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Digital measurement circuit and memory system using the same
Grant 11,381,231 - Chae , et al. July 5, 2 | 2022-07-05 |
Integrated circuit including load standard cell and method of designing the same
Grant 10,977,412 - Chae , et al. April 13, 2 | 2021-04-13 |
Digital Measurement Circuit And Memory System Using The Same
App 20200373919 - CHAE; Kwan Yeob ; et al. | 2020-11-26 |
Digital measurement circuit and memory system using the same
Grant 10,840,896 - Chae , et al. November 17, 2 | 2020-11-17 |
Semiconductor chip including a plurality of pads
Grant 10,756,059 - Chae , et al. A | 2020-08-25 |
Memory controller for receiving differential data strobe signals and application processor having the memory controller
Grant 10,572,406 - Oh , et al. Feb | 2020-02-25 |
Digital Measurement Circuit And Memory System Using The Same
App 20190199335 - CHAE; Kwan Yeob ; et al. | 2019-06-27 |
Integrated Circuit Including Load Standard Cell And Method Of Designing The Same
App 20190197214 - Chae; Kwan-Yeob ; et al. | 2019-06-27 |
Semiconductor Chip Including A Plurality Of Pads
App 20190043841 - CHAE; KWANYEOB ; et al. | 2019-02-07 |
Semiconductor chip including a plurality of pads
Grant 10,115,706 - Chae , et al. October 30, 2 | 2018-10-30 |
Interface circuits configured to interface with multi-rank memory
Grant 10,073,619 - Chae , et al. September 11, 2 | 2018-09-11 |
Memory Controller For Receiving Differential Data Strobe Signals And Application Processor Having The Memory Controller
App 20180165023 - OH; Ji-hun ; et al. | 2018-06-14 |
Interface Circuits Configured To Interface With Multi-rank Memory
App 20180107387 - Chae; Kwanyeob ; et al. | 2018-04-19 |
Interface Circuits Configured to Interface with Multi-Rank Memory
App 20180018092 - Chae; Kwanyeob ; et al. | 2018-01-18 |
Delay cell and delay line having the same
Grant 9,859,880 - Chae , et al. January 2, 2 | 2018-01-02 |
Interface circuits configured to interface with multi-rank memory
Grant 9,857,973 - Chae , et al. January 2, 2 | 2018-01-02 |
Delay Cell And Delay Line Having The Same
App 20170111033 - CHAE; KWAN-YEOB ; et al. | 2017-04-20 |
Semiconductor Chip Including A Plurality Of Pads
App 20170098624 - CHAE; Kwanyeob ; et al. | 2017-04-06 |
Duty cycle error accumulation circuit and duty cycle correction circuit having the same
Grant 8,766,691 - Choi , et al. July 1, 2 | 2014-07-01 |
Duty Cycle Error Accumulation Circuit And Duty Cycle Correction Circuit Having The Same
App 20140002157 - CHOI; Jong-Ryun ; et al. | 2014-01-02 |
Clock delay circuit and delay locked loop including the same
Grant 8,493,116 - Choi , et al. July 23, 2 | 2013-07-23 |
Delay-locked loop and electronic device including the same
Grant 8,283,958 - Choi , et al. October 9, 2 | 2012-10-09 |
Clock Delay Circuit And Delay Locked Loop Including The Same
App 20120062294 - CHOI; Jong-Ryun ; et al. | 2012-03-15 |
Delay locked loop, electronic device including the same, and method of operating the same
Grant 8,049,543 - Kang , et al. November 1, 2 | 2011-11-01 |
Duty control circuit and semiconductor device having the same
Grant 7,994,835 - Chae , et al. August 9, 2 | 2011-08-09 |
Duty cycle correction circuits having short locking times that are relatively insensitive to temperature changes
Grant 7,990,195 - Panditd , et al. August 2, 2 | 2011-08-02 |
Delay-locked loop and electronic device including the same
App 20100219867 - Choi; Jong-Ryun ; et al. | 2010-09-02 |
Delay locked loop, electronic device including the same, and method of operating the same
App 20100194456 - Kang; Hee Chai ; et al. | 2010-08-05 |
Duty Cycle Correction Circuits Having Short Locking Times That Are Relatively Insensitive To Temperature Changes
App 20100097112 - Panditd; Harmendra ; et al. | 2010-04-22 |
Duty control circuit and semiconductor device having the same
App 20100073059 - Chae; Kwan-yeob ; et al. | 2010-03-25 |
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