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Semiconductor device structure with salicide layer and method for forming the same
Grant 11,444,173 - Shen , et al. September 13, 2 | 2022-09-13 |
Forming isolation regions for separating fins and gate stacks
Grant 11,437,277 - Ko , et al. September 6, 2 | 2022-09-06 |
Semiconductor Device, Finfet Device And Methods Of Forming The Same
App 20220238669 - Cheng; Po-Hsien ; et al. | 2022-07-28 |
Semiconductor Device Structure With Etch Stop Layer
App 20220223736 - KO; Chung-Ting ; et al. | 2022-07-14 |
Semiconductor Device And Methods Of Forming The Same
App 20220216147 - Chou; Pei-Yu ; et al. | 2022-07-07 |
Structure and formation method of semiconductor device with monoatomic etch stop layer
Grant 11,316,047 - Ko , et al. April 26, 2 | 2022-04-26 |
Contact Plug Structure Of Semiconductor Device And Method Of Forming Same
App 20220123115 - Chou; Pei-Yu ; et al. | 2022-04-21 |
In-Situ Deposition and Densification Treatment for Metal-Comprising Resist Layer
App 20220100088 - Kuo; Yi-Chen ; et al. | 2022-03-31 |
Photoresist For Semiconductor Fabrication
App 20220100087 - Liu; Chih-Cheng ; et al. | 2022-03-31 |
Photoresist For Semiconductor Fabrication
App 20220100086 - Liu; Chih-Cheng ; et al. | 2022-03-31 |
Semiconductor device and methods of forming the same
Grant 11,289,417 - Chou , et al. March 29, 2 | 2022-03-29 |
Semiconductor device, FinFET device and methods of forming the same
Grant 11,271,083 - Cheng , et al. March 8, 2 | 2022-03-08 |
Fin field effect transistor (FinFET) device structure with capping layer and method for forming the same
Grant 11,264,383 - Chen , et al. March 1, 2 | 2022-03-01 |
Isolation features and methods of fabricating the same
Grant 11,239,309 - Wu , et al. February 1, 2 | 2022-02-01 |
Photoresist Layer Outgassing Prevention
App 20220028684 - CHEN; Yen-Yu ; et al. | 2022-01-27 |
Method Of Manufacturing A Semiconductor Device And Pattern Formation Method
App 20220005687 - LIU; Chih-Cheng ; et al. | 2022-01-06 |
Field-effect transistor and method of manufacturing the same
Grant 11,164,948 - Ho , et al. November 2, 2 | 2021-11-02 |
Forming Isolation Regions For Separating Fins And Gate Stacks
App 20210335670 - Ko; Chung-Ting ; et al. | 2021-10-28 |
Method Of Manufacturing A Semiconductor Device
App 20210302839 - LIU; Chih-Cheng ; et al. | 2021-09-30 |
Photoresist Layer Surface Treatment, Cap Layer, And Method Of Forming Photoresist Pattern
App 20210305040 - KUO; Yi-Chen ; et al. | 2021-09-30 |
Method Of Manufacturing A Semiconductor Device
App 20210302833 - WENG; Ming-Hui ; et al. | 2021-09-30 |
Method Of Manufacturing A Semiconductor Device
App 20210305047 - WEI; Jia-Lin ; et al. | 2021-09-30 |
Isolation Features and Methods of Fabricating the Same
App 20210273049 - Wu; I-Wen ; et al. | 2021-09-02 |
Semiconductor Device and Method
App 20210183696 - Chen; Chun-Han ; et al. | 2021-06-17 |
Semiconductor Device, Finfet Device And Methods Of Forming The Same
App 20210098584 - Cheng; Po-Hsien ; et al. | 2021-04-01 |
Semiconductor Device And Methods Of Forming The Same
App 20210098365 - Chou; Pei-Yu ; et al. | 2021-04-01 |
Field-effect Transistor And Method Of Manufacturing The Same
App 20210091191 - Ho; Tsai-Jung ; et al. | 2021-03-25 |
Semiconductor device and method
Grant 10,943,818 - Chen , et al. March 9, 2 | 2021-03-09 |
Fin Field Effect Transistor (finfet) Device Structure With Capping Layer And Method For Forming The Same
App 20210005602 - CHEN; Chun-Han ; et al. | 2021-01-07 |
Low-k gate spacer and formation thereof
Grant 10,854,521 - Lu , et al. December 1, 2 | 2020-12-01 |
FinFET device and method of forming same
Grant 10,840,357 - Ko , et al. November 17, 2 | 2020-11-17 |
Semiconductor structure and device each having differential etch stop layer over gate spacer
Grant 10,804,271 - Ko , et al. October 13, 2 | 2020-10-13 |
Fin field effect transistor (finFET) device structure with capping layer and method for forming the same
Grant 10,797,050 - Chen , et al. October 6, 2 | 2020-10-06 |
Method of forming differential etch stop layer using directional plasma to activate surface on device structure
Grant 10,763,104 - Ko , et al. Sep | 2020-09-01 |
Semiconductor Device and Method
App 20200135550 - Chen; Chun-Han ; et al. | 2020-04-30 |
Systems And Methods For A Plasma Enhanced Deposition Of Material On A Semiconductor Substrate
App 20200123656 - LIN; Kun-Mo ; et al. | 2020-04-23 |
Isolation Features and Methods of Fabricating the Same
App 20200111867 - Wu; I-Wen ; et al. | 2020-04-09 |
