INSPEC
GenISys GmbH
Application Filed: 2023-07-24
Trademark Application Details
NEW APPLICATION - RECORD INITIALIZED NOT ASSIGNED TO EXAMINER
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| Serial Number | 79379510 |
| Mark Drawing Code | 4000: Illustration: Drawing with word(s)/letter(s)/number(s) in Block form |
Timeline
| 2023-07-24 | Application Filed |
| 2023-09-28 | Location: INITIAL REVIEW/SERIALIZATION BRANCH(MAILROOM) |
| 2023-09-28 | Status: Live/Pending |
| 2023-09-29 | Transaction Date |
Trademark Applicants & Owners
| Owner: |  GenISys GmbH |
| Address | Eschenstr. 66 82024 Taufkirchen DE |
| Legal Entity Type | Gesellschaft Mit Beschränkter Haftung (gmbh) |
| Legal Entity State | DE |
Documents
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Attorney of Record
Good, Services, and Codes
| International Codes: | 9 |
| U.S. Codes: | 021,023,026,036,038 |
| International Codes: | 42 |
| U.S. Codes: | 100,101 |
| Type Code | Type |
|---|---|
| GS0091 | Downloadable computer software for remote monitoring and analysis for use in patterning, processing in the fields of micro and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software for monitoring, analysing, controlling and running physical world operations all in the fields of micro- and nanoscale science and technology; computer software for use in remote meter monitoring; measuring, detecting, monitoring and controlling devices; scanning electron microscopes; scanning probe microscopes; apparatus and instruments for scanning probe microscopy; metering software, recognition software, monitoring software, control software, the aforementioned goods for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: metrology; software, for use in the following fields: control of micro structuring and nano structuring systems; software, for use in the following fields: control of lithography systems; software, for use in the following fields: classification in the fields of micro- and nanoscale science and technology; software, for use in the following fields: detection of defects; software, for use in the following fields: process control in the fields of micro- and nanoscale science and technology; software, for use in the following fields: process monitoring in the fields of micro- and nanoscale science and technology; microscopy software; software, for use in relation to the following goods: scanning electron microscopes; software, for use in the following fields: surface structuring; software, for use in the following fields: surface analysis; software, for use in the following fields: material analyzes; automation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; simulation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: monte carlo simulations; simulation software, for use in the following fields: material analyzes; simulation software, for use in the following fields: surface analysis; simulation software, for use in the following fields: scanning electron microscopes; calibration software; measuring sensors; computer hardware for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection |
Trademark Filing History
| Description | Date | Event Coding |
|---|---|---|
| SN ASSIGNED FOR SECT 66A APPL FROM IB | 2023-09-28 | 1 REPR M: |
| NEW APPLICATION OFFICE SUPPLIED DATA ENTERED | 2023-09-29 | 2 NWOS I:Incoming Correspondence |
| APPLICATION FILING RECEIPT MAILED | 2023-10-03 | 3 MAFR O:Outgoing Correspondence |
| LETTER OF PROTEST EVIDENCE FORWARDED | 2023-12-09 | 4 LOPT I:Incoming Correspondence |
| ASSIGNED TO EXAMINER | 2024-03-27 | 5 DOCK D:Assigned to Examiner |
| LETTER OF PROTEST EVIDENCE REVIEWED-NO FURTHER ACTION TAKEN | 2024-03-27 | 6 LOPR P: |
| NON-FINAL ACTION WRITTEN | 2024-03-27 | 7 CNRT R:Renewal |
| NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW | 2024-03-28 | 8 RFCR E:E-Mail |
| REFUSAL PROCESSED BY MPU | 2024-04-15 | 9 RFRR P: |
| NON-FINAL ACTION MAILED - REFUSAL SENT TO IB | 2024-04-15 | 10 RFCS P: |
| REFUSAL PROCESSED BY IB | 2024-05-08 | 11 RFNT P: |
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