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Composite method of trapping carbon dioxide in gas mixture Grant 10,173,167 - Chen , et al. J | 2019-01-08 |
Manufacturing Method of Big-model Low-Permeability Microcrack Core App 20190002344 - GUO; Ping ;   et al. | 2019-01-03 |
Direct Method For Manufacturing Large Model Fractured Core And Maintaining Original Oil-water Saturation App 20180348105 - GUO; Ping ;   et al. | 2018-12-06 |
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Methods For Forming Mask Layers Using A Flowable Carbon-containing Silicon Dioxide Material App 20180005893 - Cao; Huy ;   et al. | 2018-01-04 |
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Resource Processing Method and Device for Multi-controller System App 20170308469 - LIU; Huang ;   et al. | 2017-10-26 |
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Composite Method Of Trapping Carbon Dioxide In Gas Mixture App 20170173518 - Chen; Guangjin ;   et al. | 2017-06-22 |
Methods For Producing Integrated Circuits With Air Gaps And Integrated Circuits Produced From Such Methods App 20170162430 - Dai; Xintuo ;   et al. | 2017-06-08 |
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Facilitating etch processing of a thin film via partial implantation thereof Grant 9,620,381 - Patil , et al. April 11, 2 | 2017-04-11 |
Methods for fabricating integrated circuits using self-aligned quadruple patterning Grant 9,620,380 - Dai , et al. April 11, 2 | 2017-04-11 |
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Reducing liner corrosion during metallization of semiconductor devices Grant 9,595,493 - Sun , et al. March 14, 2 | 2017-03-14 |
Method for eliminating interlayer dielectric dishing and controlling gate height uniformity Grant 9,589,807 - Huang , et al. March 7, 2 | 2017-03-07 |
Reducing Liner Corrosion During Metallization Of Semiconductor Devices App 20170047282 - SUN; Zhiguo ;   et al. | 2017-02-16 |
Through Silicon Via Device Having Low Stress, Thin Film Gaps And Methods For Forming The Same App 20160372425 - Liu; Huang ;   et al. | 2016-12-22 |
Inhibiting diffusion of elements between material layers of a layered circuit structure Grant 9,502,232 - Gu , et al. November 22, 2 | 2016-11-22 |
Integrated circuits having improved gate structures and methods for fabricating same Grant 9,490,129 - Hu , et al. November 8, 2 | 2016-11-08 |
Metal resistor using FinFET-based replacement gate process Grant 9,478,625 - Zang , et al. October 25, 2 | 2016-10-25 |
Liner and cap layer for placeholder source/drain contact structure planarization and replacement Grant 9,466,723 - Huang , et al. October 11, 2 | 2016-10-11 |
Through silicon via device having low stress, thin film gaps and methods for forming the same Grant 9,455,188 - Liu , et al. September 27, 2 | 2016-09-27 |
10 nm alternative N/P doped fin for SSRW scheme Grant 9,455,204 - Cao , et al. September 27, 2 | 2016-09-27 |
Method for forming air gap structure using carbon-containing spacer Grant 9,443,956 - Yu , et al. September 13, 2 | 2016-09-13 |
Lithographic stack excluding SiARC and method of using same Grant 9,431,528 - Yu , et al. August 30, 2 | 2016-08-30 |
Method for forming an air gap around a through-silicon via Grant 9,425,127 - Yu , et al. August 23, 2 | 2016-08-23 |
Method of forming a dielectric film Grant 9,418,832 - Liu , et al. August 16, 2 | 2016-08-16 |
Method for reducing gate height variation due to overlapping masks Grant 9,401,416 - Yu , et al. July 26, 2 | 2016-07-26 |
Methods For Preventing Oxidation Damage During Finfet Fabrication App 20160211373 - YU; HONG ;   et al. | 2016-07-21 |
Shallow trench isolation integration methods and devices formed thereby Grant 9,385,192 - Shen , et al. July 5, 2 | 2016-07-05 |
Defect-free relaxed covering layer on semiconductor substrate with lattice mismatch Grant 9,368,342 - Huang , et al. June 14, 2 | 2016-06-14 |
