loadpatents
name:-0.036675930023193
name:-0.026416063308716
name:-0.0069580078125
Iizuka; Toshihiro Patent Filings

Iizuka; Toshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iizuka; Toshihiro.The latest application filed is for "apparatus for manufacturing a semiconductor device".

Company Profile
5.20.21
  • Iizuka; Toshihiro - Kanagawa Pref JP
  • IIZUKA; Toshihiro - Yokohama city JP
  • IIZUKA; Toshihiro - Yokohama-shi JP
  • Iizuka; Toshihiro - Yokkaichi JP
  • Iizuka; Toshihiro - Tokyo JP
  • IIZUKA; Toshihiro - Kanagawa JP
  • Iizuka; Toshihiro - Kawasaki-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Member, method of manufacturing the same, apparatus for manufacturing the same, and semiconductor manufacturing apparatus
Grant 11,424,140 - Kim , et al. August 23, 2
2022-08-23
Apparatus For Manufacturing A Semiconductor Device
App 20220223384 - TAKADA; Naoyuki ;   et al.
2022-07-14
Sintered Body, Method Of Fabricating The Same, Semiconductor Fabricating Device, And Method Of Fabricating Semiconductor Fabricating Device
App 20220162083 - KIM; Chang Hwan ;   et al.
2022-05-26
Member, Method Of Manufacturing The Same, Apparatus For Manufacturing The Same, And Semiconductor Manufacturing Apparatus
App 20210111044 - KIM; CHANGHWAN ;   et al.
2021-04-15
Three-dimensional memory device having stressed vertical semiconductor channels and method of making the same
Grant 10,797,061 - Nishida , et al. October 6, 2
2020-10-06
Three-dimensional memory device having stressed vertical semiconductor channels and method of making the same
Grant 10,797,060 - Sharangpani , et al. October 6, 2
2020-10-06
Semiconductor device including a plurality of nitride semiconductor layers
Grant 10,658,469 - Iizuka , et al.
2020-05-19
Methods And Apparatus For Three-dimensional Nonvolatile Memory
App 20190034125 - Sel; Jongsun ;   et al.
2019-01-31
Methods and apparatus for three-dimensional nonvolatile memory
Grant 10,115,899 - Yoshida , et al. October 30, 2
2018-10-30
Semiconductor Device And Manufacturing Method Of Semiconductor Device
App 20170047409 - IIZUKA; Toshihiro ;   et al.
2017-02-16
Silicided bit line for reversible-resistivity memory
Grant 9,443,910 - Fujiwara , et al. September 13, 2
2016-09-13
Method For Fabricating A Metal-insulator-metal (mim) Capacitor Having Capacitor Dielectric Layer Formed By Atomic Layer Deposition (ald)
App 20140327064 - IIZUKA; Toshihiro ;   et al.
2014-11-06
Method for fabricating a metal-insulator-metal (MIM) capacitor having capacitor dielectric layer formed by atomic layer deposition (ALD)
Grant 8,815,678 - Iizuka , et al. August 26, 2
2014-08-26
Method of manufacturing a semiconductor device
Grant 8,440,521 - Fukumaki , et al. May 14, 2
2013-05-14
Semiconductor Device Having A Thin Film Capacitor And Method For Fabricating The Same
App 20120261735 - IIZUKA; Toshihiro ;   et al.
2012-10-18
Semiconductor device having a thin film capacitor of a MIM (metal-insulator-metal) structure
Grant 8,212,299 - Iizuka , et al. July 3, 2
2012-07-03
Semiconductor device with complementary transistors that include hafnium-containing gate insulators and metal gate electrodes
Grant 8,188,547 - Manabe , et al. May 29, 2
2012-05-29
Metal-insulator-metal (MIM) capacitor having capacitor dielectric material selected from a group consisting of ZRO2, HFO2, (ZRX, HF1-X)O2 (0<x<1), (ZRy, Ti (O<y<1), (Hfz, Ti-z)O2 (O<z<1) and (Zrk, Ti1, Hfm)O2 (O<K, 1, m<1, K+1+m=1)
Grant 8,169,013 - Iizuka , et al. May 1, 2
2012-05-01
Method of manufacturing a semiconductor device
App 20120028455 - FUKUMAKI; Naomi ;   et al.
2012-02-02
Process for manufacturing a semiconductor device comprising a metal-compound film
Grant 7,943,475 - Yamamoto , et al. May 17, 2
2011-05-17
Semiconductor Device
App 20100327366 - MANABE; Kenzo ;   et al.
2010-12-30
Semiconductor Device And Method For Manufacturing The Same
App 20100176456 - Ikeno; Daisuke ;   et al.
2010-07-15
Method For Fabricating A Metal-insulator-metal (mim) Capacitor Having Capacitor Dielectric Layer Formed By Atomic Layer Deposition (ald)
App 20080064147 - IIZUKA; Toshihiro ;   et al.
2008-03-13
Method for fabricating a metal insulator-metal (MIM) capacitor having capacitor dielectric layer formed by atomic layer deposition (ALD)
App 20070152256 - Iizuka; Toshihiro ;   et al.
2007-07-05
Semiconductor device and manufacturing process therefor
App 20060121671 - Yamamoto; Tomoe ;   et al.
2006-06-08
Method for forming capacitor
Grant 6,875,667 - Iizuka , et al. April 5, 2
2005-04-05
Semiconductor device having a thin film capacitor and method for fabricating the same
App 20050051824 - Iizuka, Toshihiro ;   et al.
2005-03-10
Semiconductor device and manufacturing process therefor
App 20040217478 - Yamamoto, Tomoe ;   et al.
2004-11-04
Method for forming capacitor
App 20040072401 - Iizuka, Toshihiro ;   et al.
2004-04-15
Process for fabricating capacitor having dielectric layer with pervskite structure and apparatus for fabricating the same
Grant 6,602,722 - Yamamoto , et al. August 5, 2
2003-08-05
Method of fabricating a high dielectric constant metal oxide capacity insulator film using atomic layer CVD
Grant 6,596,602 - Iizuka , et al. July 22, 2
2003-07-22
Semiconductor device having a thin film capacitor and method for fabricating the same
App 20020190294 - Iizuka, Toshihiro ;   et al.
2002-12-19
DRAM having a stacked capacitor and a method for fabricating the same
Grant 6,448,597 - Kasai , et al. September 10, 2
2002-09-10
Process for fabricating capacitor having dielectric layer with pervskite structure and apparatus for fabricating the same
App 20020119617 - Yamamoto, Ichiro ;   et al.
2002-08-29
Method for fabricating a semiconductor device
App 20020102810 - Iizuka, Toshihiro ;   et al.
2002-08-01
Semiconductor memory device production method
App 20020019109 - Iizuka, Toshihiro
2002-02-14
Semiconductor memory device production method
Grant 6,338,996 - Iizuka January 15, 2
2002-01-15
Method of manufacturing semiconductor device having thin film capacitor
Grant 6,326,258 - Iizuka December 4, 2
2001-12-04
Process for fabricating capacitor having dielectric layer with perovskite structure and apparatus for fabricating the same
App 20010004533 - Yamamoto, Ichiro ;   et al.
2001-06-21

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