Kaji; Kazutoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kaji; Kazutoshi.The latest application filed is for "transmission scanning microscopy including electron energy loss spectroscopy and observation method thereof".

Company Profile

0.19.21

Kaji; Kazutoshi - Tokyo JP
Kaji; Kazutoshi - Hitachi JP
Kaji, Kazutoshi - Hitachi-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Transmission scanning microscopy including electron energy loss spectroscopy and observation method thereof Grant 10,373,802 - Yamazawa , et al.	2019-08-06
Transmission Scanning Microscopy Including Electron Energy Loss Spectroscopy And Observation Method Thereof App 20180308659 - YAMAZAWA; Yu ; et al.	2018-10-25
Electron microscope Grant 8,901,493 - Kaji December 2, 2	2014-12-02
Electron microscope with electron spectrometer Grant 8,344,320 - Terada , et al. January 1, 2	2013-01-01
Electron Microscope App 20120241611 - Kaji; Kazutoshi	2012-09-27
Method and apparatus for observing inside structures, and specimen holder Grant 8,134,131 - Terada , et al. March 13, 2	2012-03-13
Electron Microscope With Electron Spectrometer App 20110095182 - Terada; Shohei ; et al.	2011-04-28
Element mapping unit, scanning transmission electron microscope, and element mapping method Grant 7,928,376 - Kaji , et al. April 19, 2	2011-04-19
Electron microscope with electron spectrometer Grant 7,888,641 - Terada , et al. February 15, 2	2011-02-15
Electronic microscope apparatus Grant 7,872,232 - Kaji January 18, 2	2011-01-18
Method and Apparatus for Observing Inside Structures, and Specimen Holder App 20090302234 - Terada; Shohei ; et al.	2009-12-10
Method and apparatus for evaluating thin films Grant 7,544,935 - Terada , et al. June 9, 2	2009-06-09
Electron Microscope With Electron Spectrometer App 20090045340 - TERADA; Shohei ; et al.	2009-02-19
Method and apparatus for observing inside structures, and specimen holder Grant 7,476,872 - Terada , et al. January 13, 2	2009-01-13
Method and apparatus for observing inside structures, and specimen holder Grant 7,462,830 - Terada , et al. December 9, 2	2008-12-09
Method And Apparatus For Observing Inside Structures, And Specimen Holder App 20070252091 - Terada; Shohei ; et al.	2007-11-01
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method Grant 7,250,601 - Kaji , et al. July 31, 2	2007-07-31
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20060163479 - Kaji; Kazutoshi ; et al.	2006-07-27
Method and apparatus for evaluating thin films App 20060145075 - Terada; Shohei ; et al.	2006-07-06
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same Grant 7,053,372 - Park , et al. May 30, 2	2006-05-30
Element mapping unit, scanning transmission electron microscope, and element mapping method App 20060011836 - Kaji; Kazutoshi ; et al.	2006-01-19
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same App 20050184233 - Park, Gyeong-su ; et al.	2005-08-25
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method Grant 6,933,501 - Kaji , et al. August 23, 2	2005-08-23
Electron microscope Grant 6,933,500 - Kaji , et al. August 23, 2	2005-08-23
Electron microscope Grant 6,930,306 - Kaji , et al. August 16, 2	2005-08-16
Electron microscope App 20050167589 - Kaji, Kazutoshi ; et al.	2005-08-04
Electron microscope App 20050127295 - Kaji, Kazutoshi ; et al.	2005-06-16
Method and apparatus for observing inside structures, and specimen holder App 20050061971 - Terada, Shohei ; et al.	2005-03-24
Method and apparatus for observing element distribution Grant 6,855,927 - Taniguchi , et al. February 15, 2	2005-02-15
Electron microscope App 20040188613 - Kaji, Kazutoshi ; et al.	2004-09-30
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20040183011 - Kaji, Kazutoshi ; et al.	2004-09-23
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method Grant 6,794,648 - Kaji , et al. September 21, 2	2004-09-21
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20040169143 - Kaji, Kazutoshi ; et al.	2004-09-02
Electron microscope App 20040094712 - Kaji, Kazutoshi ; et al.	2004-05-20
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method Grant 6,703,613 - Kaji , et al. March 9, 2	2004-03-09
Method and apparatus for observing element distribution App 20040000641 - Taniguchi, Yoshifumi ; et al.	2004-01-01
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20030085350 - Kaji, Kazutoshi ; et al.	2003-05-08
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method App 20030085356 - Kaji, Kazutoshi ; et al.	2003-05-08
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method App 20020096632 - Kaji, Kazutoshi ; et al.	2002-07-25

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