Patent | Date |
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Hands-free vision aid Grant 9,033,534 - Borden , et al. May 19, 2 | 2015-05-19 |
Hands-free Vision Aid App 20130063929 - Borden; Peter G. ;   et al. | 2013-03-14 |
Negatively charged passivation layer in a photovoltaic cell Grant 8,338,220 - Borden , et al. December 25, 2 | 2012-12-25 |
Advanced platform for processing crystalline silicon solar cells Grant 8,309,374 - Porthouse , et al. November 13, 2 | 2012-11-13 |
Stacked load-lock apparatus and method for high throughput solar cell manufacturing Grant 8,246,284 - Borden August 21, 2 | 2012-08-21 |
Passivated Polysilicon Emitter Solar Cell And Method For Manufacturing The Same App 20110162706 - Borden; Peter G. ;   et al. | 2011-07-07 |
Carrier For Transporting Solar Cell Substrates App 20100326797 - Borden; Peter G. | 2010-12-30 |
Stacked Load-Lock Apparatus and Method for High Throughput Solar Cell Manufacturing App 20100226736 - Borden; Peter G. | 2010-09-09 |
Negatively Charged Passivation Layer in a Photovoltaic Cell App 20100203742 - Borden; Peter G. ;   et al. | 2010-08-12 |
Apparatus and method for determining stress in solar cells Grant 7,773,211 - Borden August 10, 2 | 2010-08-10 |
Thin Film Silicon Solar Cell Device With Amorphous Window Layer App 20100132774 - Borden; Peter G. | 2010-06-03 |
Advanced Platform For Processing Crystalline Silicon Solar Cells App 20100087028 - Porthouse; Keith Brian ;   et al. | 2010-04-08 |
Simplified Back Contact For Polysilicon Emitter Solar Cells App 20090314341 - BORDEN; Peter G. ;   et al. | 2009-12-24 |
Nitrided Barrier Layers For Solar Cells App 20090288704 - BORDEN; Peter G. | 2009-11-26 |
Method for patterning Mo layer in a photovoltaic device comprising CIGS material using an etch process Grant 7,547,569 - Weidman , et al. June 16, 2 | 2009-06-16 |
Method For Patterning Mo Layer In A Photovoltaic Device Comprising Cigs Material Using An Etch Process App 20090111209 - WEIDMAN; Timothy ;   et al. | 2009-04-30 |
Module Having An Improved Thin Film Solar Cell Interconnect App 20090014052 - Borden; Peter G. ;   et al. | 2009-01-15 |
System For Making An Improved Thin Film Solar Cell Interconnect App 20090007957 - Borden; Peter G. ;   et al. | 2009-01-08 |
Evaluating a geometric or material property of a multilayered structure Grant 7,465,591 - Borden , et al. December 16, 2 | 2008-12-16 |
Apparatus And Method For Determining Stress In Solar Cells App 20080239315 - BORDEN; PETER G. | 2008-10-02 |
Evaluation of openings in a dielectric layer Grant 7,379,185 - Borden , et al. May 27, 2 | 2008-05-27 |
Method For Patterning Mo Layer In A Photovoltaic Device Comprising Cigs Material Using An Etch Process App 20080119005 - Weidman; Timothy ;   et al. | 2008-05-22 |
Multilayer Transparent Conductive Oxide For Improved Chemical Processing App 20080115821 - Xu; Li ;   et al. | 2008-05-22 |
Interconnect For Thin Film Photovoltaic Modules App 20080083448 - BORDEN; PETER G. | 2008-04-10 |
Thin film photovoltaic module wiring for improved efficiency App 20080023065 - Borden; Peter G. ;   et al. | 2008-01-31 |
Evaluating a multi-layered structure for voids Grant 7,301,619 - Borden , et al. November 27, 2 | 2007-11-27 |
Stacked thin film photovoltaic module and method for making same using IC processing App 20070240759 - Borden; Peter G. | 2007-10-18 |
System and method for making an improved thin film solar cell interconnect App 20070079866 - Borden; Peter G. ;   et al. | 2007-04-12 |
Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity Grant 7,190,458 - Borden , et al. March 13, 2 | 2007-03-13 |
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 7,141,440 - Borden , et al. November 28, 2 | 2006-11-28 |
Matching dose and energy of multiple ion implanters App 20060255296 - Borden; Peter G. | 2006-11-16 |
