Patent applications and USPTO patent grants for Kim; Chang Kil.The latest application filed is for "test pattern of semiconductor device, method of manufacturing test pattern and method of testing semiconductor device by using test pattern".
Patent | Date |
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Test pattern of semiconductor device, method of manufacturing test pattern and method of testing semiconductor device by using test pattern Grant 8,946,706 - Kim February 3, 2 | 2015-02-03 |
Test Pattern Of Semiconductor Device, Method Of Manufacturing Test Pattern And Method Of Testing Semiconductor Device By Using Test Pattern App 20130147509 - KIM; Chang Kil | 2013-06-13 |
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