ENVIRO

SPECS Surface Nano Analysis GmbH

Application Filed: 2016-03-18
Trademark Application Details
Trademark Logo ENVIRO

The mark consists of the wording "ENVIRO" in dark blue block lettering with a design element composed of 3 stylized leaves to the upper right of the letter "E". One leaf is entirely dark blue, the leaf to its right is light green and dark green and the leaf directly below the dark blue leaf is medium blue and light blue.

Mark For: ENVIRO® trademark registration is intended to cover the categories of sCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS; [ MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; ] * MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; * EXCITATION SOURCES, IN PARTICULAR ELECTRON TUBES, LASERS FOR NON-MEDICAL PURPOSES, PULSE GENERATORS FOR TESTING ELECTRIC CURRENT, OPTICAL LAMPS AND LED LIGHT EMITTING DIODES, WITH ULTRAVIOLET LIGHT, X-RAYS AND ELECTRONS FOR USE IN SCIENTIFIC APPARATUS AND INSTRUMENTS; ACCESSORIES FOR SCIENTIFIC APPARATUS AND INSTRUMENTS AND FOR MEASURING APPARATUS AND INSTRUMENTS, namely, DEPTH GAUGES FOR SCANNING PROBE MICROSCOPES; PROBES AND SENSORS FOR USE WITH ELECTRON SPECTROSCOPY AND GAS ANALYSIS AND FOR MEASURING APPARATUS AND INSTRUMENTS FOR SCIENTIFIC PURPOSES; DATA PROCESSING APPARATUS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; COMPUTER SOFTWARE FOR DATABASE MANAGEMENT; COMPUTER PROGRAMS FOR THE TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA, AND COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; [ ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, IN PARTICULAR FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS ] * ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, namely, FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS *. [all]

>The color(s) dark blue, medium blue, light blue, light green and dark green is/are claimed as a feature of the mark. The mark consists of the wording "ENVIRO" in dark blue block lettering with a design element composed of 3 stylized leaves to the upper right of the letter "E". One leaf is entirely dark blue, the leaf to its right is light green and dark green and the leaf directly below the dark blue leaf is medium blue and light blue.

Status

2022-05-16 UTC
LIVE REGISTRATION Issued and Active
The trademark application has been registered with the Office.


Research OneLook Acronym Finder
Serial Number79189104
Registration Number5158483
Mark Literal ElementsENVIRO
Mark Drawing Type3 - AN ILLUSTRATION DRAWING WHICH INCLUDES WORD(S)/ LETTER(S)/NUMBER(S)
Mark TypeTRADEMARK. SERVICE MARK
Standard Character ClaimNo
RegisterPRINCIPAL
Current LocationPOST REGISTRATION 2017-07-05
Basis66(a)
Class StatusACTIVE
Primary US Classes
  • 021: Electrical Apparatus, Machines and Supplies
  • 023: Cutlery, Machinery, Tools and Parts Thereof
  • 026: Measuring and Scientific Appliances
  • 036: Musical Instruments and Supplies
  • 038: Prints and Publications
Primary International Class
  • 009 - Primary Class
  • (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed UseNo
Current UseNo
Intent To UseNo
Filed ITUNo
44D FiledNo
44E CurrentNo
66A CurrentYes
Current BasisNo
No BasisNo
Domestic RepresentativeGEORGE R. REPPER
Attorney NameGEORGE R. REPPER
Law Office AssignedM50
Employee NameBLANE, SUZANNE M

Timeline

2016-03-18Application Filed
2016-12-27Published
2016-12-27Published for Opposition
2017-03-14Status: Live/Registered
2017-03-14Status: Registered. The registration date is used to determine when post-registration maintenance documents are due.
2017-03-14Trademark Registered
2017-07-05Location: POST REGISTRATION
2018-07-08Transaction Date
2023-03-14Maintenance On Time Date
2023-09-14Maintenance Late Fee Date

Trademark Parties (Applicants & Owners)

Party: SPECS Surface Nano Analysis GmbH
AddressVoltastr. 5 13355 Berlin GERMANY
Legal Entity TypeLimited Liability Company
Legal Entity StateGERMANY

