Farber; David Gerald

Patent Applications and Registrations

Patent applications and USPTO patent grants for Farber; David Gerald.The latest application filed is for "low damage low-k dielectric etch".

Company Profile

0.9.9

Farber; David Gerald - Plano TX
Farber; David Gerald - Austin TX
Farber; David Gerald - Wylie TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Low damage low-k dielectric etch Grant 10,453,700 - Jiang , et al. Oc	2019-10-22
Method of fabricating semiconductors Grant 9,881,795 - Farber , et al. January 30, 2	2018-01-30
Low Damage Low-k Dielectric Etch App 20170178955 - JIANG; Ping ; et al.	2017-06-22
Method Of Fabricating Semiconductors App 20170148634 - Farber; David Gerald ; et al.	2017-05-25
Method of fabricating semiconductors Grant 9,490,143 - Farber , et al. November 8, 2	2016-11-08
Hard mask for source/drain epitaxy control Grant 9,224,657 - Farber , et al. December 29, 2	2015-12-29
Method of forming a metal contact opening with a width that is smaller than the minimum feature size of a photolithographically-defined opening Grant 9,054,158 - Farber , et al. June 9, 2	2015-06-09
Hard Mask For Source/drain Epitaxy Control App 20150044830 - Farber; David Gerald ; et al.	2015-02-12
Method of Forming a Metal Contact Opening with a Width that is Smaller than the Minimum Feature Size of a Photolithographically-Defined Opening App 20140227877 - Farber; David Gerald ; et al.	2014-08-14
Lateral uniformity in silicon recess etch Grant 8,507,386 - Farber , et al. August 13, 2	2013-08-13
Lateral Uniformity in Silicon Recess Etch App 20120064686 - Farber; David Gerald ; et al.	2012-03-15
Method for Dry Develop of Trilayer Photoresist Patterns App 20090042399 - Smith; Brian Ashley ; et al.	2009-02-12
Shallow Trench Divot Control Post App 20080268589 - Farber; David Gerald ; et al.	2008-10-30
Method of passivating and/or removing contaminants on a low-k dielectric/copper surface Grant 7,087,518 - Farber , et al. August 8, 2	2006-08-08
Method of passivating and/or removing contaminants on a low-k dielectric/copper surface App 20030224585 - Farber, David Gerald ; et al.	2003-12-04
Method of passivating and/or removing contaminants on a low-k dielectric/copper surface App 20030170992 - Farber, David Gerald ; et al.	2003-09-11
Method and apparatus for monitoring wafer characteristics and/or semiconductor processing consistency using wafer charge distribution measurements Grant 6,232,134 - Farber , et al. May 15, 2	2001-05-15

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