Klinkhamer; Jacob Fredrik Friso

Patent Applications and Registrations

Patent applications and USPTO patent grants for Klinkhamer; Jacob Fredrik Friso.The latest application filed is for "bandwidth calculation system and method for determining a desired wavelength bandwidth for a measurement beam in a mark detection system".

Company Profile

0.6.10

Klinkhamer; Jacob Fredrik Friso - Tilburg NL
KLINKHAMER; Jacob Fredrik Friso - Veldhoven NL
Klinkhamer; Jacob Fredrik Friso - Delft NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Bandwidth calculation system and method for determining a desired wavelength bandwidth for a measurement beam in a mark detection system Grant 11,360,403 - Wang , et al. June 14, 2	2022-06-14
Bandwidth Calculation System and Method for Determining a Desired Wavelength Bandwidth for a Measurement Beam in a Mark Detection System App 20210208519 - WANG; Jia ; et al.	2021-07-08
Illumination system coherence remover with two sets of stepped mirrors Grant 8,164,740 - Visser , et al. April 24, 2	2012-04-24
Illumination system coherence remover with a series of partially reflective surfaces Grant 8,159,651 - Visser , et al. April 17, 2	2012-04-17
Scanning lithographic apparatus and device manufacturing method Grant 7,609,362 - De Jager , et al. October 27, 2	2009-10-27
Illumination System App 20090168072 - VISSER; Huibert ; et al.	2009-07-02
Illumination System App 20090091734 - VISSER; Huibert ; et al.	2009-04-09
Lithographic apparatus for imaging a front side or a back side of a substrate, method of substrate identification, device manufacturing method, substrate, and computer program Grant 7,480,028 - Van Der Veen , et al. January 20, 2	2009-01-20
Illumination system App 20070247606 - Visser; Huibert ; et al.	2007-10-25
Illumination system App 20070127005 - Visser; Huibert ; et al.	2007-06-07
Lithographic apparatus, device manufacturing method and device manufactured thereby having an increase in depth of focus App 20070013889 - Jorritsma; Laurentius Catrinus ; et al.	2007-01-18
Lithographic apparatus and device manufacturing method App 20060098175 - De Jager; Pieter Willem Herman ; et al.	2006-05-11
Alignment marker and lithographic apparatus and device manufacturing method using the same App 20050275841 - Heerens, Gert-Jan ; et al.	2005-12-15
Lithographic apparatus for imaging a front side or a back side of a substrate, method of substrate identification, device manufacturing method, substrate, and computer program App 20050248740 - Veen, Michael Van Der ; et al.	2005-11-10
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby Grant 6,955,074 - Levasier , et al. October 18, 2	2005-10-18
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby App 20050138988 - Levasier, Leon Martin ; et al.	2005-06-30

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