KEEP LOOKING AHEAD

Mark For: KEEP LOOKING AHEAD® trademark registration is intended to cover the categories of computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components. [all]

Status

2021-06-14 UTC
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LIVE APPLICATION Under Examination

Research	OneLook Acronym Finder
Serial Number	88112179
Registration Number	6493711
Mark Literal Elements	KEEP LOOKING AHEAD
Mark Drawing Type	4 - STANDARD CHARACTER MARK
Mark Type	TRADEMARK
Register	PRINCIPAL
Current Location	INTENT TO USE SECTION 2020-10-01
Basis	1(b)
Class Status	ACTIVE
Primary US Classes	021: Electrical Apparatus, Machines and Supplies 023: Cutlery, Machinery, Tools and Parts Thereof 026: Measuring and Scientific Appliances 036: Musical Instruments and Supplies 038: Prints and Publications
Primary International Class	009 - Primary Class (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use	No
Current Use	No
Intent To Use	Yes
Filed ITU	Yes
44D Filed	No
44E Current	No
66A Current	No
Current Basis	No
No Basis	No
Attorney Name	Harold Milstein
Attorney Docket Number	19PP-142614
Law Office Assigned	L70
Employee Name	ENGEL, MICHAEL L

Timeline

IC 009. US 021 023 026 036 038. G & S: Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components. FIRST USE: 20210806. FIRST USE IN COMMERCE: 20210806