Borden; Peter G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Borden; Peter G..The latest application filed is for "hands-free vision aid".

Company Profile

0.47.49

Borden; Peter G. - San Mateo CA US
Borden; Peter G - San Mateo CA
Borden; Peter G. - Palo Alto CA
Borden; Peter G. - Menlo Park CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Hands-free vision aid Grant 9,033,534 - Borden , et al. May 19, 2	2015-05-19
Hands-free Vision Aid App 20130063929 - Borden; Peter G. ; et al.	2013-03-14
Negatively charged passivation layer in a photovoltaic cell Grant 8,338,220 - Borden , et al. December 25, 2	2012-12-25
Advanced platform for processing crystalline silicon solar cells Grant 8,309,374 - Porthouse , et al. November 13, 2	2012-11-13
Stacked load-lock apparatus and method for high throughput solar cell manufacturing Grant 8,246,284 - Borden August 21, 2	2012-08-21
Passivated Polysilicon Emitter Solar Cell And Method For Manufacturing The Same App 20110162706 - Borden; Peter G. ; et al.	2011-07-07
Carrier For Transporting Solar Cell Substrates App 20100326797 - Borden; Peter G.	2010-12-30
Stacked Load-Lock Apparatus and Method for High Throughput Solar Cell Manufacturing App 20100226736 - Borden; Peter G.	2010-09-09
Negatively Charged Passivation Layer in a Photovoltaic Cell App 20100203742 - Borden; Peter G. ; et al.	2010-08-12
Apparatus and method for determining stress in solar cells Grant 7,773,211 - Borden August 10, 2	2010-08-10
Thin Film Silicon Solar Cell Device With Amorphous Window Layer App 20100132774 - Borden; Peter G.	2010-06-03
Advanced Platform For Processing Crystalline Silicon Solar Cells App 20100087028 - Porthouse; Keith Brian ; et al.	2010-04-08
Simplified Back Contact For Polysilicon Emitter Solar Cells App 20090314341 - BORDEN; Peter G. ; et al.	2009-12-24
Nitrided Barrier Layers For Solar Cells App 20090288704 - BORDEN; Peter G.	2009-11-26
Method for patterning Mo layer in a photovoltaic device comprising CIGS material using an etch process Grant 7,547,569 - Weidman , et al. June 16, 2	2009-06-16
Method For Patterning Mo Layer In A Photovoltaic Device Comprising Cigs Material Using An Etch Process App 20090111209 - WEIDMAN; Timothy ; et al.	2009-04-30
Module Having An Improved Thin Film Solar Cell Interconnect App 20090014052 - Borden; Peter G. ; et al.	2009-01-15
System For Making An Improved Thin Film Solar Cell Interconnect App 20090007957 - Borden; Peter G. ; et al.	2009-01-08
Evaluating a geometric or material property of a multilayered structure Grant 7,465,591 - Borden , et al. December 16, 2	2008-12-16
Apparatus And Method For Determining Stress In Solar Cells App 20080239315 - BORDEN; PETER G.	2008-10-02
Evaluation of openings in a dielectric layer Grant 7,379,185 - Borden , et al. May 27, 2	2008-05-27
Method For Patterning Mo Layer In A Photovoltaic Device Comprising Cigs Material Using An Etch Process App 20080119005 - Weidman; Timothy ; et al.	2008-05-22
Multilayer Transparent Conductive Oxide For Improved Chemical Processing App 20080115821 - Xu; Li ; et al.	2008-05-22
Interconnect For Thin Film Photovoltaic Modules App 20080083448 - BORDEN; PETER G.	2008-04-10
Thin film photovoltaic module wiring for improved efficiency App 20080023065 - Borden; Peter G. ; et al.	2008-01-31
Evaluating a multi-layered structure for voids Grant 7,301,619 - Borden , et al. November 27, 2	2007-11-27
Stacked thin film photovoltaic module and method for making same using IC processing App 20070240759 - Borden; Peter G.	2007-10-18
System and method for making an improved thin film solar cell interconnect App 20070079866 - Borden; Peter G. ; et al.	2007-04-12
Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity Grant 7,190,458 - Borden , et al. March 13, 2	2007-03-13
