Kim; Eui Kyoon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kim; Eui Kyoon.The latest application filed is for "method of making a multi-layer magneto-dielectric material".

Company Profile

0.3.12

Kim; Eui Kyoon - Acton MA
Kim; Eui Kyoon - Woburn MA
Kim; Eui Kyoon - Campbell CA
Kim, Eui-Kyoon - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method Of Making A Multi-layer Magneto-dielectric Material App 20180218836 - Kim; Eui Kyoon ; et al.	2018-08-02
Optical Media Having Transparent Back Side Coating App 20130167166 - Kim; Eui Kyoon	2013-06-27
Optical media having transparent back side coating Grant 8,465,823 - Kim June 18, 2	2013-06-18
Systems For Plasma Enhanced Chemical Vapor Deposition And Bevel Edge Etching App 20120211164 - Shah; Ashish ; et al.	2012-08-23
Systems for plasma enhanced chemical vapor deposition and bevel edge etching Grant 8,197,636 - Shah , et al. June 12, 2	2012-06-12
Low Viscosity Monomer for Patterning Optical Tape App 20110318534 - Kim; Eui Kyoon	2011-12-29
Optical Tape Media Patterning Using Cationic Polymerizable Monomers App 20110318506 - Kim; Eui Kyoon	2011-12-29
Plasma Surface Treatment To Prevent Pattern Collapse In Immersion Lithography App 20110111604 - Kim; Eui Kyoon ; et al.	2011-05-12
Elimination Of Photoresist Material Collapse And Poisoning In 45-nm Feature Size Using Dry Or Immersion Lithography App 20090197086 - Rathi; Sudha ; et al.	2009-08-06
Plasma Surface Treatment To Prevent Pattern Collapse In Immersion Lithography App 20090104541 - Kim; Eui Kyoon ; et al.	2009-04-23
Apparatus And Method For Processing A Substrate Edge Region App 20090017635 - Shah; Ashish ; et al.	2009-01-15
Systems For Plasma Enhanced Chemical Vapor Deposition And Bevel Edge Etching App 20090014127 - Shah; Ashish ; et al.	2009-01-15
Low viscosity high resolution patterning material App 20030235787 - Watts, Michael P.C. ; et al.	2003-12-25

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