Deguchi; Yoshinori
Patent Applications and Registrations
Patent applications and USPTO patent grants for Deguchi; Yoshinori.The latest application filed is for "method of manufacturing semiconductor device".
Company Profile
5.21.25
- Deguchi; Yoshinori - Tokyo JP
- Deguchi; Yoshinori - Gunma JP
- Deguchi; Yoshinori - Kawasaki JP
- DEGUCHI; Yoshinori - Kawasaki-shi JP
- Deguchi; Yoshinori - Kanagawa JP
- Deguchi; Yoshinori - Inagawa JP
- Deguchi, Yoshinori - Hyogo JP
Patent Activity
| Patent | Date |
|---|---|
| Method of manufacturing semiconductor device Grant 11,456,264 - Sato , et al. September 27, 2 | 2022-09-27 |
| Semiconductor device and method for manufacturing the same Grant 11,387,172 - Deguchi , et al. July 12, 2 | 2022-07-12 |
| Method Of Manufacturing Semiconductor Device App 20210272917 - SATO; Yoshiaki ; et al. | 2021-09-02 |
| Semiconductor device and method of manufacturing the same Grant 10,818,601 - Deguchi , et al. October 27, 2 | 2020-10-27 |
| Semiconductor Device And Method Of Manufacturing The Same App 20200328157 - DEGUCHI; Yoshinori ; et al. | 2020-10-15 |
| Semiconductor device including a pad and a wiring line arranged for bringing a probe into contact with the pad and method of manufacturing the same Grant 10,777,507 - Deguchi , et al. Sept | 2020-09-15 |
| Semiconductor Device App 20200043877 - SAITO; Kentaro ; et al. | 2020-02-06 |
| Semiconductor Device And Method For Manufacturing The Same App 20190295930 - DEGUCHI; Yoshinori ; et al. | 2019-09-26 |
| Semiconductor Device And Method Of Manufacturing The Same App 20180374795 - DEGUCHI; Yoshinori ; et al. | 2018-12-27 |
| Method for manufacturing semiconductor device Grant 10,141,295 - Yasumura , et al. Nov | 2018-11-27 |
| Method For Manufacturing Semiconductor Device App 20180040598 - YASUMURA; Bunji ; et al. | 2018-02-08 |
| Method for manufacturing semiconductor device Grant 9,825,017 - Yasumura , et al. November 21, 2 | 2017-11-21 |
| Method For Manufacturing Semiconductor Device App 20170005080 - YASUMURA; Bunji ; et al. | 2017-01-05 |
| Method for manufacturing semiconductor device Grant 9,490,218 - Yasumura , et al. November 8, 2 | 2016-11-08 |
| Semiconductor Device And Manufacturing Method For The Same App 20160027731 - Mori; Ryo ; et al. | 2016-01-28 |
| Method of manufacturing semiconductor device Grant 9,230,938 - Hasebe , et al. January 5, 2 | 2016-01-05 |
| Semiconductor device and manufacturing method for the same Grant 9,171,767 - Mori , et al. October 27, 2 | 2015-10-27 |
| Method For Manufacturing Semiconductor Device App 20150243605 - Yasumura; Bunji ; et al. | 2015-08-27 |
| Method for manufacturing semiconductor device Grant 9,053,954 - Yasumura , et al. June 9, 2 | 2015-06-09 |
| Method Of Manufacturing Semiconductor Device App 20150111317 - Hasebe; Akio ; et al. | 2015-04-23 |
| Semiconductor Device And Manufacturing Method For The Same App 20150076709 - Mori; Ryo ; et al. | 2015-03-19 |
| Method of manufacturing semiconductor device Grant 8,945,953 - Hasebe , et al. February 3, 2 | 2015-02-03 |
| Semiconductor device and manufacturing method for the same Grant 8,896,129 - Mori , et al. November 25, 2 | 2014-11-25 |
| Semiconductor Chip And Semiconductor Device App 20140287541 - Yasumura; Bunji ; et al. | 2014-09-25 |
| Method Of Manufacturing Semiconductor Device App 20140179032 - Hasebe; Akio ; et al. | 2014-06-26 |
| Semiconductor Device And Manufacturing Method For The Same App 20130256906 - Mori; Ryo ; et al. | 2013-10-03 |
| Semiconductor device Grant 8,178,981 - Kanzaki , et al. May 15, 2 | 2012-05-15 |
| Semiconductor Device App 20100155960 - KANZAKI; Teruaki ; et al. | 2010-06-24 |
| Semiconductor device Grant 7,701,063 - Kanzaki , et al. April 20, 2 | 2010-04-20 |
| Manufacturing method of semiconductor integrated circuit device Grant 7,534,629 - Shoji , et al. May 19, 2 | 2009-05-19 |
| Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device Grant 7,423,439 - Kasukabe , et al. September 9, 2 | 2008-09-09 |
| Semiconductor device test probe Grant 7,276,923 - Takemoto , et al. October 2, 2 | 2007-10-02 |
| Semiconductor device test probe Grant 7,274,195 - Takemoto , et al. September 25, 2 | 2007-09-25 |
| Semiconductor device App 20070182001 - Kanzaki; Teruaki ; et al. | 2007-08-09 |
| Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device App 20070103178 - Kasukabe; Susumu ; et al. | 2007-05-10 |
| Manufacturing method of semiconductor integrated circuit device App 20060281222 - Shoji; Teruo ; et al. | 2006-12-14 |
| Semiconductor device test probe App 20060038575 - Takemoto; Megumi ; et al. | 2006-02-23 |
| Semiconductor Device Test Probe Having Improved Tip Portion App 20050189955 - Takemoto, Megumi ; et al. | 2005-09-01 |
| Probe card App 20050007134 - Deguchi, Yoshinori | 2005-01-13 |
| Probe card Grant 6,727,714 - Deguchi April 27, 2 | 2004-04-27 |
| Semiconductor device test probe having improved tip portion and manufacturing method thereof Grant 6,633,176 - Takemoto , et al. October 14, 2 | 2003-10-14 |
| Probe card for testing semiconductor integrated circuit and method of manufacturing the same Grant 6,628,127 - Takemoto , et al. September 30, 2 | 2003-09-30 |
| Probe card App 20030057976 - Deguchi, Yoshinori | 2003-03-27 |
| A Test Board For Testing A Semiconductor Device Utilizing First And Second Delay Elements In A Signal-transmission-path App 20020011865 - TAKAGI, RYOICHI ; et al. | 2002-01-31 |
| Semiconductor device test probe, manufacturing method therefor and semiconductor device tested by the probe App 20010046715 - Takemoto, Megumi ; et al. | 2001-11-29 |
| Probe card for testing semiconductor integrated circuit and method of manufacturing the same App 20010015650 - Takemoto, Megumi ; et al. | 2001-08-23 |
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