Documents

Application2016-07-14
Drawing2016-07-14
Filing Receipt Trademark Application2016-07-19
Offc Action Outgoing2016-07-25
XSearch Search Summary2016-07-25
IB-1rst Refusal Note2016-07-26
IB-Processed Transaction2016-08-11
Response to Office Action2016-11-11
TEAS Rev, App and/or COA of Atty/Dom.Rep2016-11-11
Amendment and Mail Process Complete2016-11-17
TRAM Snapshot of App at Pub for Oppostn2016-11-22
Notice of Publication2016-12-07
Registration Certificate2017-03-14
IR-Limit Goods2017-05-18
Notation to File2017-06-21
IB-Final Disposal To2017-07-05
IB-Processed Transaction2017-07-20
Updated Registration Certificate2017-08-08
IR-Rep Change2021-11-04

Design Search Codes

050308More than one leaf, including scattered leaves, bunches of leaves not attached to branches

Attorney of Record

GEORGE R. REPPER
Rothwell, Figg, Ernst & Manbeck, pc
607 14th Street NW Suite 800
Washington, DC 20005

Good, Services, and Codes


IC 009. US 021 023 026 036 038. G & S: SCIENTIF
IC APPARATUS AND INSTRUMENTS, NAMELY, SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS; [ MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; ] * MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; * EXCITATION SOURCES, IN PARTICULAR ELECTRON TUBES, LASERS FOR NON-MEDICAL PURPOSES, PULSE GENERATORS FOR TESTING ELECTR
IC CURRENT, OPTICAL LAMPS AND LED LIGHT EMITTING DIODES, WITH ULTRAVIOLET LIGHT, X-RAYS AND ELECTRONS FOR USE IN SCIENTIF
IC APPARATUS AND INSTRUMENTS; ACCESSORIES FOR SCIENTIF
IC APPARATUS AND INSTRUMENTS AND FOR MEASURING APPARATUS AND INSTRUMENTS, namely, DEPTH GAUGES FOR SCANNING PROBE MICROSCOPES; PROBES AND SENSORS FOR USE WITH ELECTRON SPECTROSCOPY AND GAS ANALYSIS AND FOR MEASURING APPARATUS AND INSTRUMENTS FOR SCIENTIF
IC PURPOSES; DATA PROCESSING APPARATUS * FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; COMPUTER SOFTWARE FOR DATABASE MANAGEMENT; COMPUTER PROGRAMS FOR THE TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA, AND COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIF
IC APPARATUS AND INSTRUMENTS * FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; [ ELECTR
IC AND ELECTRON
IC CONTROL APPARATUS AND INSTRUMENTS, IN PARTICULAR FOR THE CONTROL OF SCIENTIF
IC APPARATUS AND INSTRUMENTS, IN PARTICULAR SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS ] * ELECTR
IC AND ELECTRON
IC CONTROL APPARATUS AND INSTRUMENTS, namely, FOR THE CONTROL OF SCIENTIF
IC APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS *
IC 041. US 100 101 107. G & S: EDUCATIONAL SERVICES, NAMELY, CLASSES IN THE FIELD OF HANDLING AND OPERATING SCIENTIF
IC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS; EDUCATIONAL SERVICES, NAMELY, ARRANGING AND CONDUCTING SEMINARS AND WORKSHOPS IN THE FIELD OF HANDLING AND OPERATING SCIENTIF
IC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS, FOR EDUCATIONAL PURPOSES; TRAINING ADVICE IN THE FIELD OF HANDLING AND OPERATING SCIENTIF
IC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS
IC 042. US 100 101. G & S: [ SCIENTIF
IC AND TECHNOLOGICAL SERVICES, NAMELY, RESEARCH AND DESIGN RELATED TO THE ANALYSIS OF SURFACES IN RELATION TO THE DESIGN, ASSEMBLY AND OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF SEMICONDUCTOR PROCESSING TECHNOLOGY; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES IN THE FIELD OF SURFACES OF MATERIALS; ] * SCIENTIF
IC AND TECHNOLOGICAL SERVICES AND RESEARCH AND RELATED DESIGN SERVICES RELATED TO THE ANALYSIS OF SURFACES, EACH SERVICES IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF TECHNOLOGY FOR ANALYZING SURFACES; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES RELATING TO MATERIAL SURFACES * DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE, IN PARTICULAR DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA AND COMPUTER PROGRAMS FOR CONTROL OF SCIENTIF
IC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; UPDATING COMPUTER SOFTWARE, IN PARTICULAR UPDATING COMPUTER SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA * WHEN ANALYZING SURFACES * AND UPDATING OF COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIF
IC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; ENGINEERING AND PHYSICS RESEARCH * FOR ANALYZING SURFACES * ; ENGINEERING SERVICES, PARTICULARLY TECHNICAL PROJECT PLANNING [ AND DESIGN ENGINEERING FOR THE PROCESSING OF WEB PRODUCTS] * IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOP
IC AND MICROSCOP
IC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS *

