Culp; James A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Culp; James A..The latest application filed is for "semiconductor layout generation".

Company Profile

0.54.48

Culp; James A. - New Paltz NY
Culp; James A. - Newburgh NY
Culp; James A. - Downington PA US
Culp; James A. - Downingtown PA
Culp; James A. - Hopewell Junction NY
Culp; James A. - Poughkeepsie NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Rule and process assumption co-optimization using feature-specific layout-based statistical analyses Grant 9,898,573 - Culp , et al. February 20, 2	2018-02-20
Semiconductor Layout Generation App 20170351799 - Azuma; Atsushi ; et al.	2017-12-07
Semiconductor layout generation Grant 9,836,570 - Azuma , et al. December 5, 2	2017-12-05
Rule And Process Assumption Co-optimization Using Feature-specific Layout-based Statistical Analyses App 20170228491 - Culp; James A. ; et al.	2017-08-10
Selective local metal cap layer formation for improved electromigration behavior Grant 9,455,186 - Angyal , et al. September 27, 2	2016-09-27
Selective local metal cap layer formation for improved electromigration behavior Grant 9,406,560 - Angyal , et al. August 2, 2	2016-08-02
Selective local metal cap layer formation for improved electromigration behavior Grant 9,385,038 - Angyal , et al. July 5, 2	2016-07-05
Correcting for stress induced pattern shifts in semiconductor manufacturing Grant 9,311,443 - Chidambarrao , et al. April 12, 2	2016-04-12
Net-voltage-aware optical proximity correction (OPC) Grant 9,311,442 - Banerjee , et al. April 12, 2	2016-04-12
Correcting For Stress Induced Pattern Shifts In Semiconductor Manufacturing App 20150363536 - Chidambarrao; Dureseti ; et al.	2015-12-17
Net-voltage-aware Optical Proximity Correction (opc) App 20150310155 - Banerjee; Shayak ; et al.	2015-10-29
Selective Local Metal Cap Layer Formation For Improved Electromigration Behavior App 20150255342 - Angyal; Matthew S. ; et al.	2015-09-10
Selective Local Metal Cap Layer Formation For Improved Electromigration Behavior App 20150255343 - Angyal; Matthew S. ; et al.	2015-09-10
Selective Local Metal Cap Layer Formation For Improved Electromigration Behavior App 20150255398 - Angyal; Matthew S. ; et al.	2015-09-10
Selective local metal cap layer formation for improved electromigration behavior Grant 9,076,847 - Angyal , et al. July 7, 2	2015-07-07
Methods and system for analysis and management of parametric yield Grant 8,997,028 - Culp , et al. March 31, 2	2015-03-31
Selective Local Metal Cap Layer Formation For Improved Electromigration Behavior App 20140203435 - Angyal; Matthew S. ; et al.	2014-07-24
Methods And System For Analysis And Management Of Parametric Yield App 20130238263 - Culp; James A. ; et al.	2013-09-12
Nitride etch for improved spacer uniformity Grant 8,470,713 - Culp , et al. June 25, 2	2013-06-25
Physical design system and method Grant 8,473,885 - Cohn , et al. June 25, 2	2013-06-25
Yield enhancement by multiplicate-layer-handling optical correction Grant 8,458,625 - Bashaboina , et al. June 4, 2	2013-06-04
Methods and system for analysis and management of parametric yield Grant 8,429,576 - Culp , et al. April 23, 2	2013-04-23
Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance Grant 8,418,087 - Banerjee , et al. April 9, 2	2013-04-09
Method and system for comparing lithographic processing conditions and or data preparation processes Grant 8,381,141 - Fischer , et al. February 19, 2	2013-02-19
Yield Enhancement By Multiplicate-layer-handling Optical Correction App 20130031519 - Bashaboina; Pavan Y. ; et al.	2013-01-31
Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage Grant 8,347,260 - Bernstein , et al. January 1, 2	2013-01-01
Circuit enhancement by multiplicate-layer-handling circuit simulation Grant 8,347,259 - Bashaboina , et al. January 1, 2	2013-01-01
Characterization of long range variability Grant 8,336,008 - Culp , et al. December 18, 2	2012-12-18
System and method for correcting systematic parametric variations on integrated circuit chips in order to minimize circuit limited yield loss Grant 8,301,290 - Culp , et al. October 30, 2	2012-10-30
