| Patent | Date |
|---|
System for testing an integrated circuit of a device and its method of use
Grant 11,448,695 - Lindsey , et al. September 20, 2 | 2022-09-20 |
Apparatus For Testing Electronic Devices
App 20220137121 - Richmond, II; Donald P. ; et al. | 2022-05-05 |
Electronics Tester
App 20220107358 - Erickson, II; Gaylord Lewis ; et al. | 2022-04-07 |
Method And System For Thermal Control Of Devices In An Electronics Tester
App 20220082636 - Jovanovic; Jovan ; et al. | 2022-03-17 |
Electronics Tester
App 20220065921 - Jovanovic; Jovan ; et al. | 2022-03-03 |
Apparatus for testing electronic devices
Grant 11,255,903 - Richmond, II , et al. February 22, 2 | 2022-02-22 |
Method and system for thermal control of devices in an electronics tester
Grant 11,209,497 - Jovanovic , et al. December 28, 2 | 2021-12-28 |
Electronics tester
Grant 11,199,572 - Jovanovic , et al. December 14, 2 | 2021-12-14 |
Pressure Relief Valve
App 20210364549 - Lindsey; Scott E. ; et al. | 2021-11-25 |
Pressure relief valve
Grant 11,112,429 - Lindsey , et al. September 7, 2 | 2021-09-07 |
Electronics tester with power saving state
Grant 10,976,362 - Steps , et al. April 13, 2 | 2021-04-13 |
Apparatus For Testing Electronic Devices
App 20210025935 - Richmond, II; Donald P. ; et al. | 2021-01-28 |
Apparatus for testing electronic devices
Grant 10,852,347 - Richmond, II , et al. December 1, 2 | 2020-12-01 |
Electronics Tester With Power Saving State
App 20200300908 - Steps; Steven C. ; et al. | 2020-09-24 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20200256917 - A1 | 2020-08-13 |
Electronics Tester
App 20200233026 - Jovanovic; Jovan ; et al. | 2020-07-23 |
Electronics tester with current amplification
Grant 10,718,808 - Steps , et al. | 2020-07-21 |
System for testing an integrated circuit of a device and its method of use
Grant 10,677,843 - Lindsey , et al. | 2020-06-09 |
Electronics tester
Grant 10,649,022 - Jovanovic , et al. | 2020-05-12 |
Layout of contacts
Grant D875,579 - Jovanovic , et al. Feb | 2020-02-18 |
Method And System For Thermal Control Of Devices In An Electronics Tester
App 20200027799 - Jovanovic; Jovan ; et al. | 2020-01-23 |
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
Grant 10,488,437 - Richmond, II , et al. Nov | 2019-11-26 |
Pressure Relief Valve
App 20190339303 - Lindsey; Scott E. ; et al. | 2019-11-07 |
Method and system for thermal control of devices in an electronics tester
Grant 10,466,292 - Jovanovic , et al. No | 2019-11-05 |
Limiting translation for consistent substrate-to-substrate contact
Grant 10,401,385 - Lindsey , et al. Sep | 2019-09-03 |
Layout of contacts
Grant D850,309 - Jovanovic , et al. | 2019-06-04 |
Electronics Tester With Current Amplification
App 20190072607 - Steps; Steven C. ; et al. | 2019-03-07 |
Apparatus For Testing Electronic Devices
App 20180372792 - Richmond, II; Donald P. ; et al. | 2018-12-27 |
Electronics tester with double-spiral thermal control passage in a thermal chuck
Grant 10,151,793 - Steps , et al. Dec | 2018-12-11 |
Apparatus for testing electronic devices
Grant 10,094,872 - Richmond, II , et al. October 9, 2 | 2018-10-09 |
Electronics Tester
App 20180252762 - Jovanovic; Jovan ; et al. | 2018-09-06 |
Limiting Translation For Consistent Substrate-to-substrate Contact
App 20180113150 - Lindsey; Scott E. ; et al. | 2018-04-26 |
Electronics Tester With Output Circuits Operable In Voltage Compensated Power Mode, Driver Mode Or Current Compensated Power Mode
App 20180106837 - Richmond, II; Donald P. ; et al. | 2018-04-19 |
Electronics Tester With Double-spiral Thermal Control Passage In A Thermal Chuck
App 20180080981 - Steps; Steven C. ; et al. | 2018-03-22 |
Controlling alignment during a thermal cycle
Grant 9,880,197 - Lindsey , et al. January 30, 2 | 2018-01-30 |
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
Grant 9,874,583 - Richmond, II , et al. January 23, 2 | 2018-01-23 |
Electronics tester with group and individual current configurations
Grant 9,857,418 - Steps , et al. January 2, 2 | 2018-01-02 |
Method And System For Thermal Control Of Devices In An Electronics Tester
App 20170200660 - Jovanovic; Jovan ; et al. | 2017-07-13 |
Controlling Alignment During A Thermal Cycle
App 20170176492 - Lindsey; Scott E. ; et al. | 2017-06-22 |