Low-K Gate Spacer and Formation Thereof
App 20200075419 - Lu; Bo-Cyuan ; et al. | 2020-03-05 |
Structure And Formation Method Of Semiconductor Device Structure With Etch Stop Layer
App 20200058793 - KO; Chung-Ting ; et al. | 2020-02-20 |
Fin Field Effect Transistor (finfet) Device Structure With Capping Layer And Method For Forming The Same
App 20200043924 - CHEN; Chun-Han ; et al. | 2020-02-06 |
Semiconductor Device and Method of Manufacture
App 20200043799 - Lee; Chun-Yi ; et al. | 2020-02-06 |
Wafer Susceptor with Improved Thermal Characteristics
App 20200032415 - Lin; Yi-Hung ; et al. | 2020-01-30 |
FinFET Device and Method of Forming Same
App 20200035814 - Ko; Chung-Ting ; et al. | 2020-01-30 |
Differential Layer Formation Processes and Structures Formed Thereby
App 20200035679 - Ko; Chung-Ting ; et al. | 2020-01-30 |
Systems and methods for a plasma enhanced deposition of material on a semiconductor substrate
Grant 10,519,545 - Lin , et al. Dec | 2019-12-31 |
Low-K gate spacer and formation thereof
Grant 10,510,612 - Lu , et al. Dec | 2019-12-17 |
FinFet device and method of forming the same
Grant 10,505,021 - Ko , et al. Dec | 2019-12-10 |
Isolation features and methods of fabricating the same
Grant 10,504,990 - Wu , et al. Dec | 2019-12-10 |
Low-k gate spacer and formation thereof
Grant 10,483,168 - Lu , et al. Nov | 2019-11-19 |
Fin field effect transistor (FinFET) device structure with capping layer and method for forming the same
Grant 10,475,788 - Chen , et al. Nov | 2019-11-12 |
Structure and formation method of semiconductor device structure with etch stop layer
Grant 10,468,529 - Ko , et al. No | 2019-11-05 |
Wafer susceptor with improved thermal characteristics
Grant 10,435,811 - Lin , et al. O | 2019-10-08 |
Fin Field Effect Transistor (finfet) Device Structure With Capping Layer And Method For Forming The Same
App 20190164960 - CHEN; Chun-Han ; et al. | 2019-05-30 |
Isolation Features and Methods of Fabricating the Same
App 20190157387 - Wu; I-Wen ; et al. | 2019-05-23 |
Low-K Gate Spacer and Formation Thereof
App 20190148239 - Lu; Bo-Cyuan ; et al. | 2019-05-16 |
Low-k Gate Spacer And Formation Thereof
App 20190148238 - LU; Bo-Cyuan ; et al. | 2019-05-16 |
Semiconductor Device Structure With Salicide Layer And Method For Forming The Same
App 20190131421 - SHEN; Hsiang-Ku ; et al. | 2019-05-02 |
FinFet Device and Method of Forming the Same
App 20190103477 - Ko; Chung-Ting ; et al. | 2019-04-04 |
Differential Layer Formation Processes and Structures Formed Thereby
App 20190096888 - KO; Chung-Ting ; et al. | 2019-03-28 |
Structure And Formation Method Of Semiconductor Device Structure With Etch Stop Layer
App 20190019890 - KO; Chung-Ting ; et al. | 2019-01-17 |
Honeycomb heaters for integrated circuit manufacturing
Grant 9,960,059 - Lin , et al. May 1, 2 | 2018-05-01 |
Systems And Methods For A Plasma Enhanced Deposition Of Material On A Semiconductor Substrate
App 20170342561 - LIN; Kun-Mo ; et al. | 2017-11-30 |
Wafer Susceptor with Improved Thermal Characteristics
App 20170088976 - Lin; Yi-Hung ; et al. | 2017-03-30 |
Wafer susceptor with improved thermal characteristics
Grant 9,517,539 - Lin , et al. December 13, 2 | 2016-12-13 |
Wafer Susceptor with Improved Thermal Characteristics
App 20160064268 - Lin; Yi-Hung ; et al. | 2016-03-03 |
Method of temperature determination for deposition reactors
Grant 9,011,599 - Lu , et al. April 21, 2 | 2015-04-21 |
Honey Cone Heaters for Integrated Circuit Manufacturing
App 20130256292 - Lin; Yi-Hung ; et al. | 2013-10-03 |
Apparatus and Method for Controlling Wafer Temperature
App 20130130184 - Lu; Chang-Shen ; et al. | 2013-05-23 |
MOS devices with partial stressor channel
Grant 8,274,071 - Yu , et al. September 25, 2 | 2012-09-25 |
Method Of Temperature Determination For Deposition Reactors
App 20120012047 - LU; Jhi-Cherng ; et al. | 2012-01-19 |
MOS Devices with Partial Stressor Channel
App 20110101305 - Yu; Ming-Hua ; et al. | 2011-05-05 |
MOS devices with partial stressor channel
Grant 7,868,317 - Yu , et al. January 11, 2 | 2011-01-11 |
MOS Devices with Partial Stressor Channel
App 20090224337 - Yu; Ming-Hua ; et al. | 2009-09-10 |
MOS devices with partial stressor channel
Grant 7,554,110 - Yu , et al. June 30, 2 | 2009-06-30 |
SiGe or SiC layer on STI sidewalls
App 20080290420 - Yu; Ming-Hua ; et al. | 2008-11-27 |
MOS devices with partial stressor channel
App 20080067557 - Yu; Ming-Hua ; et al. | 2008-03-20 |
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