Lee; See Kei
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lee; See Kei.The latest application filed is for "probe and manufacturing method of probe for scanning probe microscope".
- Lee; See Kei - Kawasaki Kanagawa JP
| Patent | Date |
|---|---|
| Probe and manufacturing method of probe for scanning probe microscope Grant 11,125,775 - Lee , et al. September 21, 2 | 2021-09-21 |
| Probe And Manufacturing Method Of Probe For Scanning Probe Microscope App 20210278437 - LEE; See Kei ; et al. | 2021-09-09 |
| Charged particle beam apparatus Grant 11,069,513 - Koike , et al. July 20, 2 | 2021-07-20 |
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