Mark For: SOLR® trademark registration is intended to cover the categories of
Research |
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Serial Number | 79085284 |
Registration Number | 1045639 |
Mark Literal Elements | SOLR |
Mark Drawing Type | 4 - STANDARD CHARACTER MARK |
Mark Type | TRADEMARK |
Register | PRINCIPAL |
Current Location | TMEG LAW OFFICE 106 - EXAMINING ATTORNEY ASSIGNED 2011-06-24 |
Basis | 66(a) |
Class Status | SECTION 70 - CANCE |
Primary US Classes |
|
Primary International Class |
|
Filed Use | No |
Current Use | No |
Intent To Use | No |
Filed ITU | No |
44D Filed | No |
44E Current | No |
66A Current | Yes |
Current Basis | No |
No Basis | No |
Law Office Assigned | L60 |
Employee Name | FROMM, MARTHA L |
2010-05-18 | Application Filed |
2010-05-18 | Trademark Registered |
2011-05-27 | Abandon |
2011-06-24 | Location: TMEG LAW OFFICE 106 - EXAMINING ATTORNEY ASSIGNED |
2011-06-24 | Status: Dead/Abandoned |
2018-07-08 | Transaction Date |
2020-05-18 | Status: U.S. application abandoned because International Registration restricted, renounced, or expired, in whole or in part. No transfo |
Party: | ![]() |
Address | Seesener Str. 10-13 10709 Berlin GERMANY |
Legal Entity Type | Limited Company (gmbh) |
Legal Entity State | GERMANY |
![]() | MULTI | 2010-08-19 |
![]() | JPEG | 2010-08-19 |
![]() | XML | 2010-08-24 |
![]() | XML | 2010-09-08 |
![]() | XML | 2010-09-08 |
![]() | XML | 2010-09-08 |
![]() | XML | 2010-09-15 |
![]() | MULTI | 2010-10-07 |
![]() | XML | 2010-10-07 |
![]() | MULTI | 2010-10-29 |
![]() | MULTI | 2010-11-26 |
![]() | XML | 2010-11-26 |
![]() | XML | 2010-12-14 |
![]() | XML | 2010-12-30 |
![]() | XML | 2011-06-24 |
![]() | XML | 2011-11-24 |
![]() | XML | 2012-03-13 |
![]() | XML | 2012-04-19 |
![]() | XML | 2012-06-25 |
![]() | XML | 2012-07-12 |
![]() | XML | 2014-05-29 |
![]() | XML | 2021-06-03 |
![]() | XML | 2021-06-07 |
(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells
International Codes: | 9 |
U.S. Codes: | 021,023,026,036,038 |
Type Code | Type |
---|---|
GS0091 | Optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells |
Description | Date |
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![]() | 2011-11-25 |
Description | Date | Proceeding Number |
---|---|---|
NOTIFICATION OF EFFECT OF CANCELLATION OF INTL REG MAILED | 2021-06-07 | |
DEATH OF INTERNATIONAL REGISTRATION | 2021-06-06 | |
NEW REPRESENTATIVE AT IB RECEIVED | 2014-05-29 | |
FINAL DECISION TRANSACTION PROCESSED BY IB | 2012-07-14 | |
FINAL DISPOSITION NOTICE SENT TO IB | 2012-06-25 | |
FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB | 2012-06-24 | |
NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB | 2012-04-23 | |
NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB | 2012-03-13 | |
NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB | 2012-03-07 | |
IRREGULARITY FROM IB EXAMINED BY MPU | 2012-01-31 | 68359 |
CHANGE OF NAME/ADDRESS REC'D FROM IB | 2011-11-25 | |
ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND | 2011-06-24 | |
ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE | 2011-06-24 | |
REFUSAL PROCESSED BY IB | 2011-01-01 | |
IRREGULARITY ON REFUSAL FROM IB | 2010-12-15 | |
NON-FINAL ACTION WRITTEN | 2010-11-26 | 74676 |
NON-FINAL ACTION MAILED | 2010-11-26 | |
CORRECTION FROM IB ENTERED - ATTORNEY REVIEW REQUIRED | 2010-10-28 | 70527 |
REFUSAL PROCESSED BY IB | 2010-10-09 | |
CORRECTION TRANSACTION RECEIVED FROM IB | 2010-10-08 | |
REFUSAL PROCESSED BY MPU | 2010-09-15 | 68359 |
NON-FINAL ACTION MAILED - REFUSAL SENT TO IB | 2010-09-15 | |
NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW | 2010-09-09 | |
NON-FINAL ACTION WRITTEN | 2010-09-08 | 74676 |
ASSIGNED TO EXAMINER | 2010-09-01 | 74676 |
APPLICATION FILING RECEIPT MAILED | 2010-08-24 | |
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM | 2010-08-20 | |
SN ASSIGNED FOR SECT 66A APPL FROM IB | 2010-08-19 |
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