HARP XT

Mark For: HARP XT™ trademark registration is intended to cover the categories of equipment and machines for the processing and production of semiconductor substrates, thin films, silicon discs and wafers, namely, machines for polishing and cleaning semiconductor substrates, thin films, silicon discs and wafers during the production of semiconductor substrates. [all]

Status

2021-06-03 UTC
⟳ Refresh

DEAD APPLICATION Refused Dismissed or Invalidated

Research	OneLook Acronym Finder
Serial Number	88143126
Mark Literal Elements	HARP XT
Mark Drawing Type	4 - STANDARD CHARACTER MARK
Mark Type	TRADEMARK
Register	PRINCIPAL
Current Location	INTENT TO USE SECTION 2019-04-30
Basis	1(b)
Class Status	ACTIVE
Primary US Classes	013: Hardware, Plumbing and Steamfitting Supplies 019: Vehicles 021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 031: Filters and Refrigerators 034: Heating, Lighting and Ventilating Apparatus 035: Belting, Hose, Machinery Packing and Non-Metallic Tires
Primary International Class	007 - Primary Class (Machinery) Machines and machine tools; motors and engines (except for land vehicles); machine coupling and transmission components (except for land vehicles); agricultural implements other than hand-operated; incubators for eggs.
Filed Use	No
Current Use	No
Intent To Use	Yes
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Attorney Name	Alan Taboada
Attorney Docket Number	81502229US
Law Office Assigned	S10
Employee Name	SCHRODY, ALLISON PAIGE

Timeline

(ABANDONED)
IC 007. US 013 019 021 023 031 034 035. G & S: Equipment and machines for the processing and production of semiconductor substrates, thin films, silicon discs and wafers, namely, machines for polishing and cleaning semiconductor substrates, thin films, silicon discs and wafers during the production of semiconductor substrates(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Equipment and machines for the processing and production of semiconductor substrates, thin films, silicon discs and wafers, namely, computer hardware and software for use in process monitoring and measuring during the production of semiconductor substrates