Kawamata; Shigeru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawamata; Shigeru.The latest application filed is for "imaging device".

Company Profile

6.20.18

Kawamata; Shigeru - Tokyo JP
Kawamata; Shigeru - Minato-ku JP
Kawamata; Shigeru - Hitachinaka JP
KAWAMATA; Shigeru - Hitachiinaka JP
Kawamata; Shigeru - Ooarai-machi JP
Kawamata; Shigeru - Ibaraki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device and method for setting condition in charged particle beam device Grant 11,404,242 - Numata , et al. August 2, 2	2022-08-02
Imaging device Grant 11,385,193 - Chiba , et al. July 12, 2	2022-07-12
Imaging device and morphological feature data display method Grant 11,321,585 - Maeda , et al. May 3, 2	2022-05-03
Imaging device Grant 11,239,050 - Maehara , et al. February 1, 2	2022-02-01
Imaging Device App 20210247335 - CHIBA; Hiroyuki ; et al.	2021-08-12
Imaging Device App 20210193432 - MAEHARA; Miku ; et al.	2021-06-24
Charged particle beam device and image processing method in charged particle beam device Grant 10,763,078 - Kamio , et al. Sep	2020-09-01
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program Grant 10,763,074 - Chiba , et al. Sep	2020-09-01
Charged Particle Beam Device and Method for Setting Condition in Charged Particle Beam Device App 20200126754 - NUMATA; Yuki ; et al.	2020-04-23
Imaging Device and Morphological Feature Data Display Method App 20200125894 - MAEDA; Yaku ; et al.	2020-04-23
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20200066484 - KAMIO; Masato ; et al.	2020-02-27
Charged Particle Beam Apparatus and Cell Evaluation Method App 20200056141 - IKEUCHI; Akira ; et al.	2020-02-20
Charged Particle Beam Apparatus, Observation Method Using Charged Particle Beam Apparatus, And Program App 20200013583 - CHIBA; Hiroyuki ; et al.	2020-01-09
Charged particle beam device and image processing method in charged particle beam device Grant 10,522,325 - Kamio , et al. Dec	2019-12-31
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program Grant 10,453,650 - Chiba , et al. Oc	2019-10-22
Charged Particle Beam Apparatus, Observation Method Using Charged Particle Beam Apparatus, And Program App 20180323035 - CHIBA; Hiroyuki ; et al.	2018-11-08
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20180301316 - KAMIO; Masato ; et al.	2018-10-18
Charged particle beam device and image display method for stereoscopic observation and stereoscopic display Grant 9,202,669 - Hirato , et al. December 1, 2	2015-12-01
Charged particle beam apparatus Grant 9,099,283 - Hoshino , et al. August 4, 2	2015-08-04
Charged particle beam device and inclined observation image display method Grant 9,012,842 - Kotake , et al. April 21, 2	2015-04-21
Electron microscope Grant 8,947,520 - Hoshino , et al. February 3, 2	2015-02-03
Charged Particle Beam Device And Inclined Observation Image Display Method App 20150001393 - Kotake; Wataru ; et al.	2015-01-01
Charged particle beam device and method for correcting detected signal thereof Grant 8,848,049 - Kamio , et al. September 30, 2	2014-09-30
Charged Particle Beam Device And Image Display Method App 20140001355 - HIRATO; Tatsuya ; et al.	2014-01-02
Charged Particle Beam Device And Method For Correcting Detected Signal Thereof App 20130278745 - Kamio; Masato ; et al.	2013-10-24
Charged Particle Beam Apparatus App 20120307038 - Hoshino; Yoshinobu ; et al.	2012-12-06
Charged Particle Beam Device And Image Display Method App 20120132803 - Hirato; Tatsuya ; et al.	2012-05-31
Charged particle beam apparatus Grant 8,143,573 - Ito , et al. March 27, 2	2012-03-27
Electron Microscope App 20120019648 - Hoshino; Yoshinobu ; et al.	2012-01-26
Scanning electron microscope and three-dimensional shape measuring device that used it Grant 7,705,304 - Kawamata , et al. April 27, 2	2010-04-27
Charged Particle Beam Apparatus App 20090322973 - ITO; Sukehiro ; et al.	2009-12-31
Scanning Electron Microscope and Three-Dimensional Shape Measuring Device That Used It App 20080283747 - Kawamata; Shigeru ; et al.	2008-11-20
Scanning electron microscope and image forming method therewith Grant 5,523,567 - Kawamata , et al. June 4, 1	1996-06-04
Image processing device for an electron microscope Grant 5,142,147 - Kawamata , et al. August 25, 1	1992-08-25

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