Controlling alignment during a thermal cycle
Grant 9,625,521 - Lindsey , et al. April 18, 2 | 2017-04-18 |
Electronics Tester With Group And Individual Current Configurations
App 20170030965 - Steps; Steven C. ; et al. | 2017-02-02 |
Electronics tester with hot fluid thermal control
Grant 9,500,702 - Steps , et al. November 22, 2 | 2016-11-22 |
Apparatus For Testing Electronic Devices
App 20160187416 - Richmond, II; Donald P. ; et al. | 2016-06-30 |
Electronics Tester With Hot Fluid Thermal Control
App 20160154053 - Steps; Steven C. ; et al. | 2016-06-02 |
Electronics Tester With Output Circuits Operable In Voltage Compensated Power Mode, Driver Mode Or Current Compensated Power Mode
App 20160109482 - Richmond, II; Donald P. ; et al. | 2016-04-21 |
Apparatus for testing electronic devices
Grant 9,316,683 - Richmond, II , et al. April 19, 2 | 2016-04-19 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20160103179 - Lindsey; Scott E. ; et al. | 2016-04-14 |
Electronics tester with a valve integrally formed in a component of a portable pack
Grant 9,291,668 - Steps , et al. March 22, 2 | 2016-03-22 |
System for testing an integrated circuit of a device and its method of use
Grant 9,250,291 - Lindsey , et al. February 2, 2 | 2016-02-02 |
Apparatus For Testing Electronic Devices
App 20150369858 - Richmond, II; Donald P. ; et al. | 2015-12-24 |
Electronics Tester With A Valve Integrally Formed In A Component Of A Portable Pack
App 20150285856 - Steps; Steven C. ; et al. | 2015-10-08 |
Apparatus for testing electronic devices
Grant 9,151,797 - Richmond, II , et al. October 6, 2 | 2015-10-06 |
Adhesively attached stand-offs on a portable pack for an electronics tester
Grant 9,086,449 - Steps , et al. July 21, 2 | 2015-07-21 |
Controlling Alignment During A Thermal Cycle
App 20150109011 - Lindsey; Scott E. ; et al. | 2015-04-23 |
Integrated feedthrough module
Grant 8,986,048 - Hendrickson , et al. March 24, 2 | 2015-03-24 |
System for testing an integrated circuit of a device and its method of use
Grant 8,947,116 - Lindsey , et al. February 3, 2 | 2015-02-03 |
Apparatus For Testing Electronic Devices
App 20140232424 - Richmond, II; Donald P. ; et al. | 2014-08-21 |
Apparatus for testing electronic devices
Grant 8,747,123 - Richmond, II , et al. June 10, 2 | 2014-06-10 |
Apparatus For Testing Electronic Devices
App 20140091810 - Richmond, II; Donald P. ; et al. | 2014-04-03 |
Apparatus for testing electronic devices
Grant 8,628,336 - Richmond, II , et al. January 14, 2 | 2014-01-14 |
Apparatus For Testing Electronic Devices
App 20130304412 - Richmond, II; Donald P. ; et al. | 2013-11-14 |
Apparatus For Testing Electronic Devices
App 20130141135 - Richmond, II; Donald P. ; et al. | 2013-06-06 |
Apparatus for testing electronic devices
Grant 8,388,357 - Richmond, II , et al. March 5, 2 | 2013-03-05 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20120280704 - Lindsey; Scott E. ; et al. | 2012-11-08 |
Adhesively Attached Stand-Offs On A Portable Pack For An Electronics Tester
App 20120223729 - Steps; Steven C. ; et al. | 2012-09-06 |
System for testing an integrated circuit of a device and its method of use
Grant 8,228,085 - Lindsey , et al. July 24, 2 | 2012-07-24 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
Grant 8,198,909 - Steps , et al. June 12, 2 | 2012-06-12 |
Apparatus For Testing Electronic Devices
App 20120113556 - Richmond, II; Donald P. ; et al. | 2012-05-10 |
Apparatus for testing electronic devices
Grant 8,118,618 - Richmond, II , et al. February 21, 2 | 2012-02-21 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20110316577 - Lindsey; Scott E. ; et al. | 2011-12-29 |
Separate Test Electronics And Blower Modules In An Apparatus For Testing An Integrated Circuit
App 20110256774 - Hendrickson; David S. ; et al. | 2011-10-20 |
System for testing an integrated circuit of a device and its method of use
Grant 8,030,957 - Lindsey , et al. October 4, 2 | 2011-10-04 |
Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion
App 20110156745 - Steps; Steven C. ; et al. | 2011-06-30 |
Separate test electronics and blower modules in an apparatus for testing an integrated circuit
Grant 7,969,175 - Hendrickson , et al. June 28, 2 | 2011-06-28 |
Wafer level burn-in and electrical test system and method
