| Patent | Date |
|---|
Spectrum Analysis Apparatus and Database Creation Method
App 20220307996 - Koshiya; Shogo ; et al. | 2022-09-29 |
Image acquisition method and electron microscope
Grant 11,456,151 - Kohno September 27, 2 | 2022-09-27 |
NMR Probe
App 20220299585 - Nishiyama; Masahide ; et al. | 2022-09-22 |
X-Ray Spectrum Analysis Apparatus and Method
App 20220299457 - Murano; Takanori ; et al. | 2022-09-22 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
App 20220297193 - Kawakami; Masahiko ; et al. | 2022-09-22 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
App 20220288696 - Hisaki; Taku ; et al. | 2022-09-15 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
App 20220288691 - Hisaki; Taku ; et al. | 2022-09-15 |
X-Ray Detector and Method of Manufacturing Window Portion
App 20220291146 - Nakano; Hirofumi | 2022-09-15 |
Solid Phase Mixture, Packing Material, and Column
App 20220288558 - Fukuzawa; Seketsu ; et al. | 2022-09-15 |
Sample Milling Apparatus and Method of Adjustment Therefor
App 20220285125 - Kozuka; Munehiro | 2022-09-08 |
Specimen Machining Device and Specimen Machining Method
App 20220277925 - Kataoka; Shogo ; et al. | 2022-09-01 |
X-ray analysis system and X-ray analysis method
Grant 11,428,653 - Takahashi August 30, 2 | 2022-08-30 |
Estimation Model Generation Method and Electron Microscope
App 20220262595 - Sagawa; Ryusuke ; et al. | 2022-08-18 |
Method of Measuring Relative Rotational Angle and Scanning Transmission Electron Microscope
App 20220262597 - Nakamura; Akiho | 2022-08-18 |
Magnetic field generator and nuclear magnetic resonance apparatus
Grant 11,415,647 - Yanagi , et al. August 16, 2 | 2022-08-16 |
Analyzer and Image Processing Method
App 20220244202 - Tsukamoto; Kazunori ; et al. | 2022-08-04 |
Control method for electron microscope and electron microscope
Grant 11,404,238 - Koizumi August 2, 2 | 2022-08-02 |
Input lens and electron spectrometer
Grant 11,404,260 - Uchida August 2, 2 | 2022-08-02 |
Sample plate holder
Grant 11,404,239 - Abe , et al. August 2, 2 | 2022-08-02 |
Ion Beam Processing Apparatus and Method for Controlling Operation Thereof
App 20220238310 - Kimura; Tatsuhito ; et al. | 2022-07-28 |
Mass spectrometry system and emitter current control method
Grant 11,397,168 - Ubukata July 26, 2 | 2022-07-26 |
Electron gun, electron microscope, three-dimensional additive manufacturing apparatus, and method of adjusting current of electron gun
Grant 11,398,364 - Kitamura , et al. July 26, 2 | 2022-07-26 |
Method of Measuring Aberration and Electron Microscope
App 20220230838 - Morishita; Shigeyuki ; et al. | 2022-07-21 |
Radiation transmissive window and radition detector
Grant 11,393,606 - Nakano July 19, 2 | 2022-07-19 |
Auger electron microscope and analysis method
Grant 11,391,682 - Tsutsumi , et al. July 19, 2 | 2022-07-19 |
Charged Particle Beam System
App 20220223371 - Yuasa; Shuichi | 2022-07-14 |
Sample Holder and Charged Particle Beam System
App 20220223370 - Yuasa; Shuichi | 2022-07-14 |
Sample Holder and Charged Particle Beam System
App 20220223368 - Yuasa; Shuichi ; et al. | 2022-07-14 |
Transport Device and Charged Particle Beam System
App 20220223369 - Yuasa; Shuichi | 2022-07-14 |
Mass spectrometry device
Grant 11,387,090 - Miwa , et al. July 12, 2 | 2022-07-12 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
App 20220212264 - Shimizu; Takayuki | 2022-07-07 |
Charged Particle Beam Apparatus
App 20220216033 - Yagi; Kazuki ; et al. | 2022-07-07 |
Sample Loading Method and Charged Particle Beam Apparatus
App 20220216030 - Naganuma; Tomoyuki ; et al. | 2022-07-07 |
Specimen Pretreatment Method
App 20220214250 - Konyuba; Yuji ; et al. | 2022-07-07 |
Compound, Derivatization Reagent, and Method for Synthesizing Compound
App 20220204459 - Higashi; Tatsuya ; et al. | 2022-06-30 |
Automatic analyzer and automatic analysis method
Grant 11,366,129 - Asakura , et al. June 21, 2 | 2022-06-21 |
Charged Particle Beam Apparatus
App 20220189731 - Fujimoto; Naoki ; et al. | 2022-06-16 |
Analysis device and spectrum generation method
Grant 11,353,414 - Murano June 7, 2 | 2022-06-07 |
X-Ray Detection Apparatus and Method
App 20220172923 - Murano; Takanori | 2022-06-02 |
Transmission Electron Microscope and Method of Adjusting Optical System
App 20220172924 - Yagi; Kazuki ; et al. | 2022-06-02 |
Charged particle beam system
Grant 11,342,158 - Chiyo , et al. May 24, 2 | 2022-05-24 |
Method for producing triazolidinedione compound
Grant 11,339,133 - Satou , et al. May 24, 2 | 2022-05-24 |
Charged Particle Beam Device and Analysis Method