Leakage aware design post-processing Grant 8,302,068 - Culp , et al. October 30, 2	2012-10-30
Methods And System For Analysis And Management Of Parametric Yield App 20120227019 - Culp; James A. ; et al.	2012-09-06
Methods and system for analysis and management of parametric yield Grant 8,239,790 - Culp , et al. August 7, 2	2012-08-07
Spacer linewidth control Grant 8,232,215 - Culp , et al. July 31, 2	2012-07-31
Physical design system and method Grant 8,219,943 - Cohn , et al. July 10, 2	2012-07-10
Multilayer OPC for design aware manufacturing Grant 8,214,770 - Mukherjee , et al. July 3, 2	2012-07-03
Physical Design System And Method App 20120167029 - Cohn; John M. ; et al.	2012-06-28
Nitride Etch For Improved Spacer Uniformity App 20120149200 - Culp; James A. ; et al.	2012-06-14
Analyzing Multiple Induced Systematic And Statistical Layout Dependent Effects On Circuit Performance App 20120144356 - Banerjee; Shayak ; et al.	2012-06-07
Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance Grant 8,176,444 - Banerjee , et al. May 8, 2	2012-05-08
Method And System For Comparing Lithographic Processing Conditions And Or Data Preparation Processes App 20120107969 - Fischer; Stephen E. ; et al.	2012-05-03
Fast and accurate method to simulate intermediate range flare effects Grant 8,161,422 - Mukherjee , et al. April 17, 2	2012-04-17
Automated sensitivity definition and calibration for design for manufacturing tools Grant 8,141,027 - Culp , et al. March 20, 2	2012-03-20
Method Of Designing An Integrated Circuit Based On A Combination Of Manufacturability, Test Coverage And, Optionally, Diagnostic Coverage App 20120066657 - Bernstein; Kerry ; et al.	2012-03-15
Methods And System For Analysis And Management Of Parametric Yield App 20110307846 - Culp; James A. ; et al.	2011-12-15
Methods and system for analysis and management of parametric yield Grant 8,042,070 - Culp , et al. October 18, 2	2011-10-18
Leakage Aware Design Post-processing App 20110179391 - Culp; James A. ; et al.	2011-07-21
Automated Sensitivity Definition And Calibration For Design For Manufacturing Tools App 20110166686 - Culp; James A. ; et al.	2011-07-07
Methodology and system for determining numerical errors in pixel-based imaging simulation in designing lithographic masks Grant 7,975,244 - Mukherjee , et al. July 5, 2	2011-07-05
Methods and structures for enhancing perimeter-to-surface area homogeneity Grant 7,935,638 - Culp , et al. May 3, 2	2011-05-03
System And Method For Correcting Systematic Parametric Variations On Integrated Circuit Chips In Order To Minimize Circuit Limited Yield Loss App 20110098838 - Culp; James A. ; et al.	2011-04-28
Characterization of Long Range Variability App 20110078641 - Culp; James A. ; et al.	2011-03-31
Methods And Structures For Enhancing Perimeter-to-surface Area Homogeneity App 20110068436 - Culp; James A. ; et al.	2011-03-24
Integrated circuit (IC) design method, system and program product Grant 7,900,178 - Culp , et al. March 1, 2	2011-03-01
Method of laying out integrated circuit design based on known polysilicon perimeter densities of individual cells Grant 7,890,906 - Chadwick , et al. February 15, 2	2011-02-15
Electrically driven optical proximity correction Grant 7,865,864 - Banerjee , et al. January 4, 2	2011-01-04
Integrated circuit with uniform polysilicon perimeter density, method and design structure Grant 7,849,433 - Chadwick , et al. December 7, 2	2010-12-07
Analyzing Multiple Induced Systematic and Statistical Layout Dependent Effects On Circuit Performance App 20100269079 - Banerjee; Shayak ; et al.	2010-10-21
Spacer Linewidth Control App 20100261351 - Culp; James A. ; et al.	2010-10-14
IC chip design modeling using perimeter density to electrical characteristic correlation Grant 7,805,693 - Chadwick , et al. September 28, 2	2010-09-28
Fast And Accurate Method To Simulate Intermediate Range Flare Effects App 20100175043 - Mukherjee; Maharaj ; et al.	2010-07-08
Methodology to improve turnaround for integrated circuit design using geometrical hierarchy Grant 7,669,175 - Culp , et al. February 23, 2	2010-02-23
OPC trimming for performance Grant 7,627,836 - Culp , et al. December 1, 2	2009-12-01
