name:-0.054375886917114
name:-0.05986213684082
name:-0.0075421333312988
DCG Systems, Inc. Patent Filings

DCG Systems, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for DCG Systems, Inc..The latest application filed is for "synchronized pulsed lada for the simultaneous acquisition of timing diagrams and laser-induced upsets".

Company Profile
8.70.59
  • DCG Systems, Inc. - Fremont CA
  • DCG Systems, Inc. -
  • DCG Systems, Inc. - Fremond CA
  • DCG Systems Inc - Fremont CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets
Grant 11,047,906 - Erington , et al. June 29, 2
2021-06-29
Method and system for resolving hot spots in LIT
Grant 10,545,186 - Schmidt Ja
2020-01-28
Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing
Grant 10,539,589 - Ukraintsev , et al. Ja
2020-01-21
Synchronized Pulsed Lada For The Simultaneous Acquisition Of Timing Diagrams And Laser-induced Upsets
App 20190170818 - Erington; Kent ;   et al.
2019-06-06
Self Correcting Floating Sil Tip
App 20190155013 - Frank; Jonathan ;   et al.
2019-05-23
Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets
Grant 10,191,111 - Erington , et al. Ja
2019-01-29
System and method for modulation mapping
Grant 9,915,700 - Kasapi March 13, 2
2018-03-13
Apparatus and method for annular optical power management
Grant 9,885,878 - Serrels February 6, 2
2018-02-06
Method for imaging a feature using a scanning probe microscope
Grant 9,869,696 - Erickson , et al. January 16, 2
2018-01-16
Probe-based Data Collection System With Adaptive Mode Of Probing Controlled By Local Sample Properties
App 20170082685 - Ukraintsev; Vladimir A. ;   et al.
2017-03-23
Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials
Grant 9,551,743 - Erickson January 24, 2
2017-01-24
Diamond Delayering For Electrical Probing
App 20170003336 - Ippolito; Stephen ;   et al.
2017-01-05
Particle Beam Heating to Identify Defects
App 20160370425 - Stallcup; Richard ;   et al.
2016-12-22
System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
Grant 9,506,947 - Ukraintsev , et al. November 29, 2
2016-11-29
Method And System For Resolving Hot Spots In Lit
App 20160245860 - Schmidt; Christian
2016-08-25
Method For Imaging A Feature Using A Scanning Probe Microscope
App 20160231353 - Erickson; Andrew Norman ;   et al.
2016-08-11
Laser-assisted Device Alteration Using Synchronized Laser Pulses
App 20160202313 - Vedagarbha; Praveen ;   et al.
2016-07-14
Lock-in Thermography Method And System For Hot Spot Localization
App 20160202126 - Schmidt; Christian ;   et al.
2016-07-14
Apparatus and method for polarization diversity imaging and alignment
Grant 9,361,533 - Serrels , et al. June 7, 2
2016-06-07
Systems And Method For Laser Voltage Imaging State Mapping
App 20160139200 - Ng; Yin Shyang ;   et al.
2016-05-19
System And Method For Modulation Mapping
App 20160131703 - Kasapi; Steven
2016-05-12
Three-dimensional hot spot localization
Grant 9,322,715 - Altmann , et al. April 26, 2
2016-04-26
Systems And Method For Laser Voltage Imaging
App 20160109513 - Vickers; James S.
2016-04-21
Systems and method for laser voltage imaging state mapping
Grant 9,244,121 - Ng , et al. January 26, 2
2016-01-26
System and method for modulation mapping
Grant 9,239,357 - Kasapi January 19, 2
2016-01-19
Apparatus And Method For Nanoprobing Of Electronic Devices
App 20150377958 - Ukraintsev; Vladimir ;   et al.
2015-12-31
Through Process Flow Intra-chip And Inter-chip Electrical Analysis And Process Control Using In-line Nanoprobing
App 20150377921 - Ukraintsev; Vladimir ;   et al.
2015-12-31
Laser-assisted device alteration using synchronized laser pulses
Grant 9,201,096 - Vedagarbha , et al. December 1, 2
2015-12-01
Lock In Thermal Laser Stimulation Through One Side Of The Device While Acquiring Lock-in Thermal Emission Images On The Opposite Side
App 20150338458 - Deslandes; Herve ;   et al.
2015-11-26
System And Method For Non-contact Microscopy For Three-dimensional Pre-characterization Of A Sample For Fast And Non-destructive On Sample Navigation During Nanoprobing
App 20150301078 - Ukraintsev; Vladimir A. ;   et al.
2015-10-22
Spectral Mapping Of Photo Emission
App 20150293037 - Deslandes; Herve ;   et al.
2015-10-15
Self Correcting Floating Sil Tip
App 20150260976 - Frank; Jonathan ;   et al.
