SHAPESHIFT

Mark For: SHAPESHIFT™ trademark registration is intended to cover the categories of downloadable computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; downloadable computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; downloadable computer software for providing analytic data on the performance of inspection and metrology tools; downloadable computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; downloadable computer software used for event prediction in the manufacturing of semiconductors and integrated circuits; downloadable computer software for use in detecting defective semiconductor electronic components; Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries recorded on computer media; computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks recorded on computer media; computer software for providing analytic data on the performance of inspection and metrology tools recorded on computer media; computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes recorded on computer media; computer software used for event prediction in the manufacturing of semiconductors and integrated circuits recorded on computer media; computer software for use in detecting defective semiconductor electronic components recorded on computer media. [all]

Status

2022-02-08 UTC
⟳ Refresh

DEAD APPLICATION Refused Dismissed or Invalidated

Research	OneLook Acronym Finder
Serial Number	88462960
Mark Literal Elements	SHAPESHIFT
Mark Drawing Type	4 - STANDARD CHARACTER MARK
Mark Type	TRADEMARK
Register	PRINCIPAL
Current Location	INTENT TO USE SECTION 2019-12-24
Basis	1(b)
Class Status	ACTIVE
Primary US Classes	021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 026: Measuring and Scientific Appliances 036: Musical Instruments and Supplies 038: Prints and Publications
Primary International Class	009 - Primary Class (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use	No
Current Use	No
Intent To Use	Yes
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Attorney Name	Harold Milstein
Attorney Docket Number	19PP-297330
Law Office Assigned	M10
Employee Name	SMITH, REBECCA A

Timeline

(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Downloadable computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; downloadable computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; downloadable computer software for providing analytic data on the performance of inspection and metrology tools; downloadable computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; downloadable computer software used for event prediction in the manufacturing of semiconductors and integrated circuits; downloadable computer software for use in detecting defective semiconductor electronic components; Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries recorded on computer media; computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks recorded on computer media; computer software for providing analytic data on the performance of inspection and metrology tools recorded on computer media; computer software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes recorded on computer media; computer software used for event prediction in the manufacturing of semiconductors and integrated circuits recorded on computer media; computer software for use in detecting defective semiconductor electronic components recorded on computer media