Patent | Date |
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Methods of forming low defect replacement fins for a FinFET semiconductor device and the resulting devices Grant 9,614,058 - Fronheiser , et al. April 4, 2 | 2017-04-04 |
Methods of forming different FinFET devices with different threshold voltages and integrated circuit products containing such devices Grant 9,564,367 - Jacob , et al. February 7, 2 | 2017-02-07 |
Channel cladding last process flow for forming a channel region on a FinFET device having a reduced size fin in the channel region Grant 9,508,853 - Jacob , et al. November 29, 2 | 2016-11-29 |
Finfet Semiconductor Devices With Stressed Channel Regions App 20160293706 - Cai; Xiuyu ;   et al. | 2016-10-06 |
Semiconductor device having structure with fractional dimension of the minimum dimension of a lithography system Grant 9,460,924 - Maszara , et al. October 4, 2 | 2016-10-04 |
Channel Cladding Last Process Flow For Forming A Channel Region On A Finfet Device Having A Reduced Size Fin In The Channel Region App 20160204261 - Jacob; Ajey Poovannummoottil ;   et al. | 2016-07-14 |
Channel Cladding Last Process Flow For Forming A Channel Region On A Finfet Device App 20160163863 - Jacob; Ajey Poovannummoottil ;   et al. | 2016-06-09 |
Channel cladding last process flow for forming a channel region on a FinFET device Grant 9,362,405 - Jacob , et al. June 7, 2 | 2016-06-07 |
Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device Grant 9,349,840 - Cai , et al. May 24, 2 | 2016-05-24 |
Methods Of Forming Metastable Replacement Fins For A Finfet Semiconductor Device By Performing A Replacement Growth Process App 20160064250 - Jacob; Ajey P. ;   et al. | 2016-03-03 |
Methods Of Forming Stressed Channel Regions For A Finfet Semiconductor Device And The Resulting Device App 20160035863 - Cai; Xiuyu ;   et al. | 2016-02-04 |
Methods of forming replacement fins for a FinFET semiconductor device by performing a replacement growth process Grant 9,240,342 - Jacob , et al. January 19, 2 | 2016-01-19 |
Methods Of Forming Low Defect Replacement Fins For A Finfet Semiconductor Device And The Resulting Devices App 20160013296 - Fronheiser; Jody ;   et al. | 2016-01-14 |
Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device Grant 9,214,553 - Cai , et al. December 15, 2 | 2015-12-15 |
Methods Of Forming Stressed Channel Regions For A Finfet Semiconductor Device And The Resulting Device App 20150255608 - Cai; Xiuyu ;   et al. | 2015-09-10 |
Methods Of Forming Stressed Channel Regions For A Finfet Semiconductor Device And The Resulting Device App 20150255542 - Cai; Xiuyu ;   et al. | 2015-09-10 |
Methods Of Forming Replacement Fins For A Finfet Semiconductor Device By Performing A Replacement Growth Process App 20150024573 - Jacob; Ajey P. ;   et al. | 2015-01-22 |
Methods Of Forming Low Defect Replacement Fins For A Finfet Semiconductor Device And The Resulting Devices App 20140264488 - Fronheiser; Jody ;   et al. | 2014-09-18 |
Methods of forming FinFET devices with alternative channel materials Grant 8,673,718 - Maszara , et al. March 18, 2 | 2014-03-18 |
Methods Of Forming Different Finfet Devices With Different Threshold Voltages And Integrated Circuit Products Containing Such Devices App 20140070322 - Jacob; Ajey P. ;   et al. | 2014-03-13 |
Methods Of Forming Finfet Devices With Alternative Channel Materials App 20140011341 - Maszara; Witold P. ;   et al. | 2014-01-09 |
Methods Of Forming Finfet Devices With Alternative Channel Materials App 20130309847 - Maszara; Witold P. ;   et al. | 2013-11-21 |
Methods of forming FinFET devices with alternative channel materials Grant 8,580,642 - Maszara , et al. November 12, 2 | 2013-11-12 |
Strained fully depleted silicon on insulator semiconductor device Grant 8,502,283 - Xiang , et al. August 6, 2 | 2013-08-06 |
Fully silicided gate structure for FinFET devices Grant 8,008,136 - Lin , et al. August 30, 2 | 2011-08-30 |
Semiconductor Device Having Structure With Fractional Dimension Of The Minimum Dimension Of A Lithography System App 20080237803 - Maszara; Witold P. ;   et al. | 2008-10-02 |
Semiconductor Device Having Structure With Sub-lithography Dimensions App 20080241574 - Maszara; Witold P. | 2008-10-02 |
Strained Fully Depleted Silicon On Insulator Semiconductor Device App 20080054316 - Xiang; Qi ;   et al. | 2008-03-06 |
Strained fully depleted silicon on insulator semiconductor device and manufacturing method therefor Grant 7,306,997 - Xiang , et al. December 11, 2 | 2007-12-11 |
Formation of abrupt junctions in devices by using silicide growth dopant snowplow effect Grant 7,306,998 - Maszara December 11, 2 | 2007-12-11 |
