Koike; Mitsuo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Koike; Mitsuo.The latest application filed is for "probe and manufacturing method of probe for scanning probe microscope".
- Koike; Mitsuo - Yokohama Kanagawa JP
- - Yokohama Kanagawa JP
- Koike; Mitsuo - Yokohama JP
- Koike; Mitsuo - Kanagawa-ken JP
- Koike; Mitsuo - Tokyo JA
| Patent | Date |
|---|---|
| Probe and manufacturing method of probe for scanning probe microscope Grant 11,125,775 - Lee , et al. September 21, 2 | 2021-09-21 |
| Probe And Manufacturing Method Of Probe For Scanning Probe Microscope App 20210278437 - LEE; See Kei ; et al. | 2021-09-09 |
| Charged particle beam apparatus Grant 11,069,513 - Koike , et al. July 20, 2 | 2021-07-20 |
| Charged Particle Beam Apparatus App 20210066045A1 - | 2021-03-04 |
| Sample processing method Grant 8,716,681 - Kawaguchiya , et al. May 6, 2 | 2014-05-06 |
| Electron-beam lithography system and method for drawing nanometer-order pattern Grant 5,767,521 - Takeno , et al. June 16, 1 | 1998-06-16 |
| Digital liquid crystal electronic timepiece with color coded display Grant 4,044,546 - Koike August 30, 1 | 1977-08-30 |
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