SOLR

LayTec Aktiengesellschaft

Application Filed: 2010-05-18
Trademark Application Details
Trademark Logo SOLR

Mark For: SOLR® trademark registration is intended to cover the categories of optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells. [all]

Status

2021-06-08 UTC
DEAD APPLICATION Refused Dismissed or Invalidated
This trademark application was refused, dismissed, or invalidated by the Office and this application is no longer active.


Research OneLook Acronym Finder
Serial Number79085284
Registration Number1045639
Mark Literal ElementsSOLR
Mark Drawing Type4 - STANDARD CHARACTER MARK
Mark TypeTRADEMARK
RegisterPRINCIPAL
Current LocationTMEG LAW OFFICE 106 - EXAMINING ATTORNEY ASSIGNED 2011-06-24
Basis66(a)
Class StatusSECTION 70 - CANCE
Primary US Classes
  • 021: Electrical Apparatus, Machines and Supplies
  • 023: Cutlery, Machinery, Tools and Parts Thereof
  • 026: Measuring and Scientific Appliances
  • 036: Musical Instruments and Supplies
  • 038: Prints and Publications
Primary International Class
  • 009 - Primary Class
  • (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed UseNo
Current UseNo
Intent To UseNo
Filed ITUNo
44D FiledNo
44E CurrentNo
66A CurrentYes
Current BasisNo
No BasisNo
Law Office AssignedL60
Employee NameFROMM, MARTHA L

Timeline

2010-05-18Application Filed
2010-05-18Trademark Registered
2011-05-27Abandon
2011-06-24Location: TMEG LAW OFFICE 106 - EXAMINING ATTORNEY ASSIGNED
2011-06-24Status: Dead/Abandoned
2018-07-08Transaction Date
2020-05-18Status: U.S. application abandoned because International Registration restricted, renounced, or expired, in whole or in part. No transfo

Trademark Parties (Applicants & Owners)

Party: LayTec Aktiengesellschaft
AddressSeesener Str. 10-13 10709 Berlin GERMANY
Legal Entity TypeLimited Company (gmbh)
Legal Entity StateGERMANY

Attorney of Record

Gulde & Partner
Patent- und Rechtsanwaltskanzlei mbB
Wallstraße 58/59
10179 Berlin, Germany

Good, Services, and Codes

(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells

International Codes:9
U.S. Codes:021,023,026,036,038
Type CodeType
GS0091Optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells

Assignments

Trademark Filing History

DescriptionDateProceeding Number
NOTIFICATION OF EFFECT OF CANCELLATION OF INTL REG MAILED2021-06-07
DEATH OF INTERNATIONAL REGISTRATION2021-06-06
NEW REPRESENTATIVE AT IB RECEIVED2014-05-29
FINAL DECISION TRANSACTION PROCESSED BY IB2012-07-14
FINAL DISPOSITION NOTICE SENT TO IB2012-06-25
FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB2012-06-24
NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB2012-04-23
NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB2012-03-13
NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB2012-03-07
IRREGULARITY FROM IB EXAMINED BY MPU2012-01-3168359
CHANGE OF NAME/ADDRESS REC'D FROM IB2011-11-25
ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND2011-06-24
ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE2011-06-24
REFUSAL PROCESSED BY IB2011-01-01
IRREGULARITY ON REFUSAL FROM IB2010-12-15
NON-FINAL ACTION WRITTEN2010-11-2674676
NON-FINAL ACTION MAILED2010-11-26
CORRECTION FROM IB ENTERED - ATTORNEY REVIEW REQUIRED2010-10-2870527
REFUSAL PROCESSED BY IB2010-10-09
CORRECTION TRANSACTION RECEIVED FROM IB2010-10-08
REFUSAL PROCESSED BY MPU2010-09-1568359
NON-FINAL ACTION MAILED - REFUSAL SENT TO IB2010-09-15
NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW2010-09-09
NON-FINAL ACTION WRITTEN2010-09-0874676
ASSIGNED TO EXAMINER2010-09-0174676
APPLICATION FILING RECEIPT MAILED2010-08-24
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM2010-08-20
SN ASSIGNED FOR SECT 66A APPL FROM IB2010-08-19

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