Shallow junction semiconductor Grant 7,298,012 - Pelella , et al. November 20, 2 | 2007-11-20 |
Formation Of Abrupt Junctions In Devices By Using Silicide Growth Dopant Snowplow Effect App 20060211245 - Maszara; Witold P. | 2006-09-21 |
Shallow Junction Semiconductor App 20060180873 - Pelella; Mario M. ;   et al. | 2006-08-17 |
Fully Silicided Gate Structure For Finfet Devices App 20060177998 - Lin; Ming-Ren ;   et al. | 2006-08-10 |
Formation of abrupt junctions in devices by using silicide growth dopant snowplow effect Grant 7,081,655 - Maszara July 25, 2 | 2006-07-25 |
Formation of finFET using a sidewall epitaxial layer Grant 7,078,299 - Maszara , et al. July 18, 2 | 2006-07-18 |
Strained fully depleted silicon on insulator semiconductor device and manufacturing method therefor App 20060099752 - Xiang; Qi ;   et al. | 2006-05-11 |
Shallow junction semiconductor and method for the fabrication thereof Grant 7,033,916 - Pelella , et al. April 25, 2 | 2006-04-25 |
Method of growing as a channel region to reduce source/drain junction capacitance Grant 6,955,969 - Djomehri , et al. October 18, 2 | 2005-10-18 |
Semiconductor solid phase epitaxy damage control method and integrated circuit produced thereby Grant 6,933,579 - En , et al. August 23, 2 | 2005-08-23 |
Formation of abrupt junctions in devices by using silicide growth dopant snowplow effect App 20050121731 - Maszara, Witold P. | 2005-06-09 |
Semiconductor device with non-compounded contacts, and method of making Grant 6,872,644 - Buynoski , et al. March 29, 2 | 2005-03-29 |
Formation Of Finfet Using A Sidewall Epitaxial Layer App 20050048727 - Maszara, Witold P. ;   et al. | 2005-03-03 |
Method of growing as a channel region to reduce source/drain junction capicitance App 20050048743 - Djomehri, Ihsan J. ;   et al. | 2005-03-03 |
Semiconductor device with a silicon-on-void structure and method of making the same Grant 6,830,987 - Pelella , et al. December 14, 2 | 2004-12-14 |
Ultra-thin fully depleted SOI device and method of fabrication Grant 6,815,297 - Krivokapic , et al. November 9, 2 | 2004-11-09 |
Wafer pattern variation of integrated circuit fabrication Grant 6,812,550 - En , et al. November 2, 2 | 2004-11-02 |
Method of making a hybrid SOI device that suppresses floating body effects Grant 6,727,149 - Krishnan , et al. April 27, 2 | 2004-04-27 |
Silicon-on-insulator Device With Strained Device Film And Method For Making The Same With Partial Replacement Of Isolation Oxide App 20040018668 - Maszara, Witold P. | 2004-01-29 |
Silicon-on-insulator device with strained device film and method for making the same with partial replacement of isolation oxide Grant 6,680,240 - Maszara January 20, 2 | 2004-01-20 |
Asymmetric semiconductor device having dual work function gate and method of fabrication Grant 6,630,720 - Maszara , et al. October 7, 2 | 2003-10-07 |
Asymmetric Semiconductor Device Having Dual Work Function Gate And Method Of Fabrication App 20030178689 - Maszara, Witold P. ;   et al. | 2003-09-25 |
Semiconductor device having multi-work function gate electrode and multi-segment gate dielectric Grant 6,586,808 - Xiang , et al. July 1, 2 | 2003-07-01 |
Argon implantation after silicidation for improved floating-body effects Grant 6,495,887 - Krishnan , et al. December 17, 2 | 2002-12-17 |
Semiconductor-on-insulator (SOI) device with hyperabrupt source/drain junctions Grant 6,465,847 - Krishnan , et al. October 15, 2 | 2002-10-15 |
SOI semiconductor device opening implantation gettering method Grant 6,444,534 - Maszara September 3, 2 | 2002-09-03 |
Method of fabricating semiconductor-on-insulator (SOI) device with hyperabrupt source/drain junctions Grant 6,429,054 - Krishnan , et al. August 6, 2 | 2002-08-06 |
Formation of low thermal budget shallow abrupt junctions for semiconductor devices Grant 6,362,063 - Maszara , et al. March 26, 2 | 2002-03-26 |
Method of formation of pseudo-SOI structures with direct contact of transistor body to the substrate Grant 6,245,636 - Maszara June 12, 2 | 2001-06-12 |
Method for fabricating a MOSFET device structure which facilitates mitigation of junction capacitance and floating body effects Grant 6,204,138 - Krishnan , et al. March 20, 2 | 2001-03-20 |
Method of forming a MOSFET transistor with a shallow abrupt retrograde dopant profile Grant 6,184,112 - Maszara , et al. February 6, 2 | 2001-02-06 |
Fast Mosfet with low-doped source/drain Grant 6,060,364 - Maszara , et al. May 9, 2 | 2000-05-09 |
Method for forming thickened source/drain contact regions for field effect transistors Grant 5,250,454 - Maszara October 5, 1 | 1993-10-05 |
Method for making a self-aligned lateral bipolar SOI transistor Grant 5,073,506 - Maszara , et al. December 17, 1 | 1991-12-17 |