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name:-0.036480188369751
name:-0.028875112533569
name:-0.012866973876953
Amir; Nuriel Patent Filings

Amir; Nuriel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Amir; Nuriel.The latest application filed is for "device-like metrology targets".

Company Profile
14.30.37
  • Amir; Nuriel - St. Yokne'am IL
  • AMIR; Nuriel - Yokneam Ilit IL
  • Amir; Nuriel - Milpitas CA
  • Amir; Nuriel - Yokne'am IL
  • Amir; Nuriel - St. Yokneam IL
  • Amir; Nuriel - Yokne'am Ilit IL
  • Amir; Nuriel - Doar Na Shikmim N/A IL
  • Amir; Nuriel - Moshav Arugot IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device-like Metrology Targets
App 20220197152 - Levinski; Vladimir ;   et al.
2022-06-23
Loading Mechanism For Shirts
App 20210309008 - SNIR; Ohad ;   et al.
2021-10-07
Loading Mechanism For Shirts
App 20210309474 - SHIMONI; Allon ;   et al.
2021-10-07
Polarization measurements of metrology targets and corresponding target designs
Grant 11,060,845 - Amit , et al. July 13, 2
2021-07-13
Digital printing apparatus and method for printing of irregular shaped three dimensional items
Grant 10,899,142 - Amir , et al. January 26, 2
2021-01-26
Overlay targets with orthogonal underlayer dummyfill
Grant 10,890,436 - Amir , et al. January 12, 2
2021-01-12
Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology
Grant 10,831,108 - Marciano , et al. November 10, 2
2020-11-10
Gripper Mechanism For Garment Printer
App 20200307277 - SNIR; Ohad ;   et al.
2020-10-01
Methods For Improving Image Adhesion To Substrate Using Inkjet Printing
App 20200282741 - AMIR; Nuriel ;   et al.
2020-09-10
Rotary Printer For Textiles
App 20200262216 - AMIR; Nuriel ;   et al.
2020-08-20
Target and process sensitivity analysis to requirements
Grant 10,726,169 - Adel , et al.
2020-07-28
Process compatible segmented targets and design methods
Grant 10,698,321 - Amir
2020-06-30
Polarization Measurements Of Metrology Targets And Corresponding Target Designs
App 20200158492 - Amit; Eran ;   et al.
2020-05-21
Device-like Metrology Targets
App 20200124981 - Levinski; Vladimir ;   et al.
2020-04-23
Metrology targets with supplementary structures in an intermediate layer
Grant 10,551,749 - Levinski , et al. Fe
2020-02-04
Compound imaging metrology targets
Grant 10,527,951 - Yohanan , et al. J
2020-01-07
Polarization measurements of metrology targets and corresponding target designs
Grant 10,458,777 - Amit , et al. Oc
2019-10-29
Estimating and eliminating inter-cell process variation inaccuracy
Grant 10,415,963 - Marciano , et al. Sept
2019-09-17
Digital Printing Apparatus And Method For Irregular Shaped Items
App 20190160832 - Amir; Nuriel ;   et al.
2019-05-30
Method and apparatus for direct self assembly in target design and production
Grant 10,303,835 - Amit , et al.
2019-05-28
Method, system, and user interface for metrology target characterization
Grant 10,242,290 - Tarshish-Shapir , et al.
2019-03-26
On-product derivation and adjustment of exposure parameters in a directed self-assembly process
Grant 10,025,285 - Volkovich , et al. July 17, 2
2018-07-17
Device-Like Metrology Targets
App 20180188663 - Levinski; Vladimir ;   et al.
2018-07-05
Alignment of multi-beam patterning tool
Grant 10,008,364 - Amir June 26, 2
2018-06-26
Metrology targets with filling elements that reduce inaccuracies and maintain contrast
Grant 10,002,806 - Amir , et al. June 19, 2
2018-06-19
Focus measurements using scatterometry metrology
Grant 9,934,353 - El Kodadi , et al. April 3, 2
2018-04-03
Feed forward of metrology data in a metrology system
Grant 9,903,711 - Levy , et al. February 27, 2
2018-02-27
Overlay measurement of pitch walk in multiply patterned targets
Grant 9,903,813 - Amir February 27, 2
2018-02-27
Partly disappearing targets
Grant 9,885,961 - Amir February 6, 2