2015-09-17
System And Method For Fault Isolation By Emission Spectra Analysis
App 20150260789 - Deslandes; Herve ;   et al.
2015-09-17
Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
Grant 9,098,892 - Deslandes , et al. August 4, 2
2015-08-04
P and N region differentiation for image-to-CAD alignment
Grant 9,064,083 - Durec , et al. June 23, 2
2015-06-23
Probe-based Data Collection System With Adaptive Mode Of Probing
App 20150168444 - Ukraintsev; Vladimir A. ;   et al.
2015-06-18
Probe-based data collection system with adaptive mode of probing
Grant 9,057,740 - Ukraintsev , et al. June 16, 2
2015-06-16
Led Lighting Device
App 20150146424 - Karg; Dieter ;   et al.
2015-05-28
Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
Grant 9,025,020 - Deslandes , et al. May 5, 2
2015-05-05
Optimized Wavelength Photon Emission Microscope For Vlsi Devices
App 20150091602 - Deslandes; Herve
2015-04-02
Method for evaluating the centerline of an arbitrarily shaped object
Grant 8,983,232 - Louban March 17, 2
2015-03-17
Probe-based Data Collection System With Adaptive Mode Of Probing Controlled By Local Sample Properties
App 20140380531 - Ukraintsev; Vladimir A. ;   et al.
2014-12-25
Three-Dimensional Hot Spot Localization
App 20140346360 - Altmann; Frank ;   et al.
2014-11-27
System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
Grant 8,895,923 - Ukraintsev , et al. November 25, 2
2014-11-25
Method For Examination Of A Sample By Means Of The Heat Flow Thermography
App 20140328370 - Lang; Haymo ;   et al.
2014-11-06
Apparatus And Method For Annular Optical Power Management
App 20140307311 - Serrels; Keith
2014-10-16
Laser assisted device alteration using two-photon absorption
Grant 8,860,447 - Vedagarbha , et al. October 14, 2
2014-10-14
Systems And Method For Laser Voltage Imaging State Mapping
App 20140292363 - Ng; Yin Shyang ;   et al.
2014-10-02
Synchronized Pulsed Lada For The Simultaneous Acquisition Of Timing Diagrams And Laser-induced Upsets
App 20140285227 - Serrels; Keith ;   et al.
2014-09-25
Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
Grant 8,810,266 - Cader , et al. August 19, 2
2014-08-19
Lock In Thermal Laser Stimulation Through One Side Of The Device While Acquiring Lock-in Thermal Emission Images On The Opposite Side
App 20140210994 - Deslandes; Herve ;   et al.
2014-07-31
Accumulating Optical Detector With Shutter Emulation
App 20140191111 - Deslandes; Herve
2014-07-10
Systems and method for laser voltage imaging state mapping
Grant 8,754,633 - Ng , et al. June 17, 2
2014-06-17
Three-dimensional hot spot localization
Grant 8,742,347 - Altmann , et al. June 3, 2
2014-06-03
System And Method For Non-contact Microscopy For Three-dimensional Pre-characterization Of A Sample For Fast And Non-destructive On Sample Navigation During Nanoprobing
App 20140143912 - Ukraintsev; Vladimir A. ;   et al.
2014-05-22
System and method for modulation mapping
Grant 8,686,748 - Kasapi April 1, 2
2014-04-01
P And N Region Differentiation For Image-to-cad Alignment
App 20140047396 - Durec; Jan ;   et al.
2014-02-13
Method to transfer failure analysis-specific data between design houses and fab's/FA labs
Grant 8,645,896 - Suri , et al. February 4, 2
2014-02-04
Laser-assisted Device Alteration Using Synchronized Laser Pulses
App 20130314116 - Vedagarbha; Praveen ;   et al.
2013-11-28
Variable magnification optics with spray cooling
Grant 8,553,322 - Niv , et al. October 8, 2
2013-10-08
Apparatus And Method For Polarization Diversity Imaging And Alignment
App 20130121617 - Serrels; Keith ;   et al.
2013-05-16
System And Method For Modulation Mapping
App 20130113510 - Kasapi; Steven
2013-05-09
Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
Grant 8,173,948 - Tsao May 8, 2
2012-05-08
Lock In Thermal Laser Stimulation Through One Side Of The Device While Acquiring Lock-in Thermal Emission Images On The Opposite Side
App 20120098957 - DESLANDES; Herve ;   et al.
2012-04-26
Probe tip to device pad alignment in obscured view probing applications
Grant 8,159,243 - Portune April 17, 2
2012-04-17
Laser Assisted Device Alteration Using Two-photon Absorption
App 20120056626 - VEDAGARBHA; Praveen ;   et al.
2012-03-08
Spray Cooling Thermal Management System And Method For Semiconductor Probing, Diagnostics, And Failure Analysis
App 20120007623 - Cader; Tahir ;   et al.
