Patent | Date |
---|
Display Device App 20220312654 - ZHANG; Shuang ;   et al. | 2022-09-29 |
Touch display device and preparation method thereof, and terminal equipment Grant 11,442,564 - Ji , et al. September 13, 2 | 2022-09-13 |
Flexible Circuit Board Assembly, Display Assembly And Display Device App 20220287183 - CHEN; Qizhong ;   et al. | 2022-09-08 |
Heat Dissipation Module, Display Assembly And Display Device App 20220201905 - CHEN; Qizhong ;   et al. | 2022-06-23 |
Systems And Methods For Optimizing Power Delivery To An Electrode Of A Plasma Chamber App 20220199366 - Bhowmick; Ranadeep ;   et al. | 2022-06-23 |
Display Assembly And Display Device App 20220192065 - CHEN; Qizhong ;   et al. | 2022-06-16 |
Display Panel And Display Device App 20220190089 - HUANG; Xiaoxia ;   et al. | 2022-06-16 |
Systems and methods for optimizing power delivery to an electrode of a plasma chamber Grant 11,335,539 - Bhowmick , et al. May 17, 2 | 2022-05-17 |
High Speed Synchronization Of Plasma Source/Bias Power Delivery App 20220005674 - RADOMSKI; Aaron T. ;   et al. | 2022-01-06 |
High speed synchronization of plasma source/bias power delivery Grant 11,158,488 - Radomski , et al. October 26, 2 | 2021-10-26 |
Systems And Methods For Optimizing Power Delivery To An Electrode Of A Plasma Chamber App 20210319980 - Bhowmick; Ranadeep ;   et al. | 2021-10-14 |
Display module and display device Grant 11,116,087 - Huang , et al. September 7, 2 | 2021-09-07 |
Substrate, Display Panel And Display Device App 20210210568 - HUANG; Xiaoxia ;   et al. | 2021-07-08 |
Display Module And Display Device App 20210195764 - HUANG; Xiaoxia ;   et al. | 2021-06-24 |
Active control of radial etch uniformity Grant 10,916,409 - Marakhtanov , et al. February 9, 2 | 2021-02-09 |
Touch Display Device And Preparation Method Thereof, And Terminal Equipment App 20210019001 - JI; Bing ;   et al. | 2021-01-21 |
High Speed Synchronization Of Plasma Source/Bias Power Delivery App 20200411289 - RADOMSKI; Aaron T. ;   et al. | 2020-12-31 |
Optical Film, Display Screen Assembly And Display Device App 20200212369 - Ji; Bing ;   et al. | 2020-07-02 |
Active Control Of Radial Etch Uniformity App 20190385822 - Marakhtanov; Alexei ;   et al. | 2019-12-19 |
Device and method for providing media resource Grant 10,339,146 - Zheng , et al. | 2019-07-02 |
Electronic Device And Electronic Device Operation Method App 20180262811 - MA; Cong ;   et al. | 2018-09-13 |
Device And Method For Providing Media Resource App 20160147768 - ZHENG; Xuan ;   et al. | 2016-05-26 |
Speculative Bit Error Rate Calculator App 20150106666 - Hubris; Alexander ;   et al. | 2015-04-16 |
Reducing twisting in ultra-high aspect ratio dielectric etch Grant 8,741,165 - Ji , et al. June 3, 2 | 2014-06-03 |
Strip with reduced low-K dielectric damage Grant 8,691,701 - Ji , et al. April 8, 2 | 2014-04-08 |
Display Apparatus And Control Method Thereof App 20140086557 - YU; Guitao ;   et al. | 2014-03-27 |
Electronic Apparatus And Control Method Of The Same App 20140016910 - YU; Guitao ;   et al. | 2014-01-16 |
Method for low-K dielectric etch with reduced damage Grant 8,236,188 - Ji , et al. August 7, 2 | 2012-08-07 |
Image device to reverse play with minimal time delay and a method thereof Grant 8,189,115 - Lim , et al. May 29, 2 | 2012-05-29 |
Method for plasma etching performance enhancement Grant 7,977,390 - Ji , et al. July 12, 2 | 2011-07-12 |
Reducing Twisting In Ultra-high Aspect Ratio Dielectric Etch App 20110021030 - Ji; Bing ;   et al. | 2011-01-27 |
Strip With Reduced Low-k Dielectric Damage App 20100285671 - Ji; Bing ;   et al. | 2010-11-11 |
Method For Low-k Dielectric Etch With Reduced Damage App 20100261352 - Ji; Bing ;   et al. | 2010-10-14 |
Method for removing carbon-containing residues from a substrate Grant 7,581,549 - Johnson , et al. September 1, 2 | 2009-09-01 |
Reducing Twisting In Ultra-high Aspect Ratio Dielectric Etch App 20080119055 - Ji; Bing ;   et al. | 2008-05-22 |
