Miya; Go
Patent Applications and Registrations
Patent applications and USPTO patent grants for Miya; Go.The latest application filed is for "charged particle beam apparatus".
Company Profile
1.21.35
- Miya; Go - Tokyo JP
- Miya; Go - Hachioji JP
- - Hachioji JP
- Miya; Go - Ibaraki-ken JP
- Miya; Go - Ibaraki JP
- Miya; Go - Chiyoda JP
- Miya, Go - Niihari-gun JP
Patent Activity
| Patent | Date |
|---|---|
| Charged Particle Beam Apparatus App 20220028650 - Miwa; Takafumi ; et al. | 2022-01-27 |
| Charged particle beam device Grant 10,872,742 - Miwa , et al. December 22, 2 | 2020-12-22 |
| Charged Particle Beam Device App 20200006032 - MIWA; Takafumi ; et al. | 2020-01-02 |
| Plasma processing apparatus and plasma processing method Grant 10,128,141 - Tandou , et al. November 13, 2 | 2018-11-13 |
| Charged particle beam apparatus for measuring surface potential of a sample Grant 9,799,486 - Kanno , et al. October 24, 2 | 2017-10-24 |
| Plasma processing apparatus and plasma processing method Grant 9,704,731 - Miya , et al. July 11, 2 | 2017-07-11 |
| Electrostatic chuck mechanism and charged particle beam apparatus Grant 9,401,297 - Ebizuka , et al. July 26, 2 | 2016-07-26 |
| Charged Particle Beam Apparatus App 20160013010 - KANNO; Seiichiro ; et al. | 2016-01-14 |
| Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus App 20150262857 - EBIZUKA; Yasushi ; et al. | 2015-09-17 |
| Plasma Processing Apparatus And Plasma Processing Method App 20150031213 - MIYA; Go ; et al. | 2015-01-29 |
| Measurement or inspecting apparatus Grant 8,921,781 - Miya , et al. December 30, 2 | 2014-12-30 |
| Measurement or inspecting apparatus Grant 08921781 - | 2014-12-30 |
| Plasma Processing Apparatus And Plasma Processing Method App 20140283534 - Tandou; Takumi ; et al. | 2014-09-25 |
| Charged particle beam device and evaluation method using the charged particle beam device Grant 8,653,455 - Kitsunai , et al. February 18, 2 | 2014-02-18 |
| Plasma Processing Apparatus And Plasma Processing Method App 20140004706 - MIYA; Go ; et al. | 2014-01-02 |
| Semiconductor Inspecting Apparatus App 20130327939 - MIYA; Go ; et al. | 2013-12-12 |
| Semiconductor inspecting apparatus Grant 8,519,332 - Miya , et al. August 27, 2 | 2013-08-27 |
| Plasma Processing Apparatus App 20120273136 - Edamura; Manabu ; et al. | 2012-11-01 |
| Semiconductor Inspecting Apparatus App 20120261589 - MIYA; Go ; et al. | 2012-10-18 |
| Plasma processing apparatus Grant 8,231,759 - Edamura , et al. July 31, 2 | 2012-07-31 |
| Semiconductor inspecting apparatus Grant 8,232,522 - Miya , et al. July 31, 2 | 2012-07-31 |
| Plasma Processing Apparatus App 20120186745 - MIYA; Go ; et al. | 2012-07-26 |
| Charged Particle Beam Device And Evaluation Method Using The Charged Particle Beam Device App 20120070066 - Kitsunai; Hiroyuki ; et al. | 2012-03-22 |
| Apparatus and method for plasma etching Grant 8,083,889 - Miya , et al. December 27, 2 | 2011-12-27 |
| Vacuum Processing Apparatus App 20110120649 - SATOU; Kouhei ; et al. | 2011-05-26 |
| Semiconductor Inspecting Apparatus App 20110095185 - Miya; Go ; et al. | 2011-04-28 |
| Vacuum processing apparatus Grant 7,887,669 - Satou , et al. February 15, 2 | 2011-02-15 |
| Plasma Processing Apparatus App 20100263796 - Edamura; Manabu ; et al. | 2010-10-21 |
| Plasma processing apparatus Grant 7,744,721 - Edamura , et al. June 29, 2 | 2010-06-29 |
| Apparatus and method for plasma etching Grant 7,713,756 - Miya , et al. May 11, 2 | 2010-05-11 |
| Plasma Processing Apparatus App 20100078130 - Edamura; Manabu ; et al. | 2010-04-01 |
| Apparatus And Method For Plasma Etching App 20090223633 - MIYA; Go ; et al. | 2009-09-10 |
| Plasma Etching Apparatus And Plasma Etching Method App 20090152241 - MIYA; Go ; et al. | 2009-06-18 |
| Apparatus And Method For Plasma Etching App 20090095423 - MIYA; Go ; et al. | 2009-04-16 |
| Plasma etching apparatus and plasma etching method Grant 7,396,771 - Miya , et al. July 8, 2 | 2008-07-08 |
| Vacuum Processing Apparatus App 20080110400 - Satou; Kouhei ; et al. | 2008-05-15 |
| Plasma Etching Apparatus And Plasma Etching Method App 20080110569 - Miya; Go ; et al. | 2008-05-15 |
| Plasma etching apparatus and plasma etching method App 20070209759 - Miya; Go ; et al. | 2007-09-13 |
| Apparatus And Method For Plasma Etching App 20070184563 - Miya; Go ; et al. | 2007-08-09 |
| Plasma etching apparatus and plasma etching method App 20070056929 - Miya; Go ; et al. | 2007-03-15 |
| Electrostatic chuck, wafer processing apparatus and plasma processing method App 20060291132 - Kanno; Seiichiro ; et al. | 2006-12-28 |
| Plasma processing method Grant 7,147,748 - Miya , et al. December 12, 2 | 2006-12-12 |
| Plasma processing apparatus and plasma processing method Grant 7,147,747 - Miya , et al. December 12, 2 | 2006-12-12 |
| Apparatus and method for processing wafer App 20060191482 - Kanno; Seiichiro ; et al. | 2006-08-31 |
| Plasma etching apparatus and plasma etching method App 20060169671 - Miya; Go ; et al. | 2006-08-03 |
| Plasma processing system and method App 20060043064 - Tanaka; Junichi ; et al. | 2006-03-02 |
| Plasma processing apparatus App 20050224182 - Edamura, Manabu ; et al. | 2005-10-13 |
| Diagnosis method for semiconductor processing apparatus Grant 6,899,766 - Miya , et al. May 31, 2 | 2005-05-31 |
| Semiconductor processing apparatus and a diagnosis method therefor Grant 6,866,744 - Miya , et al. March 15, 2 | 2005-03-15 |
| Apparatus and method for plasma etching App 20050028934 - Miya, Go ; et al. | 2005-02-10 |
| Plasma processing apparatus and plasma processing method App 20040173309 - Miya, Go ; et al. | 2004-09-09 |
| Plasma processing apparatus App 20040163595 - Edamura, Manabu ; et al. | 2004-08-26 |
| processing method App 20040166598 - Miya, Go ; et al. | 2004-08-26 |
| Diagnosis method for semiconductor processing apparatus App 20040159401 - Miya, Go ; et al. | 2004-08-19 |
| Semiconductor processing apparatus and a diagnosis method therefor App 20030205326 - Miya, Go ; et al. | 2003-11-06 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 