App 20220157558 - Tsutsumi; Kenichi ; et al. | 2022-05-19 |
X-Ray Measurement Apparatus and X-Ray Measurement Method
App 20220146442 - Murano; Takanori ; et al. | 2022-05-12 |
Charged particle beam apparatus
Grant 11,322,331 - Murakami , et al. May 3, 2 | 2022-05-03 |
Apparatus and Method for Processing Mass Spectrum
App 20220130653 - Kubo; Ayumi | 2022-04-28 |
Mass spectrometer
Grant 11,315,781 - Fujii , et al. April 26, 2 | 2022-04-26 |
Charged particle beam device and analysis method
Grant 11,315,753 - Tsutsumi , et al. April 26, 2 | 2022-04-26 |
Mass Spectrum Processing Apparatus and Method
App 20220122825 - Satoh; Takaya | 2022-04-21 |
Coordinate Linking System and Coordinate Linking Method
App 20220122277 - Oohori; Yuichiro ; et al. | 2022-04-21 |
Charged particle beam apparatus and adjustment method for charged particle beam apparatus
Grant 11,309,161 - Yamazaki April 19, 2 | 2022-04-19 |
Mass Spectrum Processing Apparatus and Method
App 20220115219 - Tanaka; Hirokazu | 2022-04-14 |
Electron gun and electron beam device
Grant 11,302,509 - Ikeda , et al. April 12, 2 | 2022-04-12 |
Charged Particle Beam Device
App 20220084783 - Yagi; Kazuki ; et al. | 2022-03-17 |
Apparatus and Method for Processing Mass Spectrum
App 20220082537 - Kubo; Ayumi ; et al. | 2022-03-17 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
App 20220080506 - Kitamura; Shinichi ; et al. | 2022-03-17 |
Vacuum apparatus and recovery support method
Grant 11,260,427 - Tsukamoto March 1, 2 | 2022-03-01 |
Charged Particle Beam Drawing Device and Method of Controlling Charged Particle Beam Drawing Device
App 20220051869 - Iwanaga; Masakazu | 2022-02-17 |
Ion Milling Apparatus and Sample Holder
App 20220051870 - Kataoka; Shogo ; et al. | 2022-02-17 |
Deflector and charged particle beam system
Grant 11,251,013 - Kohno February 15, 2 | 2022-02-15 |
Automatic Analyzer, Cool Box, and Pouch
App 20220042888 - Yaginuma; Takashi ; et al. | 2022-02-10 |
Charged Particle Beam Device and Method for Controlling Sample Stage
App 20220037110 - Maekawa; Daichi ; et al. | 2022-02-03 |
Charged Particle Beam Apparatus and Setting Assisting Method
App 20220028649 - Watakabe; Kazutaka | 2022-01-27 |
Charged Particle Beam Apparatus and Setting Assisting Method
App 20220028654 - Watakabe; Kazutaka | 2022-01-27 |
Sample Analysis Apparatus and Method
App 20220026378 - Yokoyama; Takaomi ; et al. | 2022-01-27 |
Sample Analysis Apparatus and Method
App 20220026377 - Yamamoto; Yasuaki ; et al. | 2022-01-27 |
Charged Particle Beam Apparatus and Setting Assisting Method
App 20220028651 - Watakabe; Kazutaka ; et al. | 2022-01-27 |
Charged Particle Beam Apparatus and Setting Assisting Method
App 20220028653 - Watakabe; Kazutaka ; et al. | 2022-01-27 |
Specimen preparation apparatus
Grant 11,231,346 - Akai , et al. January 25, 2 | 2022-01-25 |
Method and Apparatus for Image Processing
App 20220018923 - Kohno; Yuji | 2022-01-20 |
Transmission Electron Microscope and Adjustment Method of Objective Aperture
App 20220020560 - Sakurai; Hitoshi | 2022-01-20 |
Ion Milling Apparatus and Method of Manufacturing Sample
App 20220020558 - Kataoka; Shogo ; et al. | 2022-01-20 |
Image Acquisition Method and Electron Microscope
App 20220020561 - Kohno; Yuji | 2022-01-20 |
Specimen Support Tool, Support Apparatus and Specimen Preparation Method
App 20220018742 - Konyuba; Yuji ; et al. | 2022-01-20 |
Charged particle beam device and control method of optical system of charged particle beam device
Grant 11,222,764 - Yamazaki , et al. January 11, 2 | 2022-01-11 |
Charged particle beam apparatus and machine learning method
Grant 11,222,241 - Uematsu January 11, 2 | 2022-01-11 |
Charged particle beam system and method of measuring sample using scanning electron microscope
Grant 11,217,422 - Nemoto , et al. January 4, 2 | 2022-01-04 |
Beam Adjustment Method and Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
App 20210407760 - En; Shio ; et al. | 2021-12-30 |
Mass spectrum processing apparatus and model generation method
Grant 11,211,150 - Uematsu , et al. December 28, 2 | 2021-12-28 |
Sample exchange device and charged particle beam device
Grant 11,205,558 - Fujimoto , et al. December 21, 2 | 2021-12-21 |
Method for producing semicarbazide compound
Grant 11,192,854 - Satou , et al. December 7, 2 | 2021-12-07 |
Reagent kit and method for derivatizing and quantifying vitamin D using a mass spectrometer
Grant 11,193,948 - Higashi , et al. December 7, 2 | 2021-12-07 |
Apparatus and method for automated analysis
Grant 11,175,302 - Asakura , et al. November 16, 2 | 2021-11-16 |