Grant 7,928,754 - Richmond, II , et al. April 19, 2 | 2011-04-19 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
Grant 7,902,846 - Steps , et al. March 8, 2 | 2011-03-08 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20110006800 - Lindsey; Scott E. ; et al. | 2011-01-13 |
Interface on an electronics connector
Grant D629,760 - Lindsey , et al. December 28, 2 | 2010-12-28 |
Separate Test Electronics And Blower Modules In An Apparatus For Testing An Integrated Circuit
App 20100283475 - Hendrickson; David S. ; et al. | 2010-11-11 |
Apparatus for testing electronic devices
Grant 7,826,995 - Maenner November 2, 2 | 2010-11-02 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20100244866 - Lindsey; Scott E. ; et al. | 2010-09-30 |
Apparatus For Testing Electronic Devices
App 20100213957 - Richmond, II; Donald P. ; et al. | 2010-08-26 |
Apparatus for testing electronic devices
Grant 7,762,822 - Richmond, II , et al. July 27, 2 | 2010-07-27 |
Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion
App 20100109696 - Steps; Steven C. ; et al. | 2010-05-06 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
Grant 7,667,475 - Steps , et al. February 23, 2 | 2010-02-23 |
Wafer level burn-in and electrical test system and method
Grant 7,619,428 - Richmond, II , et al. November 17, 2 | 2009-11-17 |
System For Testing An Integrated Circuit Of A Device And Its Method Of Use
App 20090160468 - Lindsey; Scott E. ; et al. | 2009-06-25 |
Wafer burn-in and text employing detachable cartridge
Grant 7,541,822 - Uher , et al. June 2, 2 | 2009-06-02 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
Grant 7,511,521 - Richmond, II , et al. March 31, 2 | 2009-03-31 |
Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion
App 20090015282 - Steps; Steven C. ; et al. | 2009-01-15 |
Assembly For Electrically Connecting A Test Component To A Testing Machine For Testing Electrical Circuits On The Test Component
App 20080150560 - Richmond; Donald P. ; et al. | 2008-06-26 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
Grant 7,385,407 - Richmond, II , et al. June 10, 2 | 2008-06-10 |
Reloading of die carriers without removal of die carriers from sockets on test boards
Grant 7,303,929 - Hemmerling , et al. December 4, 2 | 2007-12-04 |
Contactor assembly for testing electrical circuits
Grant 7,301,358 - Jovanovic , et al. November 27, 2 | 2007-11-27 |
Die carrier
Grant 7,126,363 - Malathong , et al. October 24, 2 | 2006-10-24 |
System for burn-in testing of electronic devices
Grant 7,063,544 - Gunn , et al. June 20, 2 | 2006-06-20 |
System for testing and burning in of integrated circuits
Grant 7,053,644 - Lindsey , et al. May 30, 2 | 2006-05-30 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
Grant 7,046,022 - Richmond, II , et al. May 16, 2 | 2006-05-16 |
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
Grant 6,867,608 - Richmond, II , et al. March 15, 2 | 2005-03-15 |
Die carrier
Grant 6,859,057 - Malathong , et al. February 22, 2 | 2005-02-22 |
Contactor assembly for testing electrical circuits
Grant 6,853,209 - Jovanovic , et al. February 8, 2 | 2005-02-08 |
System for burn-in testing of electronic devices
Grant 6,815,966 - Gunn , et al. November 9, 2 | 2004-11-09 |
Wafer level burn-in and electrical test system and method
App 20040113645 - Richmond, Donald Paul II ; et al. | 2004-06-17 |
Wafer level burn-in and electrical test system and method
Grant 6,682,945 - Richmond, II , et al. January 27, 2 | 2004-01-27 |
Wafer level burn-in and test methods
Grant 6,580,283 - Carbone , et al. June 17, 2 | 2003-06-17 |
Wafer level burn-in and electrical test system and method
Grant 6,562,636 - Richmond, II , et al. May 13, 2 | 2003-05-13 |
Wafer-burn-in and test employing detachable cartridge
Grant 6,556,032 - Uher , et al. April 29, 2 | 2003-04-29 |
Kinematic coupling
Grant 6,413,113 - Uher , et al. July 2, 2 | 2002-07-02 |
Wafer level burn-in and test thermal chuck and method
Grant 6,140,616 - Andberg October 31, 2 | 2000-10-31 |
Reusable die carrier for burn-in and burn-in process
Grant 6,025,732 - Foo , et al. February 15, 2 | 2000-02-15 |
Printed circuit board loader/unloader
Grant 5,093,984 - Lape March 10, 1 | 1992-03-10 |
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