Removal of transition metal ternary and/or quaternary barrier materials from a substrate Grant 7,371,688 - Ji , et al. May 13, 2 | 2008-05-13 |
Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials Grant 7,357,138 - Ji , et al. April 15, 2 | 2008-04-15 |
Image Device To Reverse Play With Minimal Time Delay And A Method Thereof App 20080055484 - LIM; Jeong-eun ;   et al. | 2008-03-06 |
Detecting the endpoint of a cleaning process App 20080047579 - Ji; Bing ;   et al. | 2008-02-28 |
Xenon recovery system Grant 7,285,154 - Karwacki, Jr. , et al. October 23, 2 | 2007-10-23 |
Use Of Hypofluorites, Fluoroperoxides, And/Or Fluorotrioxides As Oxidizing Agent In Fluorocarbon Etch Plasmas App 20070224829 - Ji; Bing ;   et al. | 2007-09-27 |
Method for removing titanium dioxide deposits from a reactor Grant 7,267,842 - Wu , et al. September 11, 2 | 2007-09-11 |
Method for plasma etching performance enhancement App 20070026677 - Ji; Bing ;   et al. | 2007-02-01 |
Free radical initiator in remote plasma chamber clean App 20070006893 - Ji; Bing | 2007-01-11 |
Method and process for reactive gas cleaning of tool parts App 20060254613 - Wu; Dingjun ;   et al. | 2006-11-16 |
Method to protect internal components of semiconductor processing equipment using layered superlattice materials Grant 7,119,032 - Ji , et al. October 10, 2 | 2006-10-10 |
Method for cleaning deposition chambers for high dielectric constant materials Grant 7,055,263 - Wu , et al. June 6, 2 | 2006-06-06 |
Xenon recovery system App 20060107831 - Karwacki; Eugene Joseph JR. ;   et al. | 2006-05-25 |
Method to protect internal components of semiconductor processing equipment using layered superlattice materials App 20060040508 - Ji; Bing ;   et al. | 2006-02-23 |
Passivating ALD reactor chamber internal surfaces to prevent residue buildup App 20060040054 - Pearlstein; Ronald Martin ;   et al. | 2006-02-23 |
Method for removing carbon-containing residues from a substrate App 20060027249 - Johnson; Andrew David ;   et al. | 2006-02-09 |
Process for titanium nitride removal App 20060016783 - Wu; Dingjun ;   et al. | 2006-01-26 |
Method for enhancing fluorine utilization App 20060017043 - Wu; Dingjun ;   et al. | 2006-01-26 |
Low temperature CVD chamber cleaning using dilute NF3 App 20050252529 - Ridgeway, Robert Gordon ;   et al. | 2005-11-17 |
Method for cleaning a reactor using electron attachment App 20050241670 - Dong, Chun Christine ;   et al. | 2005-11-03 |
Method for removing a substance from a substrate using electron attachment App 20050241671 - Dong, Chun Christine ;   et al. | 2005-11-03 |
Method for removing titanium dioxide deposits from a reactor App 20050202167 - Wu, Dingjun ;   et al. | 2005-09-15 |
Removal of transition metal ternary and/or quaternary barrier materials from a substrate App 20050112901 - Ji, Bing ;   et al. | 2005-05-26 |
Method for cleaning deposition chambers for high dielectric constant materials App 20050108892 - Wu, Dingjun ;   et al. | 2005-05-26 |
Use of hypofluorites, fluoroperoxides, and/or fluorotrioxides as oxidizing agent in fluorocarbon etch plasmas App 20050014383 - Ji, Bing ;   et al. | 2005-01-20 |
Unsaturated oxygenated fluorocarbons for selective aniostropic etch applications App 20050011859 - Ji, Bing ;   et al. | 2005-01-20 |
Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials App 20040129671 - Ji, Bing ;   et al. | 2004-07-08 |
Cleaning of processing chambers with dilute NF3 plasmas App 20040045577 - Ji, Bing ;   et al. | 2004-03-11 |
On-line UV-Visible light halogen gas analyzer for semiconductor processing effluent monitoring Grant 6,686,594 - Ji , et al. February 3, 2 | 2004-02-03 |
Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials App 20040011380 - Ji, Bing ;   et al. | 2004-01-22 |
Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials App 20040014327 - Ji, Bing ;   et al. | 2004-01-22 |
On-line UV-Visible light halogen gas analyzer for semiconductor processing effluent monitoring App 20030098419 - Ji, Bing ;   et al. | 2003-05-29 |