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 7,141,440 - Borden , et al. November 28, 2	2006-11-28
Matching dose and energy of multiple ion implanters App 20060255296 - Borden; Peter G.	2006-11-16
Differential evaluation of adjacent regions for change in reflectivity Grant 7,136,163 - Borden , et al. November 14, 2	2006-11-14
Use of coefficient of a power curve to evaluate a semiconductor wafer Grant 7,130,055 - Borden , et al. October 31, 2	2006-10-31
Evaluating a multi-layered structure for voids App 20060232768 - Borden; Peter G. ; et al.	2006-10-19
Evaluating a multi-layered structure for voids Grant 7,088,444 - Borden , et al. August 8, 2	2006-08-08
Matching dose and energy of multiple ion implanters Grant 7,078,711 - Borden July 18, 2	2006-07-18
Evaluating a multi-layered structure for voids Grant 7,064,822 - Borden , et al. June 20, 2	2006-06-20
Evaluating effects of tilt angle in ion implantation App 20060114478 - Borden; Peter G. ; et al.	2006-06-01
Evaluation of openings in a dielectric layer App 20060094136 - Borden; Peter G. ; et al.	2006-05-04
Shallow angle cut along a longitudinal direction of a feature in a semiconductor wafer App 20060076511 - Borden; Peter G. ; et al.	2006-04-13
High throughput measurement of via defects in interconnects Grant 7,026,175 - Li , et al. April 11, 2	2006-04-11
Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough Grant 6,971,791 - Borden , et al. December 6, 2	2005-12-06
Calibration as well as measurement on the same workpiece during fabrication App 20050264806 - Borden, Peter G. ; et al.	2005-12-01
Measurement of lateral diffusion of diffused layers Grant 6,963,393 - Borden November 8, 2	2005-11-08
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 6,958,814 - Borden , et al. October 25, 2	2005-10-25
High throughput measurement of via defects in interconnects App 20050214956 - Li, Jiping ; et al.	2005-09-29
Apparatus and method for measuring a property of a layer in a multilayered structure App 20050200850 - Borden, Peter G. ; et al.	2005-09-15
Calibration as well as measurement on the same workpiece during fabrication Grant 6,940,592 - Borden , et al. September 6, 2	2005-09-06
Evaluating a multi-layered structure for voids App 20050186776 - Borden, Peter G. ; et al.	2005-08-25
Matching dose and energy of multiple ion implanters App 20050181524 - Borden, Peter G.	2005-08-18
Evaluating sidewall coverage in a semiconductor wafer Grant 6,911,349 - Li , et al. June 28, 2	2005-06-28
Measuring a property of a layer in multilayered structure Grant 6,906,801 - Borden , et al. June 14, 2	2005-06-14
Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity App 20050122525 - Borden, Peter G. ; et al.	2005-06-09
Differential evalution of adjacent regions for change in reflectivity App 20050122515 - Borden, Peter G. ; et al.	2005-06-09
Evaluating a multi-layered structure for voids App 20050112788 - Borden, Peter G. ; et al.	2005-05-26
Evaluating sidewall coverage in a semiconductor wafer App 20050099190 - Li, Jiping ; et al.	2005-05-12
Use of coefficient of a power curve to evaluate a semiconductor wafer App 20050088187 - Borden, Peter G. ; et al.	2005-04-28
Evaluating a property of a multilayered structure App 20050088188 - Borden, Peter G. ; et al.	2005-04-28
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,885,458 - Borden , et al. April 26, 2	2005-04-26
Evaluating a multi-layered structure for voids Grant 6,885,444 - Borden , et al. April 26, 2	2005-04-26
Measurement of lateral diffusion of diffused layers Grant 6,878,559 - Borden , et al. April 12, 2	2005-04-12
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20040239945 - Borden, Peter G. ; et al.	2004-12-02
Use of a coefficient of a power curve to evaluate a semiconductor wafer Grant 6,812,717 - Borden , et al. November 2, 2	2004-11-02
