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Shallow trench isolation dummy pattern and layout method using the same Grant 7,849,432 - Doong , et al. December 7, 2 | 2010-12-07 |
Shallow Trench Isolation Dummy Pattern and Layout Method Using the Same App 20100252907 - Doong; Kelvin Yih-Yuh ;   et al. | 2010-10-07 |
Seal ring structure for integrated circuit chips Grant 7,777,338 - Yao , et al. August 17, 2 | 2010-08-17 |
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Bonding pad structure and method for making the same Grant 7,470,994 - Huang , et al. December 30, 2 | 2008-12-30 |
Shallow Trench Isolation Dummy Pattern And Layout Method Using The Same App 20080209381 - Doong; Kelvin Yih-Yuh ;   et al. | 2008-08-28 |
Shallow trench isolation dummy pattern and layout method using the same Grant 7,388,263 - Doong , et al. June 17, 2 | 2008-06-17 |
Bonding pad structure and method for making the same App 20080003820 - Huang; Tai-Chun ;   et al. | 2008-01-03 |
Stripe board dummy metal for reducing coupling capacitance Grant 7,312,486 - Lin , et al. December 25, 2 | 2007-12-25 |
Method for forming an interconnection structure for ic metallization Grant 7,291,557 - Wan , et al. November 6, 2 | 2007-11-06 |
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Semiconductor bonding pad structure Grant 7,253,531 - Huang , et al. August 7, 2 | 2007-08-07 |
Multiple etch-stop layer deposition scheme and materials Grant 7,151,052 - Huang , et al. December 19, 2 | 2006-12-19 |
Multiple Etch-stop Layer Deposition Scheme And Materials App 20060246686 - Huang; Tai-Chun ;   et al. | 2006-11-02 |
Structure for reducing stress-induced voiding in an interconnect of integrated circuits App 20060108696 - Yao; Chih-Hsiang ;   et al. | 2006-05-25 |
Structure for reducing stress-induced voiding in an interconnect of integrated circuits Grant 7,042,097 - Yao , et al. May 9, 2 | 2006-05-09 |
Interconnection structure for IC metallization App 20060057841 - Wan; Wen-Kai ;   et al. | 2006-03-16 |
Methods for enhancing die saw and packaging reliability App 20060055002 - Yao; Chih-Hsiang ;   et al. | 2006-03-16 |
Seal ring structure for integrated circuit chips App 20060055007 - Yao; Chih-Hsiang ;   et al. | 2006-03-16 |
Shallow trench isolation dummy pattern and layout method using the same App 20050112840 - Doong, Kelvin Yih-Yuh ;   et al. | 2005-05-26 |
Test structure for differentiating the line and via contribution in stress migration Grant 6,835,578 - Lin , et al. December 28, 2 | 2004-12-28 |
Method and pattern for reducing interconnect failures Grant 6,831,365 - Yao , et al. December 14, 2 | 2004-12-14 |
Structure for reducing stress-induced voiding in an interconnect of integrated circuits App 20040245639 - Yao, Chih-Hsiang ;   et al. | 2004-12-09 |
Method And Pattern For Reducing Interconnect Failures App 20040238959 - Yao, Chih-Hsiang ;   et al. | 2004-12-02 |
Scheme to define laser fuse in dual damascene CU process Grant 6,737,345 - Lin , et al. May 18, 2 | 2004-05-18 |
Bonding pad and method for manufacturing it Grant 6,566,752 - Hsia , et al. May 20, 2 | 2003-05-20 |
Bonding pad and method for manufacturing it App 20020149115 - Hsia, Chin Chiu ;   et al. | 2002-10-17 |
Bonding pad and method for manufacturing it Grant 6,426,555 - Hsia , et al. July 30, 2 | 2002-07-30 |
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