Scanning Transmission Electron Microscope and Adjustment Method of Optical System
App 20210335570 - Sagawa; Ryusuke | 2021-10-28 |
NMR measurement apparatus and method of controlling rotation of sample tube
Grant 11,156,681 - Endo , et al. October 26, 2 | 2021-10-26 |
Automatic Analyzer and Control Method for Automatic Analyzer
App 20210318347 - Nakajima; Takeichirou | 2021-10-14 |
Automatic Analysis Apparatus and Method of Controlling Automatic Analysis Apparatus
App 20210318345 - Kaneda; Tamami ; et al. | 2021-10-14 |
Automatic analyzer and computer-readable recording medium that stores program
Grant 11,143,667 - Asakura October 12, 2 | 2021-10-12 |
Charged Particle Beam System
App 20210313142 - Chiyo; Izuru ; et al. | 2021-10-07 |
Dispensing unit and automated analyzer
Grant 11,137,412 - Nakamura October 5, 2 | 2021-10-05 |
Analytical Method and Apparatus
App 20210302339 - Murano; Takanori | 2021-09-30 |
Radiation Transmissive Window and Radition Detector
App 20210304915 - Nakano; Hirofumi | 2021-09-30 |
Analysis Method and X-Ray Fluorescence Analyzer
App 20210302336 - Kinugasa; Genki | 2021-09-30 |
Calibration method and analysis device
Grant 11,131,638 - Murano September 28, 2 | 2021-09-28 |
Transmission electron microscope and method of controlling same
Grant 11,133,151 - Iijima September 28, 2 | 2021-09-28 |
Cooling apparatus for charged particle beam device
Grant 11,127,561 - Shimizu September 21, 2 | 2021-09-21 |
NMR Measurement System and Sample Tube Centering Method
App 20210278487 - Endo; Yuki ; et al. | 2021-09-09 |
Method For Producing Triazolidinedione Compound
App 20210253541 - SATOU; Makoto ; et al. | 2021-08-19 |
Triazolinedione Adduct, Method For Producing Triazolinedione Adduct, Method For Producing Ene Compound, And Method For Analyzing Ene Compound
App 20210253587 - SEKI; Masahiko ; et al. | 2021-08-19 |
Auger Electron Microscope and Analysis Method
App 20210255124 - Tsutsumi; Kenichi ; et al. | 2021-08-19 |
Monochromator and charged particle beam system
Grant 11,094,498 - Mukai August 17, 2 | 2021-08-17 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
App 20210245254 - Kitamura; Shinichi ; et al. | 2021-08-12 |
Scanning transmission electron microscope and aberration correction method
Grant 11,087,951 - Morishita , et al. August 10, 2 | 2021-08-10 |
Automated analyzer
Grant 11,085,941 - Asakura August 10, 2 | 2021-08-10 |
Charged Particle Beam Apparatus and Adjustment Method for Charged Particle Beam Apparatus
App 20210233739 - Yamazaki; Kazuya | 2021-07-29 |
Mass Spectrometry Device
App 20210225630 - Miwa; Yoshihiko ; et al. | 2021-07-22 |
NMR measurement method and apparatus
Grant 11,067,518 - Nishiyama July 20, 2 | 2021-07-20 |
Chromatograph-mass spectrometry system and measurement condition display method
Grant 11,061,006 - Ota July 13, 2 | 2021-07-13 |
NMR probe system and method of using NMR probe system
Grant 11,061,088 - Fujiwara , et al. July 13, 2 | 2021-07-13 |
Method of generating elemental map and surface analyzer
Grant 11,062,434 - Uchida July 13, 2 | 2021-07-13 |
Height Measuring Device, Charged Particle Beam Apparatus, and Height Measuring Method
App 20210207945 - Aida; Yukinori | 2021-07-08 |
Vacuum cooling apparatus and ion milling apparatus
Grant 11,043,355 - Negishi June 22, 2 | 2021-06-22 |
Energy filter and charged particle beam apparatus
Grant 11,043,353 - Omoto June 22, 2 | 2021-06-22 |
Nuclear Magnetic Resonance Measurement Apparatus and Method
App 20210181130 - Nishiyama; Yusuke | 2021-06-17 |
Observation method, specimen support, and transmission electron microscope
Grant 11,037,755 - Konyuba , et al. June 15, 2 | 2021-06-15 |
Mass Spectrum Processing Apparatus and Method
App 20210175060 - Kubo; Ayumi ; et al. | 2021-06-10 |
Mass Spectrometer
App 20210175065 - Fujii; Masatoshi ; et al. | 2021-06-10 |
Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope
Grant 11,031,208 - Kohno June 8, 2 | 2021-06-08 |
Actuator, Sample Positioning Device, and Charged Particle Beam System
App 20210156457 - Yuasa; Shuichi ; et al. | 2021-05-27 |
Standard Calibration Solution
App 20210156770 - Takiwaki; Masaki ; et al. | 2021-05-27 |
Three-Dimensional Powder Bed Fusion Additive Manufacturing Method and Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
App 20210154741 - Kitamura; Shinichi ; et al. | 2021-05-27 |
Three-dimensional Powder Bed Fusion Additive Manufacturing Apparatus And Three-dimensional Powder Bed Fusion Additive Manufacturing Method
App 20210154764 - Tsutagawa; Nari ; et al. | 2021-05-27 |