Differential evaluation of adjacent regions for change in reflectivity Grant 7,136,163 - Borden , et al. November 14, 2 | 2006-11-14 |
Use of coefficient of a power curve to evaluate a semiconductor wafer Grant 7,130,055 - Borden , et al. October 31, 2 | 2006-10-31 |
Evaluating a multi-layered structure for voids App 20060232768 - Borden; Peter G. ;   et al. | 2006-10-19 |
Evaluating a multi-layered structure for voids Grant 7,088,444 - Borden , et al. August 8, 2 | 2006-08-08 |
Matching dose and energy of multiple ion implanters Grant 7,078,711 - Borden July 18, 2 | 2006-07-18 |
Evaluating a multi-layered structure for voids Grant 7,064,822 - Borden , et al. June 20, 2 | 2006-06-20 |
Evaluating effects of tilt angle in ion implantation App 20060114478 - Borden; Peter G. ;   et al. | 2006-06-01 |
Evaluation of openings in a dielectric layer App 20060094136 - Borden; Peter G. ;   et al. | 2006-05-04 |
Shallow angle cut along a longitudinal direction of a feature in a semiconductor wafer App 20060076511 - Borden; Peter G. ;   et al. | 2006-04-13 |
High throughput measurement of via defects in interconnects Grant 7,026,175 - Li , et al. April 11, 2 | 2006-04-11 |
Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough Grant 6,971,791 - Borden , et al. December 6, 2 | 2005-12-06 |
Calibration as well as measurement on the same workpiece during fabrication App 20050264806 - Borden, Peter G. ;   et al. | 2005-12-01 |
Measurement of lateral diffusion of diffused layers Grant 6,963,393 - Borden November 8, 2 | 2005-11-08 |
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 6,958,814 - Borden , et al. October 25, 2 | 2005-10-25 |
High throughput measurement of via defects in interconnects App 20050214956 - Li, Jiping ;   et al. | 2005-09-29 |
Apparatus and method for measuring a property of a layer in a multilayered structure App 20050200850 - Borden, Peter G. ;   et al. | 2005-09-15 |
Calibration as well as measurement on the same workpiece during fabrication Grant 6,940,592 - Borden , et al. September 6, 2 | 2005-09-06 |
Evaluating a multi-layered structure for voids App 20050186776 - Borden, Peter G. ;   et al. | 2005-08-25 |
Matching dose and energy of multiple ion implanters App 20050181524 - Borden, Peter G. | 2005-08-18 |
Evaluating sidewall coverage in a semiconductor wafer Grant 6,911,349 - Li , et al. June 28, 2 | 2005-06-28 |
Measuring a property of a layer in multilayered structure Grant 6,906,801 - Borden , et al. June 14, 2 | 2005-06-14 |
Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity App 20050122525 - Borden, Peter G. ;   et al. | 2005-06-09 |
Differential evalution of adjacent regions for change in reflectivity App 20050122515 - Borden, Peter G. ;   et al. | 2005-06-09 |
Evaluating a multi-layered structure for voids App 20050112788 - Borden, Peter G. ;   et al. | 2005-05-26 |
Evaluating sidewall coverage in a semiconductor wafer App 20050099190 - Li, Jiping ;   et al. | 2005-05-12 |
Use of coefficient of a power curve to evaluate a semiconductor wafer App 20050088187 - Borden, Peter G. ;   et al. | 2005-04-28 |
Evaluating a property of a multilayered structure App 20050088188 - Borden, Peter G. ;   et al. | 2005-04-28 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,885,458 - Borden , et al. April 26, 2 | 2005-04-26 |
Evaluating a multi-layered structure for voids Grant 6,885,444 - Borden , et al. April 26, 2 | 2005-04-26 |
Measurement of lateral diffusion of diffused layers Grant 6,878,559 - Borden , et al. April 12, 2 | 2005-04-12 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20040239945 - Borden, Peter G. ;   et al. | 2004-12-02 |
Use of a coefficient of a power curve to evaluate a semiconductor wafer Grant 6,812,717 - Borden , et al. November 2, 2 | 2004-11-02 |
