Long; Robert Thomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Long; Robert Thomas.The latest application filed is for "test structures and methods for inspection of semiconductor integrated circuits".

Company Profile

0.11.7

Long; Robert Thomas - Santa Cruz CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,656,170 - Pinto , et al. February 2, 2	2010-02-02
Test Structures And Methods For Inspection Of Semiconductor Integrated Circuits App 20080246030 - Satya; Akella V.S. ; et al.	2008-10-09
Multiple Directional Scans Of Test Structures On Semiconductor Integrated Circuits App 20080237487 - Pinto; Gustavo A. ; et al.	2008-10-02
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,012,439 - Pinto , et al. March 14, 2	2006-03-14
Test structures and methods for inspection of semiconductor integrated circuits Grant 6,921,672 - Satya , et al. July 26, 2	2005-07-26
Multiple directional scans of test structures on semiconductor integrated circuits App 20050139767 - Pinto, Gustavo A. ; et al.	2005-06-30
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,867,606 - Pinto , et al. March 15, 2	2005-03-15
Apparatus and methods for managing reliability of semiconductor devices Grant 6,813,572 - Satya , et al. November 2, 2	2004-11-02
Methods and systems for predicting IC chip yield Grant 6,751,519 - Satya , et al. June 15, 2	2004-06-15
Multiple directional scans of test structures on srmiconductor integrated circuits App 20030155927 - Pinto, Gustavo A. ; et al.	2003-08-21
Inspectable buried test structures and methods for inspecting the same Grant 6,576,923 - Satya , et al. June 10, 2	2003-06-10
Apparatus and methods for managing reliability of semiconductor devices App 20030097228 - Satya, Akella V.S. ; et al.	2003-05-22
Test structures and methods for inspection of semiconductor integrated circuits App 20030096436 - Satya, Akella V. S. ; et al.	2003-05-22
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,566,885 - Pinto , et al. May 20, 2	2003-05-20
Test structures and methods for inspection of semiconductor integrated circuits Grant 6,528,818 - Satya , et al. March 4, 2	2003-03-04
Inspectable buried test structures and methods for inspecting the same Grant 6,509,197 - Satya , et al. January 21, 2	2003-01-21
Inspectable buried test structures and methods for inspecting the same App 20020187582 - Satya, Akella V. S. ; et al.	2002-12-12
Methods and apparatus for optimizing semiconductor inspection tools Grant 6,433,561 - Satya , et al. August 13, 2	2002-08-13

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