Evaluating a geometric or material property of a multilayered structure Grant 6,812,047 - Borden , et al. November 2, 2	2004-11-02
Measuring a property of a layer in multilayered structure App 20040119978 - Borden, Peter G. ; et al.	2004-06-24
Measurement Of Lateral Diffusion Of Diffused Layers App 20040063225 - Borden, Peter G. ; et al.	2004-04-01
Measurement of lateral diffusion of diffused layers App 20040057052 - Borden, Peter G.	2004-03-25
Apparatus and method for measuring a property of a layer in a multilayered structure App 20030164946 - Borden, Peter G. ; et al.	2003-09-04
Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough App 20030165178 - Borden, Peter G. ; et al.	2003-09-04
Apparatus and method for evaluating a wafer of semiconductor material App 20030085730 - Borden, Peter G. ; et al.	2003-05-08
Calibration as well as measurement on the same workpiece during fabrication App 20030071994 - Borden, Peter G. ; et al.	2003-04-17
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20030043382 - Borden, Peter G. ; et al.	2003-03-06
Apparatus and method for evaluating a semiconductor wafer Grant 6,489,801 - Borden , et al. December 3, 2	2002-12-03
Evaluating sidewall coverage in a semiconductor wafer App 20020151092 - Li, Jiping ; et al.	2002-10-17
Evaluating a multi-layered structure for voids App 20020125905 - Borden, Peter G. ; et al.	2002-09-12
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020085211 - Borden, Peter G. ; et al.	2002-07-04
Apparatus and method for determining the active dopant profile in a semiconductor wafer App 20020027660 - Borden, Peter G. ; et al.	2002-03-07
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,323,951 - Borden , et al. November 27, 2	2001-11-27
System and method for measuring the microroughness of a surface of a substrate Grant 6,154,280 - Borden November 28, 2	2000-11-28
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 6,054,868 - Borden , et al. April 25, 2	2000-04-25
Apparatus and method for evaluating a wafer of semiconductor material Grant 6,049,220 - Borden , et al. April 11, 2	2000-04-11
System and method for measuring the microroughness of a surface of a substrate Grant 5,877,860 - Borden March 2, 1	1999-03-02
Quasi bright field particle sensor Grant 5,606,418 - Borden , et al. February 25, 1	1997-02-25
Modular particle monitor for vacuum process equipment Grant 5,436,465 - Borden , et al. July 25, 1	1995-07-25
Apparatus and a method for dynamically tuning a particle sensor in response to varying process conditions Grant 5,424,558 - Borden , et al. June 13, 1	1995-06-13
Structure and method for providing a gas purge for a vacuum particle sensor installed in a corrosive or coating environment Grant 5,360,980 - Borden , et al. November 1, 1	1994-11-01
In situ real time particle monitor for a sputter coater chamber Grant 5,347,138 - Aqui , et al. September 13, 1	1994-09-13
Scattering-type particle detection device for use in high temperature process chambers Grant 4,896,048 - Borden January 23, 1	1990-01-23
Real-time particle counter for liquids with nebulizer and dryer Grant 4,894,529 - Borden , et al. January 16, 1	1990-01-16
Apparatus for scanning a flat surface to detect defects Grant 4,812,664 - Borden March 14, 1	1989-03-14
System for detection of extremely small particles in a low pressure environment Grant 4,792,199 - Borden December 20, 1	1988-12-20
Three-terminal solar cell circuit Grant 4,513,168 - Borden April 23, 1	1985-04-23
Grooved solar cell for deployment at set angle Grant 4,379,944 - Borden , et al. April 12, 1	1983-04-12
Monolithic series-connected solar cell Grant 4,278,473 - Borden July 14, 1	1981-07-14

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