Mark For: IRIS® trademark registration is intended to cover the category of automated system used to measure thin film thickness of dielectric coatings and critical dimensions in the production and fabrication of microscopic and nano-scale devices utilizing a broad band spectroscopic ellipsometer and reflectometer. [all]
Status
2021-09-03 UTC
LIVE APPLICATION Under Examination
The trademark application has been accepted by the Office (has met the minimum filing requirements) and that this application has been assigned to an examiner.
TMEG LAW OFFICE 101 - EXAMINING ATTORNEY ASSIGNED 2021-06-06
Basis
1(b)
Class Status
ACTIVE
Primary US Classes
021:
Electrical Apparatus, Machines and Supplies
023:
Cutlery, Machinery, Tools and Parts Thereof
026:
Measuring and Scientific Appliances
036:
Musical Instruments and Supplies
038:
Prints and Publications
Primary International Class
009 - Primary Class
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use
No
Current Use
No
Intent To Use
Yes
Filed ITU
Yes
44D Filed
No
44E Current
No
66A Current
No
Current Basis
No
No Basis
No
Attorney Name
Heather J. Kliebenstein
Attorney Docket Number
15067.192US0
Timeline
2021-01-21
Application Filed
2021-01-25
Location: NEW APPLICATION PROCESSING
2021-01-25
Status: Live/Pending
2021-01-25
Transaction Date
2021-06-06
Location: TMEG LAW OFFICE 101 - EXAMINING ATTORNEY ASSIGNED
2021-06-06
Status: A non-final Office action has been sent (issued) to the applicant. This is a letter from the examining attorney requiring additi
IC 009. US 021 023 026 036 038. G & S: Automated system used to measure thin film thickness of dielectric coatings and critical dimensions in the production and fabrication of microscopic and nano-scale devices utilizing a broad band spectroscopic ellipsometer and reflectometer
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
Automated system used to measure thin film thickness of dielectric coatings and critical dimensions in the production and fabrication of microscopic and nano-scale devices utilizing a broad band spectroscopic ellipsometer and reflectometer
Trademark Filing History
Description
Date
Proceeding Number
NOTIFICATION OF NON-FINAL ACTION E-MAILED
2021-06-06
6325
NON-FINAL ACTION WRITTEN
2021-06-06
74301
NON-FINAL ACTION E-MAILED
2021-06-06
6325
ASSIGNED TO EXAMINER
2021-05-26
74301
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM
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Onto Innovation Inc.
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