic Grouping Of Scan App 20150323597 - Rajski; Janusz ; et al. | 2015-11-12 |
| Test Scheduling and Test Access in Test Compression Environment App 20150285854 - Kassab; Mark A. ; et al. | 2015-10-08 |
| Test scheduling with pattern-independent test access mechanism Grant 9,088,522 - Rajski , et al. July 21, 2 | 2015-07-21 |
| Scan chain configuration for test-per-clock based on circuit topology Grant 9,009,553 - Rajski , et al. April 14, 2 | 2015-04-14 |
| Fault-driven scan chain configuration for test-per-clock Grant 9,003,248 - Rajski , et al. April 7, 2 | 2015-04-07 |
| Test Generation For Test-Per-Clock App 20140372824 - Rajski; Janusz ; et al. | 2014-12-18 |
| Fault-Driven Scan Chain Configuration For Test-Per-Clock App 20140372820 - Rajski; Janusz ; et al. | 2014-12-18 |
| Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology App 20140372819 - Rajski; Janusz ; et al. | 2014-12-18 |
| Scan Chain Stitching For Test-Per-Clock App 20140372821 - Rajski; Janusz ; et al. | 2014-12-18 |
| Test-Per-Clock Based On Dynamically-Partitioned Reconfigurable Scan Chains App 20140372818 - Rajski; Janusz ; et al. | 2014-12-18 |
| Low power compression of incompatible test cubes Grant 8,832,512 - Czysz , et al. September 9, 2 | 2014-09-09 |
| Selective Per-cycle Masking Of Scan Chains For System Level Test App 20140229779 - Rajski; Janusz ; et al. | 2014-08-14 |
| Selective per-cycle masking of scan chains for system level test Grant 8,726,113 - Rajski , et al. May 13, 2 | 2014-05-13 |
| Test generator for low power built-in self-test Grant 8,683,280 - Rajski , et al. March 25, 2 | 2014-03-25 |
| Test Scheduling With Pattern-Independent Test Access Mechanism App 20130290795 - Rajski; Janusz ; et al. | 2013-10-31 |
| Compression based on deterministic vector clustering of incompatible test cubes Grant 8,347,159 - Mrugalski , et al. January 1, 2 | 2013-01-01 |
| Decompressors for low power decompression of test patterns Grant 8,301,945 - Rajski , et al. October 30, 2 | 2012-10-30 |
| Test Generator For Low Power Built-In Self-Test App 20120272110 - Rajski; Janusz ; et al. | 2012-10-25 |
| Low power scan testing techniques and apparatus Grant 8,290,738 - Lin , et al. October 16, 2 | 2012-10-16 |
| Selective Per-cycle Masking Of Scan Chains For System Level Test App 20120210181 - Rajski; Janusz ; et al. | 2012-08-16 |
| Selective per-cycle masking of scan chains for system level test Grant 8,166,359 - Rajski , et al. April 24, 2 | 2012-04-24 |
| Decompressors For Low Power Decompression Of Test Patterns App 20110320999 - Rajski; Janusz ; et al. | 2011-12-29 |
| Accurately identifying failing scan bits in compression environments Grant 8,086,923 - Cheng , et al. December 27, 2 | 2011-12-27 |
| Low power decompression of test cubes Grant 8,046,653 - Rajski , et al. October 25, 2 | 2011-10-25 |
| Low Power Compression Of Incompatible Test Cubes App 20110231721 - CZYSZ; DARIUSZ ; et al. | 2011-09-22 |
| Decompressors for low power decompression of test patterns Grant 8,015,461 - Rajski , et al. September 6, 2 | 2011-09-06 |
| Low Power Scan Testing Techniques And Apparatus App 20110166818 - Lin; Xijiang ; et al. | 2011-07-07 |
| Fault diagnosis of compressed test responses Grant 7,962,820 - Rajski , et al. June 14, 2 | 2011-06-14 |
| Low power scan testing techniques and apparatus Grant 7,925,465 - Lin , et al. April 12, 2 | 2011-04-12 |
| Compressing test responses using a compactor Grant 7,890,827 - Rajski , et al. February 15, 2 | 2011-02-15 |
| Low Power Decompression Of Test Cubes App 20100306609 - Rajski; Janusz ; et al. | 2010-12-02 |
| Multi-stage test response compactors Grant 7,818,644 - Rajski , et al. October 19, 2 | 2010-10-19 |
| Compressing Test Responses Using A Compactor App 20100257417 - Rajski; Janusz ; et al. | 2010-10-07 |
| Low power decompression of test cubes Grant 7,797,603 - Rajski , et al. September 14, 2 | 2010-09-14 |
| Compression Based On Deterministic Vector Clustering Of Incompatible Test Cubes App 20100229060 - MRUGALSKI; GRZEGORZ ; et al. | 2010-09-09 |
| Compressing test responses using a compactor Grant 7,743,302 - Rajski , et al. June 22, 2 | 2010-06-22 |
| Decompressors For Low Power Decompression Of Test Patterns App 20100138708 - Rajski; Janusz ; et al. | 2010-06-03 |
| Decompressors for low power decompression of test patterns Grant 7,647,540 - Rajski , et al. January 12, 2 | 2010-01-12 |
| Selective Per-Cycle Masking Of Scan Chains For System Level Test App 20090300446 - Rajski; Janusz ; et al. | 2009-12-03 |
| Accurately Identifying Failing Scan Bits In Compression Environments App 20090254786 - Cheng; Wu-Tung ; et al. | 2009-10-08 |
| Fault Diagnosis Of Compressed Test Responses App 20090249147 - Rajski; Janusz ; et al. | 2009-10-01 |
| Fault diagnosis of compressed test responses Grant 7,509,550 - Rajski , et al. March 24, 2 | 2009-03-24 |
| Fault diagnosis of compressed test responses having one or more unknown states Grant 7,437,640 - Rajski , et al. October 14, 2 | 2008-10-14 |
| Low power scan testing techniques and apparatus App 20080195346 - Lin; Xijiang ; et al. | 2008-08-14 |
| Compressing test responses using a compactor App 20080133987 - Rajski; Janusz ; et al. | 2008-06-05 |
| Compressing test responses using a compactor Grant 7,370,254 - Rajski , et al. May 6, 2 | 2008-05-06 |
| Decompressors for low power decompression of test patterns App 20080052578 - Rajski; Janusz ; et al. | 2008-02-28 |
| Low power decompression of test cubes App 20080052586 - Rajski; Janusz ; et al. | 2008-02-28 |
| Adaptive fault diagnosis of compressed test responses Grant 7,302,624 - Rajski , et al. November 27, 2 | 2007-11-27 |
| Generating masking control circuits for test response compactors App 20070234169 - Rajski; Janusz ; et al. | 2007-10-04 |
| Multi-stage test response compactors App 20070234157 - Rajski; Janusz ; et al. | 2007-10-04 |
| Adaptive fault diagnosis of compressed test responses App 20060041813 - Rajski; Janusz ; et al. | 2006-02-23 |
| Fault diagnosis of compressed test responses App 20060041812 - Rajski; Janusz ; et al. | 2006-02-23 |
| Fault diagnosis of compressed test responses having one or more unknown states App 20060041814 - Rajski; Janusz ; et al. | 2006-02-23 |
| Compressing test responses using a compactor App 20040230884 - Rajski, Janusz ; et al. | 2004-11-18 |
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