KLA
Kla Corporation
Mark For: KLA® trademark registration is intended to cover the categories of
| Research |
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Acronym Finder
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| Serial Number | 88041391 |
| Registration Number | 5909443 |
| Mark Literal Elements | KLA |
| Mark Drawing Type | 4 - STANDARD CHARACTER MARK |
| Mark Type | TRADEMARK |
| Register | PRINCIPAL |
| Current Location | PUBLICATION AND ISSUE SECTION 2019-10-07 |
| Basis | 1(a) |
| Class Status | ACTIVE |
| Primary US Classes |
|
| Primary International Class |
|
| Filed Use | No |
| Current Use | Yes |
| Intent To Use | No |
| Filed ITU | Yes |
| 44D Filed | No |
| 44E Current | No |
| 66A Current | No |
| Current Basis | No |
| No Basis | No |
| Attorney Name | Harold Milstein |
| Attorney Docket Number | 19PP-287876 |
| Law Office Assigned | M80 |
| Employee Name | LAMONT, MIAH ROSENBERG |
Timeline
| 2018-07-17 | Application Filed |
| 2018-09-25 | Published |
| 2018-09-25 | Published for Opposition |
| 2019-07-30 | Date of First Use |
| 2019-07-30 | Date of Use In Commerce |
| 2019-10-07 | Location: PUBLICATION AND ISSUE SECTION |
| 2019-11-12 | Status: Live/Registered |
| 2019-11-12 | Status: Registered. The registration date is used to determine when post-registration maintenance documents are due. |
| 2019-11-12 | Trademark Registered |
| 2019-12-20 | Transaction Date |
| 2024-11-12 | Maintenance Early File Date |
| 2025-11-12 | Maintenance On Time Date |
| 2026-05-12 | Maintenance Late Fee Date |
Trademark Parties (Applicants & Owners)
| Party: |  KLA CORPORATION |
| Address | ONE TECHNOLOGY DRIVE MILPITAS, CALIFORNIA UNITED STATES 95035 |
| Legal Entity Type | Corporation |
| Legal Entity State | DELAWARE |
| Party: | KLA-Tencor Corporation |
| Address | One Technology Drive Milpitas DE 95035 |
| Legal Entity Type | |
| Legal Entity State | DE |
*multiple parties listed, check assignment documents for ownership information
Documents
 Drawing | 2018-07-17 | |
| TEAS RF New Application | 2018-07-17 | |
| Notation to File | 2018-08-20 | |
| XSearch Search Summary | 2018-08-20 | |
| Notice of Publication | 2018-09-05 | |
| Notification Of Notice of Publication | 2018-09-05 | |
| OG Publication Confirmation | 2018-09-25 | |
| Notice of Allowance | 2018-11-20 | |
| Extension of Time to File SOU | 2019-05-17 | |
| ITU Extension Approval | 2019-05-21 | |
| ITU Unit Action | 2019-05-21 | |
| Specimen | 2019-09-18 | |
| Statement of Use | 2019-09-18 | |
| ITU Unit Action | 2019-10-08 | |
| Notice of Acceptance of Statement of Use | 2019-10-08 | |
| TRAM Snapshot of App at Pub for Oppostn | 2019-10-08 | |
| Registration Certificate | 2019-11-12 |
Attorney of Record
Good, Services, and Codes
IC 009. US 021 023 026 036 038. G & S: Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components. FIRST USE: 20190730. FIRST USE IN COMMERCE: 20190730
| International Codes: | 9 |
| U.S. Codes: | 021,023,026,036,038 |
| Type Code | Type |
|---|---|
| GS0091 | Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components |
| GS0091 | Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components |
Assignments
| Description | Date |
|---|---|
 Trademark Assignment 6832-0940 [5 Pages] | 2020-01-07 |
Trademark Filing History
| Description | Date | Proceeding Number |
|---|---|---|
| AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP | 2020-01-22 | |
| REGISTERED-PRINCIPAL REGISTER | 2019-11-12 | |
| NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED | 2019-10-08 | |
| STATEMENT OF USE PROCESSING COMPLETE | 2019-10-07 | 66530 |
| CASE ASSIGNED TO INTENT TO USE PARALEGAL | 2019-10-07 | 66530 |
| ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED | 2019-10-07 | |
| USE AMENDMENT FILED | 2019-09-18 | 66530 |
| TEAS STATEMENT OF USE RECEIVED | 2019-09-18 | |
| NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED | 2019-05-21 | |
| TEAS EXTENSION RECEIVED | 2019-05-17 | |
| EXTENSION 1 GRANTED | 2019-05-17 | 98765 |
| EXTENSION 1 FILED | 2019-05-17 | 98765 |
| NOA E-MAILED - SOU REQUIRED FROM APPLICANT | 2018-11-20 | |
| PUBLISHED FOR OPPOSITION | 2018-09-25 | |
| OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED | 2018-09-25 | |
| NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED | 2018-09-05 | |
| ASSIGNED TO EXAMINER | 2018-08-20 | 88574 |
| APPROVED FOR PUB - PRINCIPAL REGISTER | 2018-08-20 | |
| NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM | 2018-07-20 | |
| NEW APPLICATION ENTERED IN TRAM | 2018-07-20 |
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