loadpatents
name:-0.0070419311523438
name:-0.010170936584473
name:-0.00046706199645996
Igarashi; Noriyuki Patent Filings

Igarashi; Noriyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Igarashi; Noriyuki.The latest application filed is for "cooling fin connected to a cooling unit and a pusher of the testing apparatus".

Company Profile
0.9.5
  • Igarashi; Noriyuki - Tokyo JP
  • Igarashi, Noriyuki - Nerima-Ku JP
  • Igarashi; Noriyuki - Gyoda JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
Grant 7,362,117 - Saito , et al. April 22, 2
2008-04-22
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
App 20060255822 - Saito; Noboru ;   et al.
2006-11-16
Apparatus for handling electronic components and method for controlling temperature of electronic components
Grant 6,972,581 - Yamashita , et al. December 6, 2
2005-12-06
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
App 20050225346 - Saito, Noboru ;   et al.
2005-10-13
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
Grant 6,919,734 - Saito , et al. July 19, 2
2005-07-19
Apparatus for handling electronic components and method for controlling temperature of electronic components
App 20040124846 - Yamashita, Tsuyoshi ;   et al.
2004-07-01
Device testing apparatus
App 20040070416 - Saito, Noboru ;   et al.
2004-04-15
Holding apparatus
Grant 6,663,092 - Kashiwazaki , et al. December 16, 2
2003-12-16
Device testing apparatus
App 20020109518 - Saito, Noboru ;   et al.
2002-08-15
IC testing apparatus
Grant 6,257,319 - Kainuma , et al. July 10, 2
2001-07-10
Test handler having turn table
Grant 5,894,217 - Igarashi , et al. April 13, 1
1999-04-13
Transport mechanism for IC handlers
Grant 5,469,953 - Igarashi , et al. November 28, 1
1995-11-28
IC test equipment
Grant 5,177,435 - Kiyokawa , et al. January 5, 1
1993-01-05
IC test equipment
Grant 4,691,831 - Suzuki , et al. September 8, 1
1987-09-08

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