International Codes:9
U.S. Codes:021,023,026,036,038
International Codes:41
U.S. Codes:100,101,107
International Codes:42
U.S. Codes:100,101
Type CodeType
B00001In the Statement, Page 1, lines 7-10, "measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons;" should be deleted, and, "measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 20, after APPARATUS, "apparatus for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 23, after, INSTRUMENTS, "for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 23-27, " electric and electronic control apparatus and instruments, in particular for the control of scientific apparatus and instruments, in particular spectroscopes for electron spectroscopy, ion spectroscopy and gas and elemental analysis " should be deleted, and, "electric and electronic control apparatus and instruments, namely for the control of scientific apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 37- Page 2, line 2, "Scientific and technological services, namely, research and design related to the analysis of surfaces in relation to the design, assembly and operation of measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons; research in the field of semiconductor processing technology; industrial analysis and research services in the field of surfaces of materials; " should be deleted, and, "Scientific and technological services and research and related design services related to the analysis of surfaces, each services in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons; research in the field of technology for analyzing surfaces; industrial analysis and research services relating to material surfaces;" should be inserted, and, In the Statement, Page 2, line 7 and line 10, after INSTRUMENTS, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 8, after DATA, "when analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 11, after RESEARCH, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 12 and 13,"and design engineering for the processing of web products" should be deleted, and, "in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted.

Trademark Filing History

DescriptionDateProceeding Number
NEW REPRESENTATIVE AT IB RECEIVED2021-11-06
INVALIDATION REVIEWED - NO ACTION REQUIRED BY OFFICE2018-03-1572629
PARTIAL INVALIDATION OF REG EXT PROTECTION CREATED2018-03-05
FINAL DECISION TRANSACTION PROCESSED BY IB2017-07-21
LIMITATION FROM THE IB EXAMINED AND ENTERED2017-07-0572629
FINAL DISPOSITION PROCESSED2017-07-0572629
FINAL DISPOSITION NOTICE SENT TO IB2017-07-05
CORRECTION UNDER SECTION 7 – PROCESSED2017-07-0573376
FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB2017-06-14
LIMITATION OF GOODS RECEIVED FROM IB2017-05-19
REGISTERED-PRINCIPAL REGISTER2017-03-14
PUBLISHED FOR OPPOSITION2016-12-27
NOTICE OF PUBLICATION2016-12-07
APPROVED FOR PUB - PRINCIPAL REGISTER2016-11-20
TEAS/EMAIL CORRESPONDENCE ENTERED2016-11-1288889
TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED2016-11-11
TEAS RESPONSE TO OFFICE ACTION RECEIVED2016-11-11
CORRESPONDENCE RECEIVED IN LAW OFFICE2016-11-1188889
ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED2016-11-11
REFUSAL PROCESSED BY IB2016-08-12
REFUSAL PROCESSED BY MPU2016-07-2672629
NON-FINAL ACTION MAILED - REFUSAL SENT TO IB2016-07-26
NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW2016-07-26
NON-FINAL ACTION WRITTEN2016-07-2581099
APPLICATION FILING RECEIPT MAILED2016-07-19
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM2016-07-15
ASSIGNED TO EXAMINER2016-07-1581099
SN ASSIGNED FOR SECT 66A APPL FROM IB2016-07-14

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