Evaluating a geometric or material property of a multilayered structure Grant 6,812,047 - Borden , et al. November 2, 2 | 2004-11-02 |
Measuring a property of a layer in multilayered structure App 20040119978 - Borden, Peter G. ;   et al. | 2004-06-24 |
Measurement Of Lateral Diffusion Of Diffused Layers App 20040063225 - Borden, Peter G. ;   et al. | 2004-04-01 |
Measurement of lateral diffusion of diffused layers App 20040057052 - Borden, Peter G. | 2004-03-25 |
Apparatus and method for measuring a property of a layer in a multilayered structure App 20030164946 - Borden, Peter G. ;   et al. | 2003-09-04 |
Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough App 20030165178 - Borden, Peter G. ;   et al. | 2003-09-04 |
Apparatus and method for evaluating a wafer of semiconductor material App 20030085730 - Borden, Peter G. ;   et al. | 2003-05-08 |
Calibration as well as measurement on the same workpiece during fabrication App 20030071994 - Borden, Peter G. ;   et al. | 2003-04-17 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20030043382 - Borden, Peter G. ;   et al. | 2003-03-06 |
Apparatus and method for evaluating a semiconductor wafer Grant 6,489,801 - Borden , et al. December 3, 2 | 2002-12-03 |
Evaluating sidewall coverage in a semiconductor wafer App 20020151092 - Li, Jiping ;   et al. | 2002-10-17 |
Evaluating a multi-layered structure for voids App 20020125905 - Borden, Peter G. ;   et al. | 2002-09-12 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020085211 - Borden, Peter G. ;   et al. | 2002-07-04 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020027660 - Borden, Peter G. ;   et al. | 2002-03-07 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,323,951 - Borden , et al. November 27, 2 | 2001-11-27 |
System and method for measuring the microroughness of a surface of a substrate Grant 6,154,280 - Borden November 28, 2 | 2000-11-28 |
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 6,054,868 - Borden , et al. April 25, 2 | 2000-04-25 |
Apparatus and method for evaluating a wafer of semiconductor material Grant 6,049,220 - Borden , et al. April 11, 2 | 2000-04-11 |
System and method for measuring the microroughness of a surface of a substrate Grant 5,877,860 - Borden March 2, 1 | 1999-03-02 |
Quasi bright field particle sensor Grant 5,606,418 - Borden , et al. February 25, 1 | 1997-02-25 |
Modular particle monitor for vacuum process equipment Grant 5,436,465 - Borden , et al. July 25, 1 | 1995-07-25 |
Apparatus and a method for dynamically tuning a particle sensor in response to varying process conditions Grant 5,424,558 - Borden , et al. June 13, 1 | 1995-06-13 |
Structure and method for providing a gas purge for a vacuum particle sensor installed in a corrosive or coating environment Grant 5,360,980 - Borden , et al. November 1, 1 | 1994-11-01 |
In situ real time particle monitor for a sputter coater chamber Grant 5,347,138 - Aqui , et al. September 13, 1 | 1994-09-13 |
Scattering-type particle detection device for use in high temperature process chambers Grant 4,896,048 - Borden January 23, 1 | 1990-01-23 |
Real-time particle counter for liquids with nebulizer and dryer Grant 4,894,529 - Borden , et al. January 16, 1 | 1990-01-16 |
Apparatus for scanning a flat surface to detect defects Grant 4,812,664 - Borden March 14, 1 | 1989-03-14 |
System for detection of extremely small particles in a low pressure environment Grant 4,792,199 - Borden December 20, 1 | 1988-12-20 |
Three-terminal solar cell circuit Grant 4,513,168 - Borden April 23, 1 | 1985-04-23 |
Grooved solar cell for deployment at set angle Grant 4,379,944 - Borden , et al. April 12, 1 | 1983-04-12 |
Monolithic series-connected solar cell Grant 4,278,473 - Borden July 14, 1 | 1981-07-14 |