2012-01-12
Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
Grant 8,076,951 - Cader , et al. December 13, 2
2011-12-13
System and method for photoemission-based defect detection
Grant 8,072,589 - Khurana December 6, 2
2011-12-06
System And Method For Modulation Mapping
App 20110199110 - KASAPI; Steven
2011-08-18
System and method for modulation mapping
Grant 7,990,167 - Kasapi August 2, 2
2011-08-02
Undoped silicon heat spreader window
Grant 7,956,625 - Portune June 7, 2
2011-06-07
Apparatus and method for optical interference fringe based integrated circuit processing
Grant 7,884,024 - Le Roy , et al. February 8, 2
2011-02-08
FIB milling of copper over organic dielectrics
Grant 7,883,630 - Makarov , et al. February 8, 2
2011-02-08
Methods and systems of performing device failure analysis, electrical characterization and physical characterization
Grant 7,842,920 - Lundquist November 30, 2
2010-11-30
FIB based open via analysis and repair
Grant 7,786,436 - Lundquist , et al. August 31, 2
2010-08-31
System and method for modulation mapping
Grant 7,733,100 - Kasapi June 8, 2
2010-06-08
Probe Tip To Device Pad Alignment In Obscured View Probing Applications
App 20100117672 - PORTUNE; Richard Alan
2010-05-13
Variable Magnification Optics With Spray Cooling
App 20100110540 - Niv; Israel ;   et al.
2010-05-06
Apparatus and method for optical interference fringe based integrated circuit processing
Grant 7,697,146 - Le Roy , et al. April 13, 2
2010-04-13
System and method for voltage noise and jitter measurement using time-resolved emission
Grant 7,679,358 - Kasapi , et al. March 16, 2
2010-03-16
Temperature Control System For A Device Under Test
App 20100039117 - JACOBS; Robert
2010-02-18
Optical Coupling Apparatus For A Dual Column Charged Particle Beam Tool For Imaging And Forming Silicide In A Localized Manner
App 20100038555 - TSAO; Chun-Cheng
2010-02-18
System And Method For Modulation Mapping
App 20100039131 - Kasapi; Steven
2010-02-18
Apparatus and method for probing integrated circuits using polarization difference probing
Grant 7,659,981 - Lo , et al. February 9, 2
2010-02-09
Collection optics integrating an objective and a SIL
Grant 7,639,025 - Hanson , et al. December 29, 2
2009-12-29
System and method for resolving photoemission from semiconductor devices
Grant 7,636,155 - Khurana December 22, 2
2009-12-22
Apparatus and method for probing integrated circuits using laser illumination
Grant 7,616,312 - Kasapi , et al. November 10, 2
2009-11-10
Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
Grant 7,612,321 - Tsao November 3, 2
2009-11-03
Column simultaneously focusing a particle beam and an optical beam
Grant 7,573,050 - Benas-Sayag , et al. August 11, 2
2009-08-11
Spray Cooling Thermal Management System And Method For Semiconductor Probing, Diagnostics, And Failure Analysis
App 20090173476 - Cader; Tahir ;   et al.
2009-07-09
System And Method For Photoemission-based Defect Detection
App 20090150098 - Khurana; Neeraj
2009-06-11
Enhanced OP3 algorithms for net cuts, net joins, and probe points for a digital design
Grant 7,539,966 - Basu , et al. May 26, 2
2009-05-26
Method and system for identifying events in FIB
Grant 7,535,000 - Phaneuf , et al. May 19, 2
2009-05-19
Apparatus and method for circuit operation definition
Grant 7,530,034 - Betz , et al. May 5, 2
2009-05-05
Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis
Grant 7,504,845 - Cader , et al. March 17, 2
2009-03-17
Bi-convex solid immersion lens
Grant 7,492,529 - Pakdaman , et al. February 17, 2
2009-02-17
Apparatus and method for hard-docking a tester to a tiltable imager
Grant 7,480,051 - Frank , et al. January 20, 2
2009-01-20
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
Grant 7,478,345 - Kasapi January 13, 2
2009-01-13
Time resolved non-invasive diagnostics system
Grant 7,466,852 - Cotton , et al. December 16, 2
2008-12-16
Sub-resolution Alignment Of Images
App 20080298719 - Sengupta; Madhumita ;   et al.
2008-12-04
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
Grant 7,450,245 - Woods , et al. November 11, 2
2008-11-11
Apparatus and method of forming silicide in a localized manner
Grant 7,439,168 - Boit , et al. October 21, 2
2008-10-21
Apparatus and method for detecting photon emissions from transistors
Grant 7,439,730 - Desplats , et al. October 21, 2
2008-10-21
Sub-resolution alignment of images
Grant 7,409,653 - Sengupta , et al. August 5, 2
2008-08-05

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