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name:-0.022341012954712
name:-0.017065048217773
name:-0.00049114227294922
Ikenaga; Osamu Patent Filings

Ikenaga; Osamu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ikenaga; Osamu.The latest application filed is for "pattern forming method and pattern forming device".

Company Profile
0.14.17
  • Ikenaga; Osamu - Yokohama-shi JP
  • Ikenaga; Osamu - Yokohama JP
  • Ikenaga; Osamu - Kawasaki JP
  • Ikenaga; Osamu - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Pattern Forming Method And Pattern Forming Device
App 20120049396 - Tsutsui; Tomohiro ;   et al.
2012-03-01
Mask pattern verifying method
Grant 8,121,387 - Asano , et al. February 21, 2
2012-02-21
Semiconductor mask inspection using die-to-die and die-to-database comparisons
Grant 8,036,446 - Ikenaga , et al. October 11, 2
2011-10-11
Method of evaluating a photo mask and method of manufacturing a semiconductor device
Grant 7,912,275 - Yamamoto , et al. March 22, 2
2011-03-22
Mask defect inspection data generating method, mask defect inspection method and mask production method
Grant 7,742,162 - Tsutsui , et al. June 22, 2
2010-06-22
Method of creating photo mask data, method of photo mask manufacturing, and method of manufacturing semiconductor device
Grant 7,735,055 - Tsutsui , et al. June 8, 2
2010-06-08
Method Of Evaluating A Photo Mask And Method Of Manufacturing A Semiconductor Device
App 20090202924 - YAMAMOTO; Hiroki ;   et al.
2009-08-13
Photomask Having Code Pattern Formed By Coding Data Conversion Process Information, Photomask Formation Method, And Semiconductor Device Fabrication Method
App 20090162758 - Ikenaga; Osamu
2009-06-25
Mask Defect Inspection Data Generating Method, Mask Defect Inspection Method And Mask Production Method
App 20090046280 - TSUTSUI; Tomohiro ;   et al.
2009-02-19
Mask Pattern Verifying Method
App 20080232671 - ASANO; Mitsuyo ;   et al.
2008-09-25
Photomask formation method, photomask, and semiconductor device fabrication method
App 20070207393 - Ikenaga; Osamu
2007-09-06
Method for evaluating photo mask and method for manufacturing semiconductor device
Grant 7,229,721 - Mimotogi , et al. June 12, 2
2007-06-12
Photo mask, method of manufacturing photo mask, and method of generating mask data
Grant 7,222,327 - Tsutsui , et al. May 22, 2
2007-05-22
Method of creating photo mask data, method of photo mask manufacturing, and method of manufacturing semiconductor device
App 20060292458 - Tsutsui; Tomohiro ;   et al.
2006-12-28
Mask forming method and semiconductor device manufacturing method
App 20060270072 - Ikenaga; Osamu ;   et al.
2006-11-30
Method of producing mask inspection data, method of manufacturing a photo mask and method of manufacturing a semiconductor device
App 20060206853 - Kamo; Takashi ;   et al.
2006-09-14
Pattern extracting system, method for extracting measuring points, method for extracting patterns, and computer program product for extracting patterns
App 20060190875 - Arisawa; Yukiyasu ;   et al.
2006-08-24
Method of manufacturing a photo mask and method of manufacturing a semiconductor device
Grant 7,090,949 - Nojima , et al. August 15, 2
2006-08-15
Method of manufacturing a photomask and method of manufacturing a semiconductor device using the photomask
Grant 7,008,731 - Nojima , et al. March 7, 2
2006-03-07
Photo mask, method of manufacturing photo mask, and method of generating mask data
App 20050003280 - Tsutsui, Tomohiro ;   et al.
2005-01-06
Method of manufacturing a photo mask and method of manufacturing a semiconductor device
App 20040146788 - Nojima, Shigeki ;   et al.
2004-07-29
Method for evaluating photo mask and method for manufacturing semiconductor device
App 20040137340 - Mimotogi, Shoji ;   et al.
2004-07-15
Method of manufacturing photomask
Grant 6,649,310 - Itoh , et al. November 18, 2
2003-11-18
Method of manufacturing a photomask and method of manufacturing a semiconductor device using the photomask
App 20030162105 - Nojima, Shigeki ;   et al.
2003-08-28
Mask trading system and method
App 20030074274 - Kyoh, Suigen ;   et al.
2003-04-17
Method of manufacturing photomask
App 20020025480 - Itoh, Masamitsu ;   et al.
2002-02-28
Method of forming photomask and method of manufacturing semiconductor device
Grant 6,333,213 - Hasebe , et al. December 25, 2
2001-12-25
Method of forming photomask and method of manufacturing semiconductor device
App 20010005619 - Hasebe, Shigeru ;   et al.
2001-06-28
Method for drawing a desired circuit pattern using charged particle beam
Grant 4,878,177 - Ikenaga , et al. October 31, 1
1989-10-31
Mark position detecting method and apparatus
Grant 4,701,053 - Ikenaga October 20, 1
1987-10-20
Apparatus for inspecting mask used for manufacturing integrated circuits
Grant 4,623,256 - Ikenaga , et al. November 18, 1
1986-11-18

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