Electron Gun, Electron Microscope, Three-dimensional Additive Manufacturing Apparatus, And Method Of Adjusting Current Of Electron Gun
App 20210151278 - Kitamura; Shinichi ; et al. | 2021-05-20 |
Transmission Electron Microscope and Method of Controlling Same
App 20210151286 - Iijima; Hirofumi | 2021-05-20 |
Apparatus and method for automated analysis
Grant 11,009,518 - Kitamura May 18, 2 | 2021-05-18 |
Analysis Method Of Diene Compound And Production Method Of Ene Compound
App 20210109119 - TAKIWAKI; Masaki ; et al. | 2021-04-15 |
Cooling Apparatus for Charged Particle Beam Device
App 20210110993 - Shimizu; Masashi | 2021-04-15 |
Container containing unit and automatic analysis apparatus
Grant 10,976,331 - Yaginuma April 13, 2 | 2021-04-13 |
Receptacle carrier unit and automated analyzer
Grant 10,976,332 - Yamamoto April 13, 2 | 2021-04-13 |
User interface help control device, and information storage medium
Grant 10,970,088 - Watanabe April 6, 2 | 2021-04-06 |
Analysis Method and Analysis Apparatus
App 20210096063 - Tsutsumi; Kenichi ; et al. | 2021-04-01 |
Sample Chip Worktable and Retainer
App 20210094166 - Fukuda; Tomohisa ; et al. | 2021-04-01 |
Sample Attachment Device
App 20210098225 - Kawamura; Takahisa ; et al. | 2021-04-01 |
Input Lens and Electron Spectrometer
App 20210098244 - Uchida; Tatsuya | 2021-04-01 |
Scanning electron microscope and image processing method
Grant 10,964,510 - Abe March 30, 2 | 2021-03-30 |
Automatic Analyzer and Automatic Analysis Method
App 20210088544 - Yaita; Tsuyoshi | 2021-03-25 |
DNP-NMR probe and method of using the same
Grant 10,955,498 - Fujiwara , et al. March 23, 2 | 2021-03-23 |
Crystal structure analysis system and crystal structure analysis method
Grant 10,955,366 - Yonekura , et al. March 23, 2 | 2021-03-23 |
Electron microscope and image processing method
Grant 10,957,513 - Katagiri March 23, 2 | 2021-03-23 |
Method of Acquiring Dark-Field Image
App 20210082663 - Kohno; Yuji | 2021-03-18 |
Charged Particle Beam Device and Analysis Method
App 20210082660 - Tsutsumi; Kenichi ; et al. | 2021-03-18 |
Observation method, image processing device, and electron microscope
Grant 10,950,412 - Haruta , et al. March 16, 2 | 2021-03-16 |
Sample Plate Holder
App 20210074507 - Abe; Akira ; et al. | 2021-03-11 |
Additive Manufacturing Machine
App 20210069975 - Kitamura; Shinichi ; et al. | 2021-03-11 |
Control Method for Electron Microscope and Electron Microscope
App 20210074506 - Koizumi; Mitsuru | 2021-03-11 |
Mass Spectrum Processing Apparatus and Model Generation Method
App 20210065849 - Uematsu; Fuminori ; et al. | 2021-03-04 |
Scanning electron microscope and method for determining crystal orientations
Grant 10,935,505 - Otsuka , et al. March 2, 2 | 2021-03-02 |
Sample holder system and sample observation apparatus
Grant 10,930,467 - Negishi February 23, 2 | 2021-02-23 |
Automatic analyzing apparatus
Grant 10,926,232 - Yaginuma February 23, 2 | 2021-02-23 |
Ion milling apparatus and sample holder
Grant 10,930,466 - Kataoka , et al. February 23, 2 | 2021-02-23 |
Method of image acquisition and electron microscope
Grant 10,923,314 - Nakamura February 16, 2 | 2021-02-16 |
Primary beam scanning apparatus and signal processing method
Grant 10,923,316 - Matsubara February 16, 2 | 2021-02-16 |
Sample rack conveying apparatus and automated analysis system
Grant 10,914,753 - Sakamoto February 9, 2 | 2021-02-09 |
NMR sample tube
Grant 10,914,799 - Fujiwara , et al. February 9, 2 | 2021-02-09 |
Focus Adjustment Method for Charged Particle Beam Device and Charged Particle Beam Device
App 20210035772 - Tsukamoto; Kazunori ; et al. | 2021-02-04 |
Broad band inductive matching of a nuclear magnetic resonance circuit using inductive coupling
Grant 10,908,239 - Zens February 2, 2 | 2021-02-02 |
Analyzer
App 20210025838 - Tsukamoto; Kazunori ; et al. | 2021-01-28 |
X-Ray Fluorescence Measurement Apparatus
App 20210018453 - Kinugasa; Genki | 2021-01-21 |
Automated Analyzer and Method of Controlling the Automated Analyzer
App 20210011044 - Asakura; Makoto | 2021-01-14 |
X-Ray Fluorescence Analysis Apparatus and Calibration Method Thereof
App 20210003520 - Kinugasa; Genki | 2021-01-07 |
Method For Producing Semicarbazide Compound
App 20210002212 - SATOU; Makoto ; et al. | 2021-01-07 |
Sample Support and Method of Fabricating Same
App 20210005418 - Konyuba; Yuji ; et al. | 2021-01-07 |
Method of aberration measurement and electron microscope
Grant 10,886,099 - Kohno , et al. January 5, 2 | 2021-01-05 |
Monochromator and Charged Particle Beam System
App 20200411273 - Mukai; Masaki | 2020-12-31 |
