| Patent | Date |
|---|
Evaluation configuration for semiconductor memories
Grant 6,806,550 - Hoffmann , et al. October 19, 2 | 2004-10-19 |
Semiconductor memory device
Grant 6,768,667 - Hoffmann , et al. July 27, 2 | 2004-07-27 |
Circuit for non-destructive, self-normalizing reading-out of MRAM memory cells
Grant 6,747,891 - Hoffmann , et al. June 8, 2 | 2004-06-08 |
Circuit for non-destructive, self-normalizing reading-out of MRAM memory cells
App 20040017712 - Hoffmann, Kurt ; et al. | 2004-01-29 |
Resistive ferroelectric memory cell
Grant 6,627,935 - Kowarik , et al. September 30, 2 | 2003-09-30 |
Semiconductor memory device
App 20030058710 - Hoffmann, Kurt ; et al. | 2003-03-27 |
Evaluation configuration for semiconductor memories
App 20030052344 - Hoffmann, Kurt ; et al. | 2003-03-20 |
Method for reading nonvolatile semiconductor memory configurations
Grant 6,407,945 - von Schwerin , et al. June 18, 2 | 2002-06-18 |
Method for nondestructively reading memory cells of an MRAM memory
Grant 6,388,917 - Hoffmann , et al. May 14, 2 | 2002-05-14 |
Method For Nondestructively Reading Memory Cells Of An Mram Memory
App 20020018361 - Hoffmann, Kurt ; et al. | 2002-02-14 |
Method for reading nonvolatile semiconductor memory configurations
App 20020018366 - von Schwerin, Andreas Graf ; et al. | 2002-02-14 |
Memory configuration including a plurality of resistive ferroelectric memory cells
App 20020018356 - Hoffmann, Kurt ; et al. | 2002-02-14 |
Configuration for self-referencing ferroelectric memory cells
Grant 6,317,356 - Hoffmann , et al. November 13, 2 | 2001-11-13 |
Circuit configuration for generating a reference voltage for reading a ferroelectric memory
App 20010038557 - Braun, Georg ; et al. | 2001-11-08 |
Resistive ferroelectric memory cell
App 20010038109 - Kowarik, Oskar ; et al. | 2001-11-08 |
Memory configuration including a plurality of resistive ferroelectric memory cells
App 20010033516 - Kowarik, Oskar ; et al. | 2001-10-25 |
Semiconductor circuit configuration
App 20010028090 - Braun, Georg ; et al. | 2001-10-11 |
Integrated buffer circuit which functions independently of fluctuations on the supply voltage
Grant 5,774,014 - Stecker , et al. June 30, 1 | 1998-06-30 |
Integrated semiconductor circuit
Grant 5,276,643 - Hoffmann , et al. January 4, 1 | 1994-01-04 |
Integrated semiconductor memory of the dram type and method for testing the same
Grant 5,184,326 - Hoffmann , et al. February 2, 1 | 1993-02-02 |
Circuit configuration and a method of testing storage cells
Grant 4,956,819 - Hoffmann , et al. September 11, 1 | 1990-09-11 |
Multi-stage integrated decoder device
Grant 4,906,994 - Hoffmann , et al. March 6, 1 | 1990-03-06 |
Method and circuit configuration of the parallel input of data into a semiconductor memory
Grant 4,885,748 - Hoffmann , et al. December 5, 1 | 1989-12-05 |
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