Method For Forming Air Gap Structure Using Carbon-containing Spacer App 20160163816 - Yu; Hong ;   et al. | 2016-06-09 |
Method For Reducing Gate Height Variation Due To Overlapping Masks App 20160163830 - Yu; Hong ;   et al. | 2016-06-09 |
Integrated circuits and methods of forming the same with multi-level electrical connection Grant 9,349,635 - Liew , et al. May 24, 2 | 2016-05-24 |
Alternating Space Decomposition In Circuit Structure Fabrication App 20160124308 - NING; Guoxiang ;   et al. | 2016-05-05 |
Achieving A Critical Dimension Target Based On Resist Characteristics App 20160125121 - NING; Guoxiang ;   et al. | 2016-05-05 |
Achieving a critical dimension target based on resist characteristics Grant 9,329,471 - Ning , et al. May 3, 2 | 2016-05-03 |
Methods for preventing oxidation damage during FinFET fabrication Grant 9,324,841 - Yu , et al. April 26, 2 | 2016-04-26 |
Formation of carbon-rich contact liner material Grant 9,318,440 - Cao , et al. April 19, 2 | 2016-04-19 |
Dimension-controlled Via Formation Processing App 20160099171 - HU; Xiang ;   et al. | 2016-04-07 |
Dimension-controlled via formation processing Grant 9,305,832 - Hu , et al. April 5, 2 | 2016-04-05 |
Method to improve selectivity cobalt cap process Grant 9,275,898 - Shu , et al. March 1, 2 | 2016-03-01 |
Inhibiting Diffusion Of Elements Between Material Layers Of A Layered Circuit Structure App 20160005598 - GU; Sipeng ;   et al. | 2016-01-07 |
Method for producing integrated circuit with smaller grains of tungsten Grant 9,230,863 - Yu , et al. January 5, 2 | 2016-01-05 |
Method for forming through silicon via with wafer backside protection Grant 9,230,886 - Leong , et al. January 5, 2 | 2016-01-05 |
Uniform gate height for mixed-type non-planar semiconductor devices Grant 9,230,822 - Yu , et al. January 5, 2 | 2016-01-05 |
Dimension-controlled Via Formation Processing App 20150380246 - HU; Xiang ;   et al. | 2015-12-31 |
Uniform Gate Height For Mixed-type Non-planar Semiconductor Devices App 20150364336 - YU; Hong ;   et al. | 2015-12-17 |
Formation Of Carbon-rich Contact Liner Material App 20150357285 - CAO; Huy ;   et al. | 2015-12-10 |
Methods Of Fabricating Defect-free Semiconductor Structures App 20150357292 - LIU; Hung-Wei ;   et al. | 2015-12-10 |
LITHOGRAPHIC STACK EXCLUDING SiARC AND METHOD OF USING SAME App 20150332934 - YU; Hong ;   et al. | 2015-11-19 |
Shallow Trench Isolation Integration Methods And Devices Formed Thereby App 20150333121 - Shen; Hongliang ;   et al. | 2015-11-19 |
Integrated Circuits Having Improved Gate Structures And Methods For Fabricating Same App 20150325482 - Hu; Xiang ;   et al. | 2015-11-12 |
Reduced Silicon Gouging During Oxide Spacer Formation App 20150325445 - SHU; Jiehui ;   et al. | 2015-11-12 |
Semiconductor structures with bridging films and methods of fabrication Grant 9,184,288 - Gu , et al. November 10, 2 | 2015-11-10 |
Defect-free Relaxed Covering Layer On Semiconductor Substrate With Lattice Mismatch App 20150295047 - HUANG; Haigou ;   et al. | 2015-10-15 |
FinFET gate with insulated vias and method of making same Grant 9,153,693 - Yu , et al. October 6, 2 | 2015-10-06 |
Fabrication Of Semiconductor Structures Using Oxidized Polycrystalline Silicon As Conformal Stop Layers App 20150270159 - HUANG; Haigou ;   et al. | 2015-09-24 |
De-oxidation Of Metal Gate For Improved Gate Performance App 20150270142 - Liu; Huang ;   et al. | 2015-09-24 |
Methods of fabricating defect-free semiconductor structures Grant 9,142,422 - Liu , et al. September 22, 2 | 2015-09-22 |
Semiconductor Structures With Bridging Films And Methods Of Fabrication App 20150263169 - GU; Sipeng ;   et al. | 2015-09-17 |
Formation of carbon-rich contact liner material Grant 9,130,019 - Cao , et al. September 8, 2 | 2015-09-08 |
Shallow trench isolation integration methods and devices formed thereby Grant 9,123,771 - Shen , et al. September 1, 2 | 2015-09-01 |