Scanning electron microscope and measurement method for obtaining images of a specimen using an ion beam and an electron beam
Grant 10,879,035 - Mizuno , et al. December 29, 2 | 2020-12-29 |
NMR measurement apparatus and magnetic field map calculation method
Grant 10,877,119 - Nishihagi December 29, 2 | 2020-12-29 |
Method For Producing Solid Triazolinedione Compound, Solid Triazolinedione Compound, And Method For Producing Triazolinedione Compound
App 20200392090 - SEKI; Masahiko ; et al. | 2020-12-17 |
X-Ray Analysis System and X-Ray Analysis Method
App 20200393393 - Takahashi; Hideyuki | 2020-12-17 |
Electron microscope and specimen tilt angle adjustment method
Grant 10,867,771 - Kawai December 15, 2 | 2020-12-15 |
Composition Estimating Apparatus and Method
App 20200386726 - Kubo; Ayumi ; et al. | 2020-12-10 |
Apparatus for measuring ion beam current, sample preparation apparatus, and method of computing ion beam current
Grant 10,861,672 - Kozuka December 8, 2 | 2020-12-08 |
X-Ray Analyzer
App 20200378909 - Tsukamoto; Kazunori ; et al. | 2020-12-03 |
Automated Analyzer and Method of Controlling Automated Analyzer
App 20200378996 - Kojima; Kazushige ; et al. | 2020-12-03 |
Image Processing Method and Transmission Electron Microscope
App 20200371331 - Ikeda; Yuta ; et al. | 2020-11-26 |
Aberration measurement method and electron microscope
Grant 10,840,058 - Kohno , et al. November 17, 2 | 2020-11-17 |
Ion milling apparatus and sample holder
Grant 10,832,888 - Kataoka , et al. November 10, 2 | 2020-11-10 |
Automatic Analyzer
App 20200341020 - Nakajima; Takeichirou | 2020-10-29 |
Charged Particle Beam Device and Control Method of Optical System of Charged Particle Beam Device
App 20200343072 - Yamazaki; Kazuya ; et al. | 2020-10-29 |
Observation method and specimen observation apparatus
Grant 10,809,515 - Suzuki October 20, 2 | 2020-10-20 |
Apparatus and method for processing of mass spectrometry data
Grant 10,804,086 - Nagatomo , et al. October 13, 2 | 2020-10-13 |
Apparatus and method for processing spectrum
Grant 10,802,095 - Nakao October 13, 2 | 2020-10-13 |
Energy Filter and Charged Particle Beam Apparatus
App 20200321185 - Omoto; Kazuya | 2020-10-08 |
Method of Controlling Transmission Electron Microscope and Transmission Electron Microscope
App 20200312612 - Kohno; Yuji | 2020-10-01 |
Nuclear magnetic resonance apparatus
Grant 10,788,553 - Asano , et al. September 29, 2 | 2020-09-29 |
Charged Particle Beam Apparatus
App 20200294761 - Murakami; Yuta ; et al. | 2020-09-17 |
NMR probe
Grant 10,775,456 - Toshima , et al. Sept | 2020-09-15 |
Analysis Device and Spectrum Generation Method
App 20200284739 - Murano; Takanori | 2020-09-10 |
Three-dimensional additive manufacturing device
Grant 10,766,199 - Yoshinari Sep | 2020-09-08 |
Method for derivatizing an s-cis-diene compound, derivatization reagent kit, and method for analyzing an s-cis-diene compound
Grant 10,761,102 - Higashi , et al. Sep | 2020-09-01 |
Charged particle beam apparatus and image acquisition method
Grant 10,763,077 - Otsuka Sep | 2020-09-01 |
Mass analysis apparatus and mass analysis method
Grant 10,763,093 - Kou Sep | 2020-09-01 |
Sample Exchange Device and Charged Particle Beam Device
App 20200273660 - Fujimoto; Naoki ; et al. | 2020-08-27 |
Aberration corrector and charged particle beam device
Grant 10,755,888 - Morishita A | 2020-08-25 |
Observation Method, Image Processing Device, and Electron Microscope
App 20200266026 - Haruta; Tomohiro ; et al. | 2020-08-20 |
Scanning Transmission Electron Microscope and Aberration Correction Method
App 20200266025 - Morishita; Shigeyuki ; et al. | 2020-08-20 |
Apparatus for Measuring Ion Beam Current, Sample Preparation Apparatus, and Method of Computing Ion Beam Current
App 20200266028 - Kozuka; Munehiro | 2020-08-20 |
Image processing device, analysis device, and image processing method for generating an X-ray spectrum
Grant 10,746,675 - Mori , et al. A | 2020-08-18 |
Three-dimensional image reconstruction method
Grant 10,748,308 - Uetake , et al. A | 2020-08-18 |
X-ray analyzer and method for correcting counting rate
Grant 10,748,741 - Tsukamoto A | 2020-08-18 |
Method of observing liquid specimen, method of analyzing liquid specimen and electron microscope
Grant 10,741,357 - Inoue , et al. A | 2020-08-11 |
X-ray analyzer and spectrum generation method
Grant 10,739,284 - Murano A | 2020-08-11 |
Electron microscope
Grant 10,741,358 - Shimizu , et al. A | 2020-08-11 |
Electron microscope and control method
Grant 10,741,359 - Abe A | 2020-08-11 |
Charged Particle Beam System And Method Of Measuring Sample Using Scanning Eletron Microscope
