JPK INSTRUMENTS AG

Patent Applications and Registrations

Patent applications and USPTO patent grants for JPK INSTRUMENTS AG.The latest application filed is for "apparatus and a method for investigating a sample by means of several investigation methods".

Company Profile

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JPK INSTRUMENTS AG - DE DE
JPK Instruments AG - Berlin DE
JPK INSTRUMENTS AG - 12435 BERLIN DE
JPK Instruments AG -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks

Patent Activity

Patent	Date
Apparatus and a method for investigating a sample by means of several investigation methods Grant 9,080,937 - Behme , et al. July 14, 2	2015-07-14
Apparatus and method for examining a specimen by means of probe microscopy Grant 9,063,335 - Sommer , et al. June 23, 2	2015-06-23
Method and apparatus for determining the cell activation of a target cell by an activator Grant 9,018,018 - Amrein , et al. April 28, 2	2015-04-28
Method and apparatus for the combined analysis of a sample with objects to be analyzed Grant 8,898,809 - Muller , et al. November 25, 2	2014-11-25
Method for examining a measurement object, and apparatus Grant 8,769,711 - Jahnke July 1, 2	2014-07-01
Apparatus And A Method For Investigating A Sample By Means Of Several Investigation Methods App 20140016119 - BEHME; GERD ; et al.	2014-01-16
Device for receiving a test sample Grant 8,506,909 - Sunwoldt , et al. August 13, 2	2013-08-13
Measuring probe device for a probe microscope, measuring cell and scanning probe microscope Grant 8,505,109 - Jahnke , et al. August 6, 2	2013-08-06
Method and apparatus for characterizing a sample with two or more optical traps Grant 8,415,613 - Heyn , et al. April 9, 2	2013-04-09
Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system Grant 8,381,311 - Jahnke February 19, 2	2013-02-19
Method for the operation of a measurement system with a scanning probe microscope and a measurement system Grant 8,368,017 - Jahnke , et al. February 5, 2	2013-02-05
Method and Device for Examining a Sample with a Probe Microscope App 20110302676 - Kerssemakers; Jacob ; et al.	2011-12-08
Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope Grant 7,971,266 - Jahnke , et al. June 28, 2	2011-06-28
Method and a device for the positioning of a displaceable component in an examining system Grant 7,934,323 - Knebel , et al. May 3, 2	2011-05-03
Method and Apparatus for Characterizing a Sample with Two or More Optical Traps App 20100251437 - Heyn; Sven-Peter ; et al.	2010-09-30
Apparatus And Method For Examining A Specimen By Means Of Probe Microscopy App 20100229262 - Sommer; Gunnar ; et al.	2010-09-09
Method For Examining A Test Sample Using A Scanning Probe Micrscope, Measurement System And A Measuring Probe System App 20100218284 - Jahnke; Torsten	2010-08-26
Method and Device for Positioning a Movable Part in a Test System App 20090140685 - Knebel; Detlef ; et al.	2009-06-04
Apparatus and method for a scanning probe microscope Grant 7,473,894 - Knebel , et al. January 6, 2	2009-01-06
Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology Grant 7,442,922 - Knebel , et al. October 28, 2	2008-10-28
Method and apparatus to study a surfactant Grant 7,155,962 - Knebel , et al. January 2, 2	2007-01-02
Probe mounting device for a scanning probe microscope Grant 7,114,405 - Sunwoldt , et al. October 3, 2	2006-10-03
Apparatus and method for a scanning probe microscope Grant 7,022,985 - Knebel , et al. April 4, 2	2006-04-04
Method of and an apparatus for measuring a specimen by means of a scanning probe microscope Grant 6,998,602 - Kamps February 14, 2	2006-02-14

Company Registrations

NCAGE Code	CC812	JPK INSTRUMENTS AG
CAGE Code	CC812	JPK INSTRUMENTS AG

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