MICROLINE

Quality Vision International Inc.

Application Filed: 2007-04-23
Trademark Application Details
Trademark Logo MICROLINE

Mark For: MICROLINE® trademark registration is intended to cover the categories of an optical metrology system for nanometrology comprised of a light source, a camera and sensors in communication with computer software and hardware, for non-contact dimensional measurement of semiconductor wafers, micro electo-mechanical systems and micro-fabricated electronic assemblies. [all]

Status

2022-04-21 UTC
LIVE REGISTRATION Issued and Active
The trademark application has been registered with the Office.


Research OneLook Acronym Finder
Serial Number76675858
Registration Number3482795
Mark Literal ElementsMICROLINE
Mark Drawing Type4 - STANDARD CHARACTER MARK
Mark TypeTRADEMARK
RegisterPRINCIPAL
Affidavit TextSECT 15. SECT 8 (6-YR). SECTION 8(10-YR) 20180628.
Affidavit Text1ST RENEWAL 20180628
Current LocationPOST REGISTRATION 2020-01-10
Basis1(a)
Class StatusACTIVE
Primary US Classes
  • 021: Electrical Apparatus, Machines and Supplies
  • 023: Cutlery, Machinery, Tools and Parts Thereof
  • 026: Measuring and Scientific Appliances
  • 036: Musical Instruments and Supplies
  • 038: Prints and Publications
Primary International Class
  • 009 - Primary Class
  • (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed UseYes
Current UseYes
Intent To UseNo
Filed ITUNo
44D FiledNo
44E CurrentNo
66A CurrentNo
Current BasisNo
No BasisNo
Attorney NameKimberly I. Shimomura
Attorney Docket Number91604.000128
Law Office AssignedM40
Employee NameAMOS, TANYA L

Timeline

1995-10-31Date of First Use
1995-10-31Date of Use In Commerce
1ST RENEWAL 20180628Renewal Date
2007-04-23Application Filed
2008-05-27Published
2008-05-27Published for Opposition
2008-08-12Trademark Registered
2018-06-28Location: GENERIC WEB UPDATE
2018-06-28Status: Live/Registered
2018-06-28Status: The registration has been renewed.
2018-08-12Renewal Date
2019-11-23Transaction Date
2020-01-10Location: POST REGISTRATION

Trademark Parties (Applicants & Owners)

Party: Quality Vision International Inc.
Address850 Hudson Avenue Rochester, NEW YORK UNITED STATES 14621
Legal Entity TypeCorporation
Legal Entity StateNEW YORK
Party: Quality Vision International, Inc.
Address850 Hudson Avenue Rochester NY 14621
Legal Entity Type
Legal Entity StateNY

*multiple parties listed, check assignment documents for ownership information

Documents

Application2007-04-23
Drawing2007-04-23
Specimen2007-04-23
Filing Receipt Trademark ApplicationAPPLICATION/XML2007-05-01
Amended Drawing2007-05-04
Drawing2007-05-04
Preliminary Amendment2007-05-04
Amendment and Mail Process Complete2007-05-24
XSearch Search Summary2007-08-12
Notation to File2007-08-13
Offc Action Outgoing2007-08-13
Change of Address2008-02-13
Response to Office Action2008-02-13
Specimen2008-02-13
Amendment and Mail Process Complete2008-02-15
TRAM Snapshot of App at Pub for Oppostn2008-04-18
Publication & Issue Review Complete2008-04-19
Notice of Publication2008-05-07
Registration Certificate2008-08-12
Section 8 and 152014-03-10
Specimen2014-03-10
Notice of Acceptance Acknowledgement2014-03-26
Courtesy E-Reminder of Sec. 8/Sec. 9APPLICATION/XML2017-08-12
PR-Section 8 and 92018-06-18
Specimen2018-06-18
Notice-Acceptance-RenewalAPPLICATION/XML2018-06-28
Section 7 Request2019-11-22
Updated Registration Certificate2020-02-18

Attorney of Record

Kimberly I. Shimomura
Harter Secrest & Emery LLP
1600 Bausch & Lomb Place
Rochester NY 14604

Good, Services, and Codes


IC 009. US 021 023 026 036 038. G & S: An optical metrology system for nanometrology comprised of a light source, a camera and sensors in communication with computer software and hardware, for non-contact dimensional measurement of semiconductor wafers, micro electo-mechanical systems and micro-fabricated electronic assemblies. FIRST USE: 19951031. FIRST USE IN COMMERCE: 19951031

International Codes:9
U.S. Codes:021,023,026,036,038
Type CodeType
GS0091An optical metrology system for nanometrology comprised of a light source, a camera and sensors in communication with computer software and hardware, for non-contact dimensional measurement of semiconductor wafers, micro electo-mechanical systems and micro-fabricated electronic assemblies

Trademark Filing History

DescriptionDateProceeding Number
CORRECTION UNDER SECTION 7 – PROCESSED2020-01-1068502
CASE ASSIGNED TO POST REGISTRATION PARALEGAL2020-01-0968502
TEAS SECTION 7 REQUEST RECEIVED2019-11-22
REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS)2018-06-2874272
REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED2018-06-2874272
NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED2018-06-28
CASE ASSIGNED TO POST REGISTRATION PARALEGAL2018-06-2874272
TEAS SECTION 8 & 9 RECEIVED2018-06-18
COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED2017-08-12
REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.2014-03-2668335
NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED2014-03-26
CASE ASSIGNED TO POST REGISTRATION PARALEGAL2014-03-2668335
TEAS SECTION 8 & 15 RECEIVED2014-03-10
REGISTERED - SEC. 8 (6-YR) & SEC. 15 FILED2014-03-1068335
REGISTERED-PRINCIPAL REGISTER2008-08-12
PUBLISHED FOR OPPOSITION2008-05-27
NOTICE OF PUBLICATION2008-05-07
LAW OFFICE PUBLICATION REVIEW COMPLETED2008-04-1878413
APPROVED FOR PUB - PRINCIPAL REGISTER2008-04-17
TEAS/EMAIL CORRESPONDENCE ENTERED2008-02-1488889
TEAS RESPONSE TO OFFICE ACTION RECEIVED2008-02-13
TEAS CHANGE OF CORRESPONDENCE RECEIVED2008-02-13
CORRESPONDENCE RECEIVED IN LAW OFFICE2008-02-1388889
NON-FINAL ACTION WRITTEN2007-08-1376926
NON-FINAL ACTION MAILED2007-08-13
ASSIGNED TO EXAMINER2007-08-0776926
PRELIMINARY/VOLUNTARY AMENDMENT - ENTERED2007-05-2378413
ASSIGNED TO LIE2007-05-2378413
TEAS VOLUNTARY AMENDMENT RECEIVED2007-05-04
APPLICATION FILING RECEIPT MAILED2007-05-01
NEW APPLICATION ENTERED IN TRAM2007-04-27

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