App 20200251302 - Kind Code | 2020-08-06 |
Automatic Analysis Apparatus
App 20200241025 - Asakura; Makoto ; et al. | 2020-07-30 |
Deflector and Charged Particle Beam System
App 20200243297 - Kohno; Yuji | 2020-07-30 |
Mass Spectrum Processing Apparatus and Method
App 20200232955 - Kubo; Ayumi ; et al. | 2020-07-23 |
Electron microscope
Grant 10,720,302 - Morishita , et al. | 2020-07-21 |
Aberration corrector and electron microscope
Grant 10,720,301 - Sawada | 2020-07-21 |
Mass analysis apparatus and mass analysis method
Grant 10,720,318 - Kou | 2020-07-21 |
Charged particle beam apparatus and image acquisition method
Grant 10,720,304 - Otsuka | 2020-07-21 |
Magnetic Field Generator And Nuclear Magnetic Resonance Apparatus
App 20200225300A1 - | 2020-07-16 |
Apparatus and method for analyzing spectrum
Grant 10,712,414 - Nakao | 2020-07-14 |
Measurement method and electron microscope
Grant 10,714,308 - Kohno | 2020-07-14 |
Automatic Analyzer and Program
App 20200217867 - Yaita; Tsuyoshi | 2020-07-09 |
Magnetic resonance signal detection module
Grant 10,705,164 - Hobo , et al. | 2020-07-07 |
Magnetic resonance signal detection module
Grant 10,705,165 - Shimizu , et al. | 2020-07-07 |
Sample carrier and electron microscope
Grant 10,699,870 - Yoshida | 2020-06-30 |
NMR Measurement Apparatus and Method of Controlling Rotation of Sample Tube
App 20200200843 - Endo; Yuki ; et al. | 2020-06-25 |
Automatic analyzer and computer-readable recording medium storing program
Grant 10,690,691 - Yaita | 2020-06-23 |
Calibration Method and Analysis Device
App 20200191733 - Murano; Takanori | 2020-06-18 |
Vacuum Cooling Apparatus and Ion Milling Apparatus
App 20200185187 - Negishi; Tsutomu | 2020-06-11 |
Charged Particle Beam Apparatus and Control Method of Charged Particle Beam Apparatus
App 20200168431 - Kaneyama; Toshikatsu | 2020-05-28 |
Mass Spectrometry Apparatus, Gas Chromatograph-Mass Spectrometry Apparatus, and Flashing Current Control Apparatus
App 20200158699 - Ubukata; Masaaki | 2020-05-21 |
Scanning Electron Microscope and Image Processing Method
App 20200161087 - Abe; Akira | 2020-05-21 |
Mass Spectrometry System and Emitter Current Control Method
App 20200158700 - Ubukata; Masaaki | 2020-05-21 |
Magnetic coupling high resolution nuclear magnetic resolution probe and method of use
Grant 10,656,107 - Zens | 2020-05-19 |
Electron Microscope and Image Processing Method
App 20200144021 - Katagiri; Shinichi | 2020-05-07 |
Dispensing Unit and Automated Analyzer
App 20200132710 - Nakamura; Mizuki | 2020-04-30 |
Ionization method selection assisting apparatus and method
Grant 10,636,643 - Oka , et al. | 2020-04-28 |
Charged particle beam device
Grant 10629407 - | 2020-04-21 |
Image display device, image display method, and information storage medium
Grant 10628005 - | 2020-04-21 |
Apparatus and method for processing mass spectrum
Grant 10629420 - | 2020-04-21 |
Inductive coupling in multiple resonance circuits in a nuclear magnetic resonance probe and methods of use
Grant 10620282 - | 2020-04-14 |
Method of Generating Elemental Map and Surface Analyzer
App 20200111197 - Uchida; Tatsuya | 2020-04-09 |
Method and apparatus for sample analysis
Grant 10613043 - | 2020-04-07 |
DNP-NMR Probe and Method of Using the Same
App 20200103478 - Fujiwara; Toshimichi ; et al. | 2020-04-02 |
Electron microscope and method of controlling same
Grant 10607803 - | 2020-03-31 |
Primary Beam Scanning Apparatus and Signal Processing Method
App 20200090902 - Matsubara; Takanori | 2020-03-19 |
Image processing apparatus, surface analyzer, and image processing method
Grant 10593072 - | 2020-03-17 |
NMR Probe System and Method of Using NMR Probe System
App 20200072917 - Fujiwara; Toshimichi ; et al. | 2020-03-05 |
Method for manufacturing detection coil for magnetic resonance measurement
Grant 10571533 - | 2020-02-25 |
Vacuum Apparatus and Recovery Support Method
App 20200055092 - Tsukamoto; Kazunori | 2020-02-20 |
X-Ray Analyzer and Method for Correcting Counting Rate
App 20200058464 - Tsukamoto; Kazunori | 2020-02-20 |
Automatic analysis device and separation and washing method
Grant 10562039 - | 2020-02-18 |
Sample Carrier and Electron Microscope
App 20200051775 - Yoshida; Shuho | 2020-02-13 |
Energy filter and charged particle beam system
Grant 10546714 - | 2020-01-28 |
Method for manufacturing detection coil for magnetic resonance measurement
Grant 10539634 - | 2020-01-21 |
Three-dimensional image reconstruction method, image processor, and transmission electron microscope, using image obtained by tilted electron beam conditions