Method Of Laying Out Integrated Circuit Design Based On Known Polysilicon Perimeter Densities Of Individual Cells App 20090282380 - Chadwick; Laura S. ; et al.	2009-11-12
Integrated Circuit With Uniform Polysilicon Perimeter Density, Method And Design Structure App 20090278222 - Chadwick; Laura S. ; et al.	2009-11-12
Integrated Circuit (ic) Design Method, System And Program Product App 20090222783 - Culp; James A. ; et al.	2009-09-03
Ic Chip Design Modeling Using Perimeter Density To Electrical Characteristic Correlation App 20090210834 - Chadwick; Laura S. ; et al.	2009-08-20
Iphysical Design System And Method App 20090204930 - Cohn; John M. ; et al.	2009-08-13
Electrically Driven Optical Proximity Correction App 20090199151 - Banerjee; Shayak ; et al.	2009-08-06
Methodology And System For Determining Numerical Errors In Pixel-based Imaging Simulation In Designing Lithographic Masks App 20090193387 - Mukherjee; Maharaj ; et al.	2009-07-30
Verifying mask layout printability using simulation with adjustable accuracy Grant 7,565,633 - Mukherjee , et al. July 21, 2	2009-07-21
Physical design system and method Grant 7,536,664 - Cohn , et al. May 19, 2	2009-05-19
Multilayer Opc For Design Aware Manufacturing App 20090125868 - Mukherjee; Maharaj ; et al.	2009-05-14
Methods And System For Analysis And Management Of Parametric Yield App 20090106714 - Culp; James A. ; et al.	2009-04-23
Multilayer OPC for design aware manufacturing Grant 7,503,028 - Mukherjee , et al. March 10, 2	2009-03-10
Double exposure double resist layer process for forming gate patterns Grant 7,473,648 - Brunner , et al. January 6, 2	2009-01-06
Mask Inspection Process Accounting For Mask Writer Proximity Correction App 20080279443 - Badger; Karen D. ; et al.	2008-11-13
Methodology To Improve Turnaround For Integrated Circuit Design App 20080282211 - Culp; James A. ; et al.	2008-11-13
Mask inspection process accounting for mask writer proximity correction Grant 7,450,748 - Badger , et al. November 11, 2	2008-11-11
Verifying Mask Layout Printability Using Simulation With Adjustable Accuracy App 20080163153 - Mukherjee; Maharaj ; et al.	2008-07-03
Automated Optimization Of Vlsi Layouts For Regularity App 20080155482 - Chidambarrao; Dureseti ; et al.	2008-06-26
Multilayer OPC for Design Aware Manufacturing App 20070220476 - Mukherjee; Maharaj ; et al.	2007-09-20
Double Exposure Double Resist Layer Process For Forming Gate Patterns App 20070212863 - Brunner; Timothy A. ; et al.	2007-09-13
Design verification Grant 7,269,808 - Bruce , et al. September 11, 2	2007-09-11
Opc Trimming For Performance App 20070106968 - Culp; James A. ; et al.	2007-05-10
Design Verification App 20060270268 - Bruce; James A. ; et al.	2006-11-30
Physical design system and method App 20060036977 - Cohn; John M. ; et al.	2006-02-16
Method for verification of resolution enhancement techniques and optical proximity correction in lithography Grant 6,996,797 - Liebmann , et al. February 7, 2	2006-02-07
Mask inspection process accounting for mask writer proximity correction App 20050117795 - Badger, Karen D. ; et al.	2005-06-02
Method for performing monte-carlo simulations to predict overlay failures in integrated circuit designs Grant 6,892,365 - Culp , et al. May 10, 2	2005-05-10
Method For Performing Monte-carlo Simulations To Predict Overlay Failures In Integrated Circuit Designs App 20040210863 - Culp, James A. ; et al.	2004-10-21
Halo-free non-rectifying contact on chip with halo source/drain diffusion Grant 6,750,109 - Culp , et al. June 15, 2	2004-06-15
Method and apparatus for lithographically printing tightly nested and isolated device features using multiple mask exposures Grant 6,541,166 - Mansfield , et al. April 1, 2	2003-04-01
Halo-free non-rectifying contact on chip with halo source/drain diffusion App 20020149058 - Culp, James A. ; et al.	2002-10-17
Halo-free non-rectifying contact on chip with halo source/drain diffusion Grant 6,429,482 - Culp , et al. August 6, 2	2002-08-06
Method and apparatus for lithographically printing tightly nested and isolated device features using multiple mask exposures App 20020094482 - Mansfield, Scott M. ; et al.	2002-07-18

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