KLA-Tencor

Patent Applications and Registrations

Patent applications and USPTO patent grants for KLA-Tencor.The latest application filed is for "methods of bandgap analysis and modeling for high k metal gate".

Company Profile

1.23.8

KLA-Tencor - Milpitas US
KLA-Tencor - San Jose CA
KLA Tencor -
KLA-TENCOR - 160 Rio Robles San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods Of Bandgap Analysis And Modeling For High K Metal Gate App 20190242938 - DAI; Min ; et al.	2019-08-08
Wafer Level Spectrometer App 20160011046 - Jensen; Earl M. ; et al.	2016-01-14
Method and apparatus for improving the temperature stability and minimizing the noise of the environment that encloses an interferometric measuring system Grant 8,621,945 - Zeng , et al. January 7, 2	2014-01-07
Method and apparatus for measuring the shape and thickness variation of a wafer by two single-shot phase-shifting interferometers Grant 8,537,369 - Tang September 17, 2	2013-09-17
Method and apparatus for inspecting reticles implementing parallel processing Grant 7,724,939 - Goldberg , et al. May 25, 2	2010-05-25
Chemical mechanical polishing test structures and methods for inspecting the same Grant 7,655,482 - Satya , et al. February 2, 2	2010-02-02
Multiple beam inspection apparatus and method Grant 7,486,393 - Kvamme , et al. February 3, 2	2009-02-03
Test Structures And Methods For Inspection Of Semiconductor Integrated Circuits App 20080246030 - Satya; Akella V.S. ; et al.	2008-10-09
Multiple Directional Scans Of Test Structures On Semiconductor Integrated Circuits App 20080237487 - Pinto; Gustavo A. ; et al.	2008-10-02
Chemical Mechanical Polishing Test Structures And Methods For Inspecting The Same App 20070111342 - Satya; Akella V. S. ; et al.	2007-05-17
Chemical mechanical polishing test structures and methods for inspecting the same Grant 7,179,661 - Satya , et al. February 20, 2	2007-02-20
Method And Apparatus For Inspecting Reticles Implementing Parallel Processing App 20060269119 - GOLDBERG; EDWARD M. ; et al.	2006-11-30
Method and apparatus for inspecting reticles implementing parallel processing Grant 7,106,895 - Goldberg , et al. September 12, 2	2006-09-12
Overlay alignment mark design Grant 7,102,749 - Bareket September 5, 2	2006-09-05
Multiple directional scans of test structures on semiconductor integrated circuits App 20050139767 - Pinto, Gustavo A. ; et al.	2005-06-30
Multi-pixel methods and apparatus for analysis of defect information from test structures on semiconductor devices Grant 6,771,806 - Satya , et al. August 3, 2	2004-08-03
Mechanisms for making and inspecting reticles Grant 6,748,103 - Glasser , et al. June 8, 2	2004-06-08
Apparatus and methods for detecting killer particles during chemical mechanical polishing Grant 6,671,051 - Nikoonahad , et al. December 30, 2	2003-12-30
In-situ probe for optimizing electron beam inspection and metrology based on surface potential Grant 6,664,546 - McCord , et al. December 16, 2	2003-12-16
Dual probe test structures for semiconductor integrated circuits Grant 6,636,064 - Satya , et al. October 21, 2	2003-10-21
Stepper type test structures and methods for inspection of semiconductor integrated circuits Grant 6,633,174 - Satya , et al. October 14, 2	2003-10-14
Apparatus and methods for performing self-clearing optical measurements Grant 6,628,397 - Nikoonahad , et al. September 30, 2	2003-09-30
Apparatus and methods for secondary electron emission microscope with dual beam Grant 6,586,733 - Veneklasen , et al. July 1, 2	2003-07-01
Apparatus and methods for modeling process effects and imaging effects in scanning electron microscopy Grant 6,581,193 - McGhee , et al. June 17, 2	2003-06-17
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,566,885 - Pinto , et al. May 20, 2	2003-05-20
Mechanisms for making and inspecting reticles Grant 6,529,621 - Glasser , et al. March 4, 2	2003-03-04
Test structures and methods for inspection of semiconductor integrated circuits Grant 6,528,818 - Satya , et al. March 4, 2	2003-03-04
Continuous movement scans of test structures on semiconductor integrated circuits Grant 6,524,873 - Satya , et al. February 25, 2	2003-02-25
Apparatus and methods for collecting global data during a reticle inspection Grant 6,516,085 - Wiley , et al. February 4, 2	2003-02-04
In-situ End Point Detection For Semiconductor Wafer Polishing App 20030003605 - Chen, Haiguang ; et al.	2003-01-02
Scanning electron beam microscope Grant 6,066,849 - Masnaghetti , et al. May 23, 2	2000-05-23

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.