Integrated Circuits With A Tungsten Component And Methods For Producing Such Integrated Circuits App 20150228543 - Yu; Jialin ;   et al. | 2015-08-13 |
Modified, etch-resistant gate structure(s) facilitating circuit fabrication Grant 9,093,561 - Yu , et al. July 28, 2 | 2015-07-28 |
Integrated circuits including FINFET devices with shallow trench isolation that includes a thermal oxide layer and methods for making the same Grant 9,087,870 - Tong , et al. July 21, 2 | 2015-07-21 |
Formation Of Carbon-rich Contact Liner Material App 20150194342 - CAO; Huy ;   et al. | 2015-07-09 |
Method of Forming A Dielectric Film App 20150162188 - Liu; Hung-Wei ;   et al. | 2015-06-11 |
Method For Forming Through Silicon Via With Wafer Backside Protection App 20150137359 - LEONG; Lup San ;   et al. | 2015-05-21 |
Modified, Etch-resistant Gate Structure(s) Facilitating Circuit Fabrication App 20150140751 - YU; Hong ;   et al. | 2015-05-21 |
Methods Of Fabricating Defect-free Semiconductor Structures App 20150123250 - LIU; Hung-Wei ;   et al. | 2015-05-07 |
Facilitating Etch Processing Of A Thin Film Via Partial Implantation Thereof App 20150104948 - PATIL; Suraj K. ;   et al. | 2015-04-16 |
Methods For Preventing Oxidation Damage During Finfet Fabrication App 20150099340 - Yu; Hong ;   et al. | 2015-04-09 |
Method For Manufacturing A Semiconductor Device By Stopping Planarization Of Insulating Material On Fins App 20150093877 - HUANG; Haigou ;   et al. | 2015-04-02 |
Method of forming a dielectric film Grant 8,993,446 - Liu , et al. March 31, 2 | 2015-03-31 |
Reliable interconnect for semiconductor device Grant 8,987,134 - Wang , et al. March 24, 2 | 2015-03-24 |
Integrated Circuits Having Smooth Metal Gates And Methods For Fabricating Same App 20150076624 - Liu; Huang ;   et al. | 2015-03-19 |
Method For Forming An Air Gap Around A Through-silicon Via App 20150069579 - YU; Hong ;   et al. | 2015-03-12 |
Package Interconnects App 20150061085 - YU; Hong ;   et al. | 2015-03-05 |
Method and device to achieve self-stop and precise gate height Grant 8,962,407 - Yu , et al. February 24, 2 | 2015-02-24 |
Method for forming an air gap around a through-silicon via Grant 8,962,474 - Yu , et al. February 24, 2 | 2015-02-24 |
Method for forming through silicon via with wafer backside protection Grant 8,940,637 - Leong , et al. January 27, 2 | 2015-01-27 |
Methods for fabricating integrated circuits utilizing silicon nitride layers Grant 8,940,650 - Cao , et al. January 27, 2 | 2015-01-27 |
Cd Control App 20140374920 - ZOU; Zheng ;   et al. | 2014-12-25 |
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Low-k Nitride Film And Method Of Making App 20140346648 - CAO; Huy ;   et al. | 2014-11-27 |
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Contact Liner And Methods Of Fabrication Thereof App 20140327139 - YU; Jialin ;   et al. | 2014-11-06 |
Damascene process for aligning and bonding through-silicon-via based 3D integrated circuit stacks Grant 8,877,637 - Yu , et al. November 4, 2 | 2014-11-04 |
Method Of Forming A Dielectric Film App 20140315385 - Liu; Hung-Wei ;   et al. | 2014-10-23 |
Gate electrode(s) and contact structure(s), and methods of fabrication thereof Grant 8,859,417 - Yu , et al. October 14, 2 | 2014-10-14 |
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Shallow Trench Isolation Integration Methods And Devices Formed Thereby App 20140227858 - Shen; Hongliang ;   et al. | 2014-08-14 |
Methods of forming replacement gate structures for NFET semiconductor devices and devices having such gate structures Grant 8,803,254 - Laloe , et al. August 12, 2 | 2014-08-12 |
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Copper Hillock Prevention With Hydrogen Plasma Treatment In A Dedicated Chamber App 20140117545 - LIU; Huang ;   et al. | 2014-05-01 |
