Ma; Manny K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ma; Manny K..The latest application filed is for "method of preparing to test a capacitor".

Company Profile

0.11.12

Ma; Manny K. - Boise ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of preparing to test a capacitor Grant 6,882,587 - Beigel , et al. April 19, 2	2005-04-19
Method of preparing to test a capacitor App 20040240286 - Beigel, Kurt D. ; et al.	2004-12-02
Electrostatic discharge protection device having a graded junction and method for forming the same Grant 6,787,400 - Porter , et al. September 7, 2	2004-09-07
Circuit and method for voltage regulation in a semiconductor device Grant 6,778,452 - Beigel , et al. August 17, 2	2004-08-17
Circuit and method for voltage regulation in a semiconductor device App 20040095822 - Beigel, Kurt D. ; et al.	2004-05-20
Electrostatic discharge protection device having a graded junction and method for forming the same App 20030173622 - Porter, Stephen R. ; et al.	2003-09-18
Method of compensating for a defect within a semiconductor device Grant 6,600,687 - Beigel , et al. July 29, 2	2003-07-29
Cmos Output Driver For Semiconductor Device And Related Method For Improving Latch-up Immunity In A Cmos Output Driver App 20030107406 - Li, Wen ; et al.	2003-06-12
Method of compensating for a defect within a semiconductor device App 20030021171 - Beigel, Kurt D. ; et al.	2003-01-30
Electrostatic discharge protection device having a graded junction and method for forming the same App 20020094627 - Porter, Stephen R. ; et al.	2002-07-18
Electrostatic discharge protection device having a graded junction Grant 6,365,937 - Porter , et al. April 2, 2	2002-04-02
Method for forming electrostatic discharge protection device having a graded junction Grant 6,355,508 - Porter , et al. March 12, 2	2002-03-12
Electrostatic discharge protection device having a graded junction and method for forming the same App 20020028522 - Porter, Stephen R. ; et al.	2002-03-07
Method of testing a memory array App 20020018381 - Beigel, Kurt D. ; et al.	2002-02-14
Margin-range apparatus for a sense amp's voltage-pulling transistor Grant 6,335,888 - Beigel , et al. January 1, 2	2002-01-01
Apparatus for minimization of data line coupling in a semiconductor memory device Grant 6,320,781 - Li , et al. November 20, 2	2001-11-20
Margin-range apparatus for a sense amp's voltage-pulling transistor App 20010009522 - Beigel, Kurt D. ; et al.	2001-07-26
Method and apparatus for minimization of data line coupling in a semiconductor memory device Grant 6,259,621 - Li , et al. July 10, 2	2001-07-10
Method of compensating for a defect within a semiconductor device App 20010004333 - Beigel, Kurt D. ; et al.	2001-06-21
Method of stressing a memory device App 20010002889 - Beigel, Kurt D. ; et al.	2001-06-07
Method Of Testing A Memory Cell App 20010002888 - Beigel, Kurt D. ; et al.	2001-06-07
Method of altering the margin affecting a memory cell Grant 6,026,040 - Beigel , et al. February 15, 2	2000-02-15
Memory circuit voltage regulator Grant 5,877,993 - Biegel , et al. March 2, 1	1999-03-02

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