LEO Elektronenmikroskopie GmbH.

Patent Applications and Registrations

Patent applications and USPTO patent grants for LEO Elektronenmikroskopie GmbH..The latest application filed is for "corrector for correcting first-order chromatic aberrations of the first degree".

Company Profile

0.10.14

LEO Elektronenmikroskopie GmbH. -
LEO Elektronenmikroskopie GmbH - Oberkochen DE
LEO Elektronenmikroskopie GmbH - DE DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Corrector for correcting first-order chromatic aberrations of the first degree App 20060102848 - Rose; Harald	2006-05-18
Corrector for correcting first-order chromatic aberrations of the first degree Grant 7,012,262 - Rose March 14, 2	2006-03-14
Material processing system and method App 20050103272 - Koops, Hans W.P. ; et al.	2005-05-19
Manipulator for an optical or particle-optical apparatus Grant 6,894,288 - Muller , et al. May 17, 2	2005-05-17
Particle beam system having a mirror corrector Grant 6,855,939 - Rose , et al. February 15, 2	2005-02-15
Corrector for correcting first-order chromatic aberrations of the first degree App 20050023480 - Rose, Harald	2005-02-03
Electron microscopy system, electron microscopy method and focusing system for charged particles App 20050006582 - Steigerwald, Michael ; et al.	2005-01-13
Electron beam source, electron optical apparatus using such beam source and method of operating and electron beam source Grant 6,828,565 - Steigerwald December 7, 2	2004-12-07
Electron microscope with annular illuminating aperture Grant 6,797,956 - Benner September 28, 2	2004-09-28
Apparatus wherein ionizing radiation is generated Grant 6,787,779 - Tobias September 7, 2	2004-09-07
Corrector for correcting first-order chromatic aberrations of the first degree Grant 6,784,437 - Rose August 31, 2	2004-08-31
Electron beam source, electron optical apparatus using such beam source and method of operating an electron beam source App 20040124365 - Steigerwald, Michael	2004-07-01
Particle-optical apparatus and method for operating the same App 20040113092 - Knippelmeyer, Rainer	2004-06-17
Electron microscopy system App 20040108457 - Kienzle, Oliver ; et al.	2004-06-10
Particle-optical apparatus, electron microscopy system and electron lithography system App 20040105160 - Kienzle, Oliver ; et al.	2004-06-03
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system App 20040084621 - Kienzle, Oliver ; et al.	2004-05-06
Objective lens for an electron microscopy system and electron microscopy system App 20040084629 - Preikszas, Dirk ; et al.	2004-05-06
Particle-optical arrangements and particle-optical systems App 20040075053 - Preikszas, Dirk ; et al.	2004-04-22
Electron microscopy system and electron microscopy method App 20040075054 - Knippelmeyer, Rainer	2004-04-22
Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor App 20040065827 - Kienzle, Oliver ; et al.	2004-04-08
Applications operating with beams of charged particles App 20040056193 - Kienzle, Oliver ; et al.	2004-03-25
Particle beam device Grant 6,498,345 - Weimer , et al. December 24, 2	2002-12-24
Particle beam apparatus Grant 6,194,729 - Weimer February 27, 2	2001-02-27
Energy filter, particularly for an electron microscope Grant 6,040,576 - Benner March 21, 2	2000-03-21

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