Grant 10541107 - | 2020-01-21 |
Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen
Grant 10541111 - | 2020-01-21 |
Electron Microscope
App 20200013582 - Shimizu; Yuko ; et al. | 2020-01-09 |
Automated analyzer and nozzle-cleaning method
Grant 10527638 - | 2020-01-07 |
Charged particle beam system
Grant 10529530 - | 2020-01-07 |
Crystal Structure Analysis System and Crystal Structure Analysis Method
App 20200003710 - Yonekura; Koji ; et al. | 2020-01-02 |
Mass spectrometry data processing apparatus, mass spectrometry system, and method for processing mass spectrometry data
Grant 10522335 - | 2019-12-31 |
Automatic Analyzer and Automatic Analysis Method
App 20190383843 - Ogawa; Toru | 2019-12-19 |
Sample holder and electron microscope
Grant 10504690 - | 2019-12-10 |
Chromatograph-Mass Spectrometry System and Measurement Condition Display Method
App 20190369069 - Ota; Masako | 2019-12-05 |
Automatic Analyzer
App 20190369130 - Asakura; Makoto | 2019-12-05 |
Charged Particle Beam Apparatus and Machine Learning Method
App 20190362189 - Uematsu; Fuminori | 2019-11-28 |
Charged Particle Beam Apparatus and Image Acquisition Method
App 20190362930 - Otsuka; Takeshi | 2019-11-28 |
Charged Particle Beam Apparatus and Image Acquisition Method
App 20190362934 - Otsuka; Takeshi | 2019-11-28 |
Automatic Analyzer and Automatic Analysis Method
App 20190353675 - Asakura; Makoto ; et al. | 2019-11-21 |
Image processing apparatus, image processing method, and analyzer
Grant 10482579 - | 2019-11-19 |
Observation Method, Specimen Support, and Transmission Electron Microscope
App 20190348253 - Konyuba; Yuji ; et al. | 2019-11-14 |
NMR Probe
App 20190331747 - Toshima; Katsuyuki ; et al. | 2019-10-31 |
Apparatus and Method for Automated Analysis
App 20190331706 - Asakura; Makoto ; et al. | 2019-10-31 |
NMR Sample Tube
App 20190324099 - Fujiwara; Toshimichi ; et al. | 2019-10-24 |
System and method for processing NMR signals
Grant 10451695 - | 2019-10-22 |
Automatic Analyzer and Non-Transitory Computer-Readable Recording Medium Storing Program
App 20190317117 - Inoue; Yuichi | 2019-10-17 |
Distortion correction method and electron microscope
Grant 10446362 - | 2019-10-15 |
NMR sample tube introducing and collecting apparatus, and NMR sample tube introducing and collecting method
Grant 10436859 - | 2019-10-08 |
Aberration Corrector and Charged Particle Beam Device
App 20190304739 - Morishita; Shigeyuki | 2019-10-03 |
Apparatus and Method for Automated Analysis
App 20190302138 - Asakura; Makoto ; et al. | 2019-10-03 |
Method of Observing Liquid Specimen, Method of Analyzing Liquid Specimen and Electron Microscope
App 20190295813 - Inoue; Noriyuki ; et al. | 2019-09-26 |
Ion Milling Apparatus and Sample Holder
App 20190287755 - Kataoka; Shogo ; et al. | 2019-09-19 |
Mass Analysis Apparatus and Mass Analysis Method
App 20190287783 - Kou; Junkei | 2019-09-19 |
Mass Analysis Apparatus and Mass Analysis Method
App 20190287784 - Kou; Junkei | 2019-09-19 |
Mass spectrometry data processing apparatus, mass spectrometry system, and method for processing mass spectrometry data
Grant 10416130 - | 2019-09-17 |
Electron Microscope
App 20190272971 - Morishita; Shigeyuki ; et al. | 2019-09-05 |
Method of Aberration Measurement and Electron Microscope
App 20190267210 - Kohno; Yuji ; et al. | 2019-08-29 |
Apparatus and Method for Processing Spectrum
App 20190265318 - Nakao; Tomoki | 2019-08-29 |
Sample holder unit and sample observation apparatus
Grant 10381191 - | 2019-08-13 |
Magnetic Coupling High Resolution Nuclear Magnetic Resolution Probe And Method Of Use
App 20190227012 - ZENS; ALBERT | 2019-07-25 |
Aberration Corrector and Electron Microscope
App 20190228945 - Sawada; Hidetaka | 2019-07-25 |
Scanning Electron Microscope and Measurement Method
App 20190228948 - Mizuno; Noriaki ; et al. | 2019-07-25 |
Apparatus and Method for Processing Mass Spectrum
App 20190228956 - Satoh; Takaya | 2019-07-25 |
Electron microscope and image acquisition method
Grant 10361061 - | 2019-07-23 |
Scanning electron microscope
Grant 10361062 - | 2019-07-23 |
Apparatus and Method for Processing Spectrum
App 20190219651 - Nakao; Tomoki | 2019-07-18 |
Receptacle Carrier Unit and Automated Analyzer
App 20190219605 - Yamamoto; Hideaki | 2019-07-18 |
Charged Particle Beam Device and Analysis Method
App 20190204245 - Otsuka; Takeshi ; et al. | 2019-07-04 |
Automated analyzer and retesting instruction system
App 20190204347 - Tomii; Shinichi | 2019-07-04 |
Scanning transmission electron microscope and method of image generation
Grant 10340118 - | 2019-07-02 |
