loadpatents
name:-0.023219108581543
name:-0.028503179550171
name:-0.014559984207153
Levy; Sagy Charel Patent Filings

Levy; Sagy Charel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Levy; Sagy Charel.The latest application filed is for "oxide-nitride-oxide stack having multiple oxynitride layers".

Company Profile
16.25.25
  • Levy; Sagy Charel - Zichron Yaakov IL
  • - Zichron Yaakov IL
  • Levy; Sagy Charel - Sunnyvale CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 11,456,365 - Polishchuk , et al. September 27, 2
2022-09-27
Oxide-Nitride-Oxide Stack Having Multiple Oxynitride Layers
App 20220093773 - Levy; Sagy Charel ;   et al.
2022-03-24
Oxide-nitride-oxide stack having multiple oxynitride layers
Grant 11,222,965 - Levy , et al. January 11, 2
2022-01-11
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20220005929 - Polishchuk; Igor ;   et al.
2022-01-06
Oxide-nitride-oxide Stack Having Multiple Oxynitride Layers
App 20210249254 - Levy; Sagy Charel ;   et al.
2021-08-12
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20210217862 - Polishchuk; Igor ;   et al.
2021-07-15
Flash memory device and method
Grant 11,056,565 - Polishchuk , et al. July 6, 2
2021-07-06
Sonos Ono Stack Scaling
App 20210104402 - Jenne; Fredrick B. ;   et al.
2021-04-08
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 10,903,325 - Polishchuk , et al. January 26, 2
2021-01-26
Oxide-nitride-oxide stack having multiple oxynitride layers
Grant 10,903,068 - Levy , et al. January 26, 2
2021-01-26
Nonvolatile Charge Trap Memory Device Having A High Dielectric Constant Blocking Region
App 20200303563 - Polishchuk; Igor ;   et al.
2020-09-24
SONOS ONO stack scaling
Grant 10,699,901 - Jenne , et al.
2020-06-30
Radical Oxidation Process For Fabricating A Nonvolatile Charge Trap Memory Device
App 20200161478 - Ramkumar; Krishnaswarmy ;   et al.
2020-05-21
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20200152752 - Polishchuk; Igor ;   et al.
2020-05-14
Oxide-Nitride-Oxide Stack Having Multiple Oxynitride Layers
App 20200144399 - Levy; Sagy Charel ;   et al.
2020-05-07
Nonvolatile charge trap memory device having a high dielectric constant blocking region
Grant 10,615,289 - Polishchuk , et al.
2020-04-07
Radical oxidation process for fabricating a nonvolatile charge trap memory device
Grant 10,593,812 - Ramkumar , et al.
2020-03-17
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20200013863 - Polishchuk; Igor ;   et al.
2020-01-09
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 10,446,656 - Polishchuk , et al. Oc
2019-10-15
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 10411103 -
2019-09-10
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 10,312,336 - Polishchuk , et al.
2019-06-04
Radical oxidation process for fabricating a nonvolatile charge trap memory device
Grant 10,304,968 - Ramkumar , et al.
2019-05-28
Radical oxidation process for fabricating a nonvolatile charge trap memory device
Grant 10269985 -
2019-04-23
Sonos Ono Stack Scaling
App 20180351003 - Jenne; Fredrick B. ;   et al.
2018-12-06
Radical Oxidation Process For Fabricating A Nonvolatile Charge Trap Memory Device
App 20180351004 - Ramkumar; Krishnaswamy ;   et al.
2018-12-06
Nonvolatile charge trap memory device having a deuterated layer in a multi-layer charge-trapping region
Grant 10,079,314 - Levy , et al. September 18, 2
2018-09-18
SONOS ONO stack scaling
Grant 9,997,641 - Jenne , et al. June 12, 2
2018-06-12
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20180158919 - Polishchuk; Igor ;   et al.
2018-06-07
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 9,929,240 - Polishchuk , et al. March 27, 2
2018-03-27
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20170186883 - Polishchuk; Igor ;   et al.
2017-06-29
Method Of Manufacturing For Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20170092729 - Polishchuk; Igor ;   et al.
2017-03-30
Nonvolatile Charge Trap Memory Device Having A High Dielectric Constant Blocking Region
App 20170092781 - Polishchuk; Igor ;   et al.
2017-03-30
SONOS type stacks for nonvolatile charge trap memory devices and methods to form the same
Grant 9,553,175 - Puchner , et al. January 24, 2
2017-01-24
Method of manufacturing for memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 9,502,543 - Polishchuk , et al. November 22, 2
2016-11-22
Sonos Ono Stack Scaling
App 20160300959 - Jenne; Fredrick B. ;   et al.
2016-10-13
Oxide-Nitride-Oxide Stack Having Multiple Oxynitride Layers
App 20160300724 - Levy; Sagy Charel ;   et al.
2016-10-13
Oxide-nitride-oxide stack having multiple oxynitride layers
Grant 9,355,849 - Levy , et al. May 31, 2
2016-05-31
Nitridation oxidation of tunneling layer for improved SONOS speed and retention
Grant 9,349,877 - Levy , et al. May 24, 2
2016-05-24
Oxide-nitride-oxide stack having multiple oxynitride layers
Grant 9,349,824 - Levy , et al. May 24, 2
2016-05-24
SONOS Type Stacks for Nonvolatile ChangeTrap Memory Devices and Methods to Form the Same
App 20160104789 - Puchner; Helmut ;   et al.
2016-04-14
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 9,306,025 - Polishchuk , et al. April 5, 2
2016-04-05
SONOS type stacks for nonvolatile changetrap memory devices and methods to form the same
Grant 9,105,740 - Puchner , et al. August 11, 2
2015-08-11
Memory transistor with multiple charge storing layers and a high work function gate electrode
Grant 9,093,318 - Polishchuk , et al. July 28, 2
2015-07-28
Radical Oxidation Process For Fabricating A Nonvolatile Charge Trap Memory Device
App 20150187960 - Ramkumar; Krishnaswamy ;   et al.
2015-07-02
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20150041880 - Polishchuk; Igor ;   et al.
2015-02-12
Oxide-nitride-oxide Stack Having Multiple Oxynitride Layers
App 20140284696 - Levy; Sagy Charel ;   et al.
2014-09-25
Memory Transistor With Multiple Charge Storing Layers And A High Work Function Gate Electrode
App 20140264551 - Polishchuk; Igor ;   et al.
2014-09-18
Nonvolatile Charge Trap Memory Device Having a Deuterated Layer in a Multi-Layer Charge-Trapping Region
App 20140264550 - Levy; Sagy Charel ;   et al.
2014-09-18
SONOS ONO stack scaling
Grant 8,614,124 - Jenne , et al. December 24, 2
2013-12-24
Stress liner for integrated circuits
Grant 7,384,833 - Polishchuk , et al. June 10, 2
2008-06-10
Stress liner for integrated circuits
App 20070184597 - Polishchuk; Igor ;   et al.
2007-08-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed