NANOCAD

Applied Materials, Inc.

Application Filed: 2003-11-21
Trademark Application Details
Trademark Logo NANOCAD

Mark For: NANOCAD™ trademark registration is intended to cover the categories of diagnostic apparatus, namely, semiconductor wafer thickness gauges and operational software for the inspection, review, measurement and monitoring of semiconductor elements in the nature of wafers, reticles, and flat panel displays. [all]

Status

2022-06-09 UTC
DEAD APPLICATION Refused Dismissed or Invalidated
This trademark application was refused, dismissed, or invalidated by the Office and this application is no longer active.


Research OneLook Acronym Finder
Serial Number76561361
Mark Literal ElementsNANOCAD
Mark Drawing Type4 - STANDARD CHARACTER MARK
Mark TypeTRADEMARK
RegisterPRINCIPAL
Current LocationINTENT TO USE SECTION 2008-08-06
Basis1(b)
Class StatusACTIVE
Primary US Classes
  • 021: Electrical Apparatus, Machines and Supplies
  • 023: Cutlery, Machinery, Tools and Parts Thereof
  • 026: Measuring and Scientific Appliances
  • 036: Musical Instruments and Supplies
  • 038: Prints and Publications
Primary International Class
  • 009 - Primary Class
  • (Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed UseNo
Current UseNo
Intent To UseYes
Filed ITUYes
44D FiledNo
44E CurrentNo
66A CurrentNo
Current BasisNo
No BasisNo
Attorney NameRobert W. Mulcahy
Attorney Docket NumberTM0724/PDC/O
Law Office AssignedL20
Employee NameCLAYTON, CHERYL A

Timeline

2003-11-21Application Filed
2006-11-07Published
2006-11-07Published for Opposition
2008-08-06Location: INTENT TO USE SECTION
2009-08-31Abandon
2009-08-31Status: Abandoned because no Statement of Use or Extension Request timely filed after Notice of Allowance was issued. To view all docume
2009-08-31Status: Dead/Abandoned
2018-07-08Transaction Date

Trademark Parties (Applicants & Owners)

Party: Applied Materials, Inc.
Address3050 Bowers Avenue Santa Clara, CALIFORNIA UNITED STATES 95054
Legal Entity TypeCorporation
Legal Entity StateDELAWARE

Documents

Application2003-11-21
Drawing2003-11-21
Filing Receipt Trademark ApplicationAPPLICATION/XML2003-12-20
Offc Action Outgoing2004-06-21
XSearch Search Summary2004-06-21
Paper Correspondence Incoming2004-07-26
Offc Action Outgoing2005-07-13
Paper Correspondence Incoming2005-12-21
Offc Action Outgoing2006-01-30
Amended Drawing2006-07-14
Paper Correspondence Incoming2006-07-14
TRAM Snapshot of App at Pub for Oppostn2006-09-09
Notice of Publication2006-10-18
Notice of AllowanceAPPLICATION/XML2007-01-30
Extension of Time to File SOU2007-07-25
ITU Extension Approval2007-09-15
ITU Unit Action2007-09-15
Extension of Time to File SOU2008-01-28
ITU Extension Approval2008-02-15
ITU Unit Action2008-02-15
Extension of Time to File SOU2008-07-25
ITU Extension Approval2008-08-07
ITU Unit Action2008-08-07
Extension of Time to File SOU2009-01-26
ITU Extension ApprovalAPPLICATION/XML2009-01-30
ITU Unit Action2009-01-30
Notice of Abandonment2009-08-31
ITU Unit Action2009-09-01

Attorney of Record

Robert W. Mulcahy
APPLIED MATERIALS, INC.
2881 SCOTT BOULEVARD, M/S 2061
SANTA CLARA CA 95054

Good, Services, and Codes

(ABANDONED)
IC 009. US 021 023 026 036 038. G & S: Diagnostic apparatus, namely, semiconductor wafer thickness gauges and operational software for the inspection, review, measurement and monitoring of semiconductor elements in the nature of wafers, reticles, and flat panel displays

International Codes:9
U.S. Codes:021,023,026,036,038
Type CodeType
GS0091Diagnostic apparatus, namely, semiconductor wafer thickness gauges and operational software for the inspection, review, measurement and monitoring of semiconductor elements in the nature of wafers, reticles, and flat panel displays

Trademark Filing History

DescriptionDateProceeding Number
ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED2009-08-31
ABANDONMENT - NO USE STATEMENT FILED2009-08-3199999
SOU EXTENSION 4 GRANTED2009-01-2966530
TEAS EXTENSION RECEIVED2009-01-26
SOU EXTENSION 4 FILED2009-01-2666530
SOU EXTENSION 3 GRANTED2008-08-0666530
CASE ASSIGNED TO INTENT TO USE PARALEGAL2008-08-0666530
TEAS EXTENSION RECEIVED2008-07-25
SOU EXTENSION 3 FILED2008-07-2566530
SOU EXTENSION 2 GRANTED2008-02-1466154
TEAS EXTENSION RECEIVED2008-01-28
SOU EXTENSION 2 FILED2008-01-2866154
SOU EXTENSION 1 GRANTED2007-09-1466154
TEAS EXTENSION RECEIVED2007-07-25
SOU EXTENSION 1 FILED2007-07-2566154
NOA MAILED - SOU REQUIRED FROM APPLICANT2007-01-30
PUBLISHED FOR OPPOSITION2006-11-07
NOTICE OF PUBLICATION2006-10-18
LAW OFFICE PUBLICATION REVIEW COMPLETED2006-09-2059272
ASSIGNED TO LIE2006-09-1859272
APPROVED FOR PUB - PRINCIPAL REGISTER2006-09-08
AMENDMENT FROM APPLICANT ENTERED2006-08-0269350
PAPER RECEIVED2006-07-14
CORRESPONDENCE RECEIVED IN LAW OFFICE2006-07-1469350
NON-FINAL ACTION WRITTEN2006-01-3077300
NON-FINAL ACTION MAILED2006-01-30
AMENDMENT FROM APPLICANT ENTERED2006-01-0459272
PAPER RECEIVED2005-12-21
CORRESPONDENCE RECEIVED IN LAW OFFICE2005-12-2159272
NON-FINAL ACTION WRITTEN2005-07-1377300
NON-FINAL ACTION MAILED2005-07-13
AMENDMENT FROM APPLICANT ENTERED2004-12-1669350
PAPER RECEIVED2004-07-26
CORRESPONDENCE RECEIVED IN LAW OFFICE2004-07-2669350
NON-FINAL ACTION MAILED2004-06-22
ASSIGNED TO EXAMINER2004-06-2077300
NEW APPLICATION ENTERED IN TRAM2003-12-16

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