Mark For: YOSEMITE® trademark registration is intended to cover the category of metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication of semiconductor wafers. [all]
Status
2022-07-31 UTC
DEAD REGISTRATION Cancelled Invalidated
The trademark application was registered, but subsequently it was cancelled or invalidated and removed from the registry.
(Electrical and scientific apparatus) Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, measuring, signaling, checking (supervision), lifesaving and teaching apparatus and instruments; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus.
Filed Use
No
Current Use
Yes
Intent To Use
No
Filed ITU
Yes
44D Filed
No
44E Current
No
66A Current
No
Current Basis
No
No Basis
No
Cancellation Code
2
Attorney Name
Thomas Langer
Attorney Docket Number
02044/TL
Law Office Assigned
M40
Employee Name
GILBERT, REBECCA L
Timeline
2001-12-17
Date of First Use
2001-12-17
Date of Use In Commerce
2002-03-07
Application Filed
2002-10-01
Published
2002-10-01
Published for Opposition
2003-08-19
Trademark Registered
2008-07-30
Location: SCANNING ON DEMAND
2010-03-27
Cancelled
2010-03-27
Status: Dead/Cancelled
2010-03-27
Status: Registration cancelled because registrant did not file an acceptable declaration under Section 8. To view all documents in this
Thomas Langer Cohen, Pontani, Lieberman & Pavane Suite 1210 551 Fifth Avenue New York NY 10176
Good, Services, and Codes
(CANCELLED) IC 009. US 021 023 026 036 038. G & S: Metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication of semiconductor wafers. FIRST USE: 20011217. FIRST USE IN COMMERCE: 20011217
International Codes:
9
U.S. Codes:
021,023,026,036,038
Type Code
Type
GS0091
Metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication of semiconductor wafers
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