Magnetic resonance measurement apparatus with selective frequency conversion of transmission and/or reception signal
Grant 10338168 - | 2019-07-02 |
Device and method for computing angular range for measurement of aberrations and electron microscope
Grant 10332719 - | 2019-06-25 |
Charged particle system and method for measuring deflection fields in a sample
Grant 10332720 - | 2019-06-25 |
Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
Grant 10332721 - | 2019-06-25 |
Method and Apparatus for Sample Analysis
App 20190187080 - Kinoshita; Shingo | 2019-06-20 |
Apparatus And Method For Automated Analysis
App 20190170778 - Kitamura; Takeshi | 2019-06-06 |
Apparatus And Method For Processing Of Mass Spectrometry Data
App 20190172695 - Nagatomo; Kenji ; et al. | 2019-06-06 |
Magnetic resonance measurement apparatus with improved instruction sequence transfer
Grant 10302721 - | 2019-05-28 |
Apparatus and Method for Analyzing Spectrum
App 20190154778 - Nakao; Tomoki | 2019-05-23 |
Apparatus and method for processing reception signal in magnetic resonance measurement apparatus
Grant 10295632 - | 2019-05-21 |
Automated Analyzer
App 20190145993 - Asakura; Makoto | 2019-05-16 |
Charged Particle Beam Device
App 20190148106 - Fukuda; Tomohisa | 2019-05-16 |
Mass spectrometry data analysis method
Grant 10290481 - | 2019-05-14 |
Relaxation time measuring method and magnetic resonance measuring apparatus
Grant 10288707 - | 2019-05-14 |
Electron Microscope and Method of Controlling Same
App 20190139734 - Mukai; Masaki | 2019-05-09 |
Container Supply Unit and Automatic Analyzer
App 20190113534 - Nakamura; Mizuki | 2019-04-18 |
Electron Microscope and Specimen Tilt Angle Adjustment Method
App 20190115187 - Kawai; Shuji | 2019-04-18 |
Mass Spectrometry Data Processing Apparatus, Mass Spectrometry System, and Method for Processing Mass Spectrometry Data
App 20190096646 - Kubo; Ayumu | 2019-03-28 |
Cold Cathode Field-Emission Electron Gun, Cold Cathode Field-Emission Electron Gun Adjustment Method, Emitter Acumination Method and Electron Microscope
App 20190096626 - Kohno; Yuji | 2019-03-28 |
Measurement Method and Electron Microscope
App 20190088447 - Kohno; Yuji | 2019-03-21 |
Electron Gun and Electron Beam Device
App 20190080878 - Ikeda; Akihiro ; et al. | 2019-03-14 |
Aberration Measurement Method And Electron Microscope
App 20190066968 - Kohno; Yuji ; et al. | 2019-02-28 |
Three-Dimensional Additive Manufacturing Device
App 20190054701 - Yoshinari; Yohsuke | 2019-02-21 |
Three-Dimensional Image Reconstruction Method
App 20190057522 - Uetake; Yusuke ; et al. | 2019-02-21 |
X-Ray Analyzer and Spectrum Generation Method
App 20190049396 - Murano; Takanori | 2019-02-14 |
Image Processing Device, Analysis Device, and Image Processing Method
App 20190041343 - Mori; Norihisa ; et al. | 2019-02-07 |
Sample Rack Conveyance Device and Automatic Analysis System
App 20190033334 - Abe; Naoyuki ; et al. | 2019-01-31 |
Magnetic Resonance Signal Detection Module
App 20190025388 - Shimizu; Tadashi ; et al. | 2019-01-24 |
Automated Analysis Device and Automated Analysis Method
App 20190018029 - Muranaka; Takeshi ; et al. | 2019-01-17 |
Sample Rack Conveying Apparatus and Automated Analysis System
App 20190018032 - Sakamoto; Kenichi | 2019-01-17 |
Sample Rack Conveyance Device, Automatic Analysis System, and Sample Rack Recovery Method for Sample Rack Conveyance Device
App 20190011471 - ABE; Naoyuki | 2019-01-10 |
Inductive Coupling in Multiple Resonance Circuits in a Nuclear Magnetic Resonance Probe and Methods of Use
App 20190004128 - ZENS; ALBERT | 2019-01-03 |
Automatic Analyzing Apparatus
App 20180369769 - Yaginuma; Takashi | 2018-12-27 |
Sample Holder and Electron Microscope
App 20180374671 - Yagi; Kazuki ; et al. | 2018-12-27 |
Distortion Correction Method and Electron Microscope
App 20180366295 - Morishita; Shigeyuki | 2018-12-20 |
Mass Spectrometry Data Processing Apparatus, Mass Spectrometry System, and Method for Processing Mass Spectrometry Data
App 20180356377 - Mukousaka; Shinichi ; et al. | 2018-12-13 |
Sample Holder System and Sample Observation Apparatus
App 20180358201 - Negishi; Tsutomu | 2018-12-13 |
Automatic Analyzer and Computer-Readable Recording Medium that Stores Program
App 20180348246 - Asakura; Makoto | 2018-12-06 |
NMR Measurement Apparatus and Magnetic Field Map Calculation Method
App 20180348320 - Nishihagi; Naoki | 2018-12-06 |
Image Processing Apparatus, Surface Analyzer, and Image Processing Method
App 20180342087 - Katoh; Naoki ; et al. | 2018-11-29 |
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