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Method And Device To Achieve Self-stop And Precise Gate Height App 20140061732 - Yu; Hong ;   et al. | 2014-03-06 |
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Reliable Contacts App 20130075823 - YU; Hong ;   et al. | 2013-03-28 |
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Damascene Process For Aligning And Bonding Through-silicon-via Based 3d Integrated Circuit Stacks App 20130069232 - Yu; Hong ;   et al. | 2013-03-21 |
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Method Of Forming Oxide Encapsulated Conductive Features App 20120273949 - Liu; Huang ;   et al. | 2012-11-01 |
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Integrated Circuit Including A Stressed Dielectric Layer With Stable Stress App 20110316085 - LIU; Huang ;   et al. | 2011-12-29 |
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Method for reducing silicide defects in integrated circuits Grant 7,960,283 - Ye , et al. June 14, 2 | 2011-06-14 |
Integrated circuit system employing sacrificial spacers Grant 7,892,900 - Liu , et al. February 22, 2 | 2011-02-22 |
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Method For Reducing Silicide Defects In Integrated Circuits App 20100267236 - YE; Jianhui ;   et al. | 2010-10-21 |
Integrated circuit system employing selective epitaxial growth technology Grant 7,795,680 - Liu , et al. September 14, 2 | 2010-09-14 |
Nested and isolated transistors with reduced impedance difference Grant 7,767,577 - Widodo , et al. August 3, 2 | 2010-08-03 |
Integrated circuit processing system Grant 7,749,894 - Wang , et al. July 6, 2 | 2010-07-06 |
Method for reducing silicide defects in integrated circuits Grant 7,745,320 - Ye , et al. June 29, 2 | 2010-06-29 |
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Structure and method to prevent charge damage from e-beam curing process Grant 7,678,586 - Liu , et al. March 16, 2 | 2010-03-16 |
Integrated Circuit System Employing Single Mask Layer Technique For Well Formation App 20100009527 - Lee; Yong Meng ;   et al. | 2010-01-14 |
Integrated Circuit System Employing A Modified Isolation Structure App 20090325359 - Liu; Huang ;   et al. | 2009-12-31 |
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Stressed Dielectric Layer With Stable Stress App 20090250764 - LIU; Huang ;   et al. | 2009-10-08 |
Integrated Circuit System Employing Sacrificial Spacers App 20090250762 - Liu; Huang ;   et al. | 2009-10-08 |
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Method and apparatus for providing void structures Grant 7,566,656 - Liu , et al. July 28, 2 | 2009-07-28 |
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Integrated Circuit System Employing Selective Epitaxial Growth Technology App 20090146262 - Liu; Huang ;   et al. | 2009-06-11 |
Method of forming high-k dielectric stop layer for contact hole opening App 20090146296 - YE; Jianhui ;   et al. | 2009-06-11 |
Method And Apparatus For Providing Void Structures App 20080153252 - LIU; Huang ;   et al. | 2008-06-26 |
Integrated Circuit Having Ultralow-K Dielectric Layer App 20080153310 - Widodo; Johnny ;   et al. | 2008-06-26 |
Interconnect Capping Layer and Method of Fabrication App 20080150137 - LIU; Huang ;   et al. | 2008-06-26 |
Integrated Circuit Processing System App 20080111238 - Wang; Xianbin ;   et al. | 2008-05-15 |
OPTIMIZED SiCN CAPPING LAYER App 20070155186 - Baks; Heidi ;   et al. | 2007-07-05 |
Structure and method to prevent charge damage from e-beam curing process App 20070134941 - Liu; Huang ;   et al. | 2007-06-14 |
Method of making a plastic elbow fitting App 20040140594 - Liu, Huang | 2004-07-22 |
Method for forming tool box hinge by blown molding App 20030067101 - Liu, Huang | 2003-04-10 |
Intermetal dielectric layer for integrated circuits App 20020130418 - Liu, Huang ;   et al. | 2002-09-19 |
Two-step, low argon, HDP CVD oxide deposition process Grant 6,211,040 - Liu , et al. April 3, 2 | 2001-04-03 |