2018-02-06
Multi-layered target design
Grant 9,841,370 - Amir December 12, 2
2017-12-12
In-situ metrology
Grant 9,760,020 - Amir September 12, 2
2017-09-12
Producing resist layers using fine segmentation
Grant 9,753,364 - Amir September 5, 2
2017-09-05
Scatterometry overlay metrology targets and methods
Grant 9,740,108 - Amir August 22, 2
2017-08-22
Methods Of Analyzing And Utilizing Landscapes To Reduce Or Eliminate Inaccuracy In Overlay Optical Metrology
App 20160313658 - Marciano; Tal ;   et al.
2016-10-27
Feed Forward of Metrology Data in a Metrology System
App 20160290796 - Levy; Ady ;   et al.
2016-10-06
Alignment of Multi-Beam Patterning Tool
App 20160254121 - Amir; Nuriel
2016-09-01
Polarization Measurements Of Metrology Targets And Corresponding Target Designs
App 20160178351 - AMIT; Eran ;   et al.
2016-06-23
Compound Imaging Metrology Targets
App 20160179017 - YOHANAN; Raviv ;   et al.
2016-06-23
Method for estimating and correcting misregistration target inaccuracy
Grant 9,329,033 - Amit , et al. May 3, 2
2016-05-03
Focus Measurements Using Scatterometry Metrology
App 20160103946 - El Kodadi; Mohamed ;   et al.
2016-04-14
Target And Process Sensitivity Analysis To Requirements
App 20160042105 - Adel; Michael E. ;   et al.
2016-02-11
On-product Derivation And Adjustment Of Exposure Parameters In A Directed Self-assembly Process
App 20150301514 - VOLKOVICH; Roie ;   et al.
2015-10-22
Estimating And Eliminating Inter-cell Process Variation Inaccuracy
App 20150292877 - Marciano; Tal ;   et al.
2015-10-15
Overlay Measurement Of Pitch Walk In Multiply Patterned Targets
App 20150268164 - AMIR; Nuriel
2015-09-24
Producing Resist Layers Using Fine Segmentation
App 20150268551 - AMIR; Nuriel
2015-09-24
Method And Apparatus For Direct Self Assembly In Target Design And Production
App 20150242558 - AMIT; Eran ;   et al.
2015-08-27
Metrology Targets With Filling Elements That Reduce Inaccuracies And Maintain Contrast
App 20150227675 - Amir; Nuriel ;   et al.
2015-08-13
Device correlated metrology (DCM) for OVL with embedded SEM structure overlay targets
Grant 9,093,458 - Amir , et al. July 28, 2
2015-07-28
Multi-layered Target Design
App 20150153268 - AMIR; Nuriel
2015-06-04
Scatterometry Overlay Metrology Targets And Methods
App 20140351771 - Amir; Nuriel
2014-11-27
Process Compatible Segmented Targets And Design Methods
App 20140307256 - Amir; Nuriel
2014-10-16
In-situ Metrology
App 20140139815 - Amir; Nuriel
2014-05-22
Metrology Target Characterization
App 20140136137 - Tarshish-Shapir; Inna ;   et al.
2014-05-15
Device Correlated Metrology (dcm) For Ovl With Embedded Sem Structure Overlay Targets
App 20140065736 - Amir; Nuriel ;   et al.
2014-03-06
Method For Estimating And Correcting Misregistration Target Inaccuracy
App 20140060148 - Amit; Eran ;   et al.
2014-03-06
Overlay Targets with Orthogonal Underlayer Dummyfill
App 20130293890 - Amir; Nuriel ;   et al.
2013-11-07
Selective polymer growth on a semiconductor substrate
Grant 8,569,103 - Bar-sadeh , et al. October 29, 2
2013-10-29
Selective Polymer Growth On A Semiconductor Substrate
App 20120190194 - Bar-sadeh; Eyal ;   et al.
2012-07-26
High rate selective polymer growth on a substrate
Grant 8,183,085 - Bar-sadeh , et al. May 22, 2
2012-05-22
Partitioning process to improve memory cell retention
Grant 8,169,833 - Halabi , et al. May 1, 2
2012-05-01
Partitioning Process To Improve Memory Cell Retention
App 20110082964 - Halabi; Shaul ;   et al.
2011-04-07
High Rate Selective Polymer Growth On A Substrate
App 20100243306 - Bar-sadeh; Eyal ;   et al.
2010-09-30
Integrated circuit with embedded contacts
App 20090302477 - Shor; Yakov ;   et al.
2009-12-10
Forming memory arrays
App 20070235776 - Amir; Nuriel
2007-10-11

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