loadpatents
name:-0.038041830062866
name:-0.023728847503662
name:-0.0019919872283936
Lipinski; Matthias Patent Filings

Lipinski; Matthias

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lipinski; Matthias.The latest application filed is for "metrology systems and methods for lithography processes".

Company Profile
0.18.22
  • Lipinski; Matthias - Poughkeepsie NY
  • Lipinski; Matthias - Poughkeeosie NY
  • Lipinski; Matthias - Wappingers Falls NY
  • Lipinski, Matthias - Dresden DE
  • Lipinski, Matthias - Erlangen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor device manufacturing methods
Grant 8,697,339 - Zhuang , et al. April 15, 2
2014-04-15
Metrology systems and methods for lithography processes
Grant 8,394,574 - Sarma , et al. March 12, 2
2013-03-12
Semiconductor devices and methods of manufacturing thereof
Grant 8,349,528 - Lipinski , et al. January 8, 2
2013-01-08
Metrology Systems and Methods for Lithography Processes
App 20120013884 - Sarma; Chandrasekhar ;   et al.
2012-01-19
Lithography masks and methods of manufacture thereof
Grant 8,071,261 - Gutmann , et al. December 6, 2
2011-12-06
Metrology systems and methods for lithography processes
Grant 8,067,135 - Sarma , et al. November 29, 2
2011-11-29
Semiconductor device having a polysilicon layer with a non-constant doping profile
Grant 8,063,406 - Zhuang , et al. November 22, 2
2011-11-22
Semiconductor Devices and Methods of Manufacturing Thereof
App 20110250530 - Lipinski; Matthias ;   et al.
2011-10-13
Semiconductor devices and methods of manufacturing thereof
Grant 8,007,985 - Lipinski , et al. August 30, 2
2011-08-30
Semiconductor Device Manufacturing Methods
App 20110183266 - Zhuang; Haoren ;   et al.
2011-07-28
Threshold voltage consistency and effective width in same-substrate device groups
Grant 7,892,939 - Hampp , et al. February 22, 2
2011-02-22
Method for Manufacturing a Semiconductor Device Having Doped and Undoped Polysilicon Layers
App 20110031563 - Zhuang; Haoren ;   et al.
2011-02-10
Method for manufacturing a semiconductor device having doped and undoped polysilicon layers
Grant 7,842,579 - Zhuang , et al. November 30, 2
2010-11-30
Metrology Systems and Methods for Lithography Processes
App 20100283052 - Sarma; Chandrasekhar ;   et al.
2010-11-11
Metrology systems and methods for lithography processes
Grant 7,794,903 - Sarma , et al. September 14, 2
2010-09-14
Feature Dimension Control in a Manufacturing Process
App 20100120177 - Zhuang; Haoren ;   et al.
2010-05-13
Feature dimension control in a manufacturing process
Grant 7,674,350 - Zhuang , et al. March 9, 2
2010-03-09
Threshold Voltage Consistency and Effective Width in Same-Substrate Device Groups
App 20090227086 - Hampp; Roland ;   et al.
2009-09-10
Methods of fabricating integrated circuit transistors by simultaneously removing a photoresist layer and a carbon-containing layer on different active areas
Grant 7,541,234 - Chang , et al. June 2, 2
2009-06-02
Lithography Masks and Methods of Manufacture Thereof
App 20090023078 - Gutmann; Alois ;   et al.
2009-01-22
Semiconductor device manufacturing methods
App 20080286698 - Zhuang; Haoren ;   et al.
2008-11-20
Methods of Forming Mask Patterns on Semiconductor Wafers that Compensate for Nonuniform Center-to-Edge Etch Rates During Photolithographic Processing
App 20080220609 - Chang; Chong Kwang ;   et al.
2008-09-11
Semiconductor Device with Pre-Anneal Sandwich Gate Structure, and Method of Manufacturing
App 20080173958 - Zhuang; Haoren ;   et al.
2008-07-24
Feature Dimension Control in a Manufacturing Process
App 20080176344 - Zhuang; Haoren ;   et al.
2008-07-24
Metrology systems and methods for lithography processes
App 20080044741 - Sarma; Chandrasekhar ;   et al.
2008-02-21
Process control systems and methods
App 20070239305 - Zhuang; Haoren ;   et al.
2007-10-11
Semiconductor devices and methods of manufacturing thereof
App 20070178388 - Lipinski; Matthias ;   et al.
2007-08-02
Process for generating a hard mask for the patterning of a layer
Grant 7,223,525 - Lipinski May 29, 2
2007-05-29
Methods of fabricating integrated circuit transistors by simultaneously removing a photoresist layer and a carbon-containing layer on different active areas
App 20070099126 - Chang; Chong Kwang ;   et al.
2007-05-03
Plasma encapsulation for electronic and microelectronic components such as organic light emitting diodes
Grant 6,933,538 - Hunze , et al. August 23, 2
2005-08-23
Process for generating a hard mask for the patterning of a layer, and hard mask for the patterning of a layer
App 20050106478 - Lipinski, Matthias
2005-05-19
Hardmask of amorphous carbon-hydrogen (a-C:H) layers with tunable etch resistivity
Grant 6,835,663 - Lipinski December 28, 2
2004-12-28
Tungsten hard mask
Grant 6,815,364 - Stojakovic , et al. November 9, 2
2004-11-09
System and method for performing a metal layer RIE process
App 20040203242 - Stojakovic, George ;   et al.
2004-10-14
Plasma encapsulation for electronic and microelectronic components such as oleds
App 20040046165 - Hunze, Arvid ;   et al.
2004-03-11
Hardmask of amorphous carbon-hydrogen (a-C:H) layers with tunable etch resistivity
App 20040000534 - Lipinski, Matthias
2004-01-01
Tungsten hard mask
App 20030064602 - Stojakovic, George ;   et al.
2003-04-03
Method of discharging reaction water in PEM fuel cells and fuel cell for carrying out the method
App 20010038933 - Gebhardt, Ulrich ;   et al.
2001-11-08

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