Miyazaki; Yusuke
Patent Applications and Registrations
Patent applications and USPTO patent grants for Miyazaki; Yusuke.The latest application filed is for "inspection apparatus".
- Miyazaki; Yusuke - Hitachinaka N/A JP
- Miyazaki; Yusuke - Hitachinaka-shi
- Miyazaki; Yusuke - Kanagawa JP
- Miyazaki; Yusuke - Tokyo JP
| Patent | Date |
|---|---|
| Inspection apparatus, substrate mounting device and inspection method Grant 8,723,536 - Miyazaki , et al. May 13, 2 | 2014-05-13 |
| Object holding apparatus, and inspection apparatus Grant 8,686,383 - Zama , et al. April 1, 2 | 2014-04-01 |
| Inspection Apparatus App 20130286385 - Miyazaki; Yusuke ; et al. | 2013-10-31 |
| Optical defect inspection apparatus Grant 8,472,016 - Iijima , et al. June 25, 2 | 2013-06-25 |
| Substrate Holding Device And Method, And Inspection Apparatus And Method Using The Substrate Holding Device And Method App 20130154675 - Miyazaki; Yusuke ; et al. | 2013-06-20 |
| Substrate Holding Apparatus, And Inspection Or Processing Apparatus App 20120205850 - ZAMA; Kazuhiro ; et al. | 2012-08-16 |
| Optical Defect Inspection Apparatus App 20120182547 - Aizawa; Noriyuki ; et al. | 2012-07-19 |
| Inspection Device And Method App 20120144938 - Inagaki; Katsuyasu ; et al. | 2012-06-14 |
| Optical defect inspection apparatus Grant 8,184,283 - Iijima , et al. May 22, 2 | 2012-05-22 |
| Substrate holding apparatus, and inspection or processing apparatus Grant 8,183,549 - Zama , et al. May 22, 2 | 2012-05-22 |
| Substrate Holding Apparatus, And Inspection Or Processing Apparatus App 20110260080 - ZAMA; Kazuhiro ; et al. | 2011-10-27 |
| Substrate holding apparatus, and inspection or processing apparatus Grant 7,999,242 - Zama , et al. August 16, 2 | 2011-08-16 |
| Mini Environment Apparatus, Inspection Apparatus, Manufacturing Apparatus and Cleaning Method of Space App 20110153114 - JINGU; Takahiro ; et al. | 2011-06-23 |
| Optical Defect Inspection Apparatus App 20110102781 - AIZAWA; Noriyuki ; et al. | 2011-05-05 |
| Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of space Grant 7,925,390 - Jingu , et al. April 12, 2 | 2011-04-12 |
| Optical defect inspection apparatus Grant 7,894,052 - Aizawa , et al. February 22, 2 | 2011-02-22 |
| Optical Defect Inspection Apparatus App 20100231900 - AIZAWA; Noriyuki ; et al. | 2010-09-16 |
| Substrate Holding Apparatus, And Inspection Or Processing Apparatus App 20100196127 - Zama; Kazuhiro ; et al. | 2010-08-05 |
| Optical defect inspection apparatus Grant 7,746,461 - Aizawa , et al. June 29, 2 | 2010-06-29 |
| Optical Defect Inspection Apparatus App 20100141936 - AIZAWA; Noriyuki ; et al. | 2010-06-10 |
| Substrate holding apparatus, and inspection or processing apparatus Grant 7,723,709 - Zama , et al. May 25, 2 | 2010-05-25 |
| Optical Defect Inspection Apparatus App 20090147246 - AIZAWA; Noriyuki ; et al. | 2009-06-11 |
| Substrate holding apparatus, and inspection or processing apparatus App 20080054197 - Zama; Kazuhiro ; et al. | 2008-03-06 |
| Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of space App 20080046133 - Jingu; Takahiro ; et al. | 2008-02-21 |
| Surface inspection apparatus and surface inspection method App 20080024773 - Miyazaki; Yusuke ; et al. | 2008-01-31 |
| Optical defect inspection apparatus App 20070211241 - Aizawa; Noriyuki ; et al. | 2007-09-13 |
| Acidic drinks containing tofu puree Grant 7,153,537 - Sotoyama , et al. December 26, 2 | 2006-12-26 |
| Acidic drinks containing tofu puree App 20050042352 - Sotoyama, Kazuyoshi ; et al. | 2005-02-24 |
| Noodles containing tofu puree Grant 6,641,855 - Tomita , et al. November 4, 2 | 2003-11-04 |
| Sample loading sheet Grant 6,376,231 - Enomoto , et al. April 23, 2 | 2002-04-23 |
| Continuous process for preparing a whipped-cream topping dessert Grant 3,968,267 - Ogasa , et al. July 6, 1 | 1976-07-06 |
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