Trademark applications and grants for Candela Instruments. Candela Instruments has 1 trademark applications. The latest application filed is for "CANDELA INSTRUMENTS"
Patent Application | Date |
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Method of detecting and classifying scratches and particles on thin film disks or wafers 7,123,357 - 10/444,652 Meeks October 17, 2 | 2006-10-17 |
Method of detecting and classifying scratches, particles and pits on thin film disks or wafers 6,909,500 - 10/219,632 Meeks June 21, 2 | 2005-06-21 |
Material independent optical profilometer 6,897,957 - 10/029,957 Meeks May 24, 2 | 2005-05-24 |
Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks 6,781,103 - 10/406,075 Lane , et al. August 24, 2 | 2004-08-24 |
Combined high speed optical profilometer and ellipsometer 6,757,056 - 09/861,280 Meeks , et al. June 29, 2 | 2004-06-29 |
Mark Image Registration | Serial | Trademark Application Date |
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![]() "CANDELA INSTRUMENTS" 75319542 |
CANDELA INSTRUMENTS 1997-07-03 |
SEC | 0001071285